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Extract from the Register of European Patents

EP About this file: EP1061381

EP1061381 - Method for optimizing probe card analysis and scrub mark analysis data [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  04.11.2005
Database last updated on 03.01.2025
Most recent event   Tooltip14.12.2007Lapse of the patent in a contracting state
New state(s): PT		published on 16.01.2008  [2008/03]
Applicant(s)For all designated states
Applied Precision, LLC (a Washington corporation)
1040 12th Avenue N. W. Issaquah
Washington 98027-8929 / US
[N/P]
Former [2002/24]For all designated states
Applied Precision, LLC (a Washington corporation)
1040 12th Avenue N. W.
Issaquah, Washington 98027-8929 / US
Former [2000/51]For all designated states
Applied Precision, Inc.
1040 12th Avenue Northwest
Issaquah, Washington 98027 / US
Inventor(s)01 / Strom, John
1547 S.W. 12th Court
North Bend, Washington 98045 / US
[2000/51]
Representative(s)Grünecker Patent- und Rechtsanwälte PartG mbB
Leopoldstraße 4
80802 München / DE
[N/P]
Former [2000/51]Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
Maximilianstrasse 58
80538 München / DE
Application number, filing date00112260.507.06.2000
[2000/51]
Priority number, dateUS1999032710607.06.1999         Original published format: US 327106
[2000/51]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1061381
Date:20.12.2000
Language:EN
[2000/51]
Type: A3 Search report 
No.:EP1061381
Date:26.09.2001
[2001/39]
Type: B1 Patent specification 
No.:EP1061381
Date:29.12.2004
Language:EN
[2004/53]
Search report(s)(Supplementary) European search report - dispatched on:EP09.08.2001
ClassificationIPC:G01R35/00, G01R1/067
[2001/39]
CPC:
G01R1/00 (EP,US); G01R1/06794 (EP,US); G01R31/2887 (EP,US);
G01R31/2891 (EP,US); G01R35/00 (EP,US); G01R1/07342 (EP,US);
G01R3/00 (EP,US) (-)
Former IPC [2000/51]G01R35/00
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE [2000/51]
TitleGerman:Datenoptimierungsverfahren für Sondenkartenanalyse und Riebmarkanalyse[2000/51]
English:Method for optimizing probe card analysis and scrub mark analysis data[2000/51]
French:Procédé pour optimiser l'analyse d'une carte à pointes et des données d'analyse de marque de frottement[2000/51]
Examination procedure18.02.2002Examination requested  [2002/17]
14.11.2002Despatch of a communication from the examining division (Time limit: M06)
21.05.2003Reply to a communication from the examining division
22.12.2003Despatch of a communication from the examining division (Time limit: M04)
30.04.2004Reply to a communication from the examining division
12.07.2004Communication of intention to grant the patent
02.11.2004Fee for grant paid
02.11.2004Fee for publishing/printing paid
Divisional application(s)EP04030715.9  / EP1519200
Opposition(s)30.09.2005No opposition filed within time limit [2005/51]
Fees paidRenewal fee
24.06.2002Renewal fee patent year 03
12.06.2003Renewal fee patent year 04
14.06.2004Renewal fee patent year 05
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT29.12.2004
BE29.12.2004
CH29.12.2004
FI29.12.2004
IT29.12.2004
LI29.12.2004
NL29.12.2004
DK29.03.2005
GR29.03.2005
SE29.03.2005
ES09.04.2005
PT29.05.2005
CY07.06.2005
LU07.06.2005
MC30.06.2005
[2008/03]
Former [2007/35]AT29.12.2004
BE29.12.2004
CH29.12.2004
FI29.12.2004
IT29.12.2004
LI29.12.2004
NL29.12.2004
DK29.03.2005
GR29.03.2005
SE29.03.2005
ES09.04.2005
CY07.06.2005
LU07.06.2005
MC30.06.2005
Former [2007/26]AT29.12.2004
BE29.12.2004
CH29.12.2004
FI29.12.2004
LI29.12.2004
NL29.12.2004
DK29.03.2005
GR29.03.2005
SE29.03.2005
ES09.04.2005
CY07.06.2005
LU07.06.2005
MC30.06.2005
Former [2007/20]AT29.12.2004
BE29.12.2004
CH29.12.2004
FI29.12.2004
LI29.12.2004
NL29.12.2004
DK29.03.2005
GR29.03.2005
SE29.03.2005
ES09.04.2005
CY07.06.2005
LU30.06.2005
MC30.06.2005
Former [2007/08]AT29.12.2004
BE29.12.2004
CH29.12.2004
FI29.12.2004
LI29.12.2004
NL29.12.2004
DK29.03.2005
GR29.03.2005
SE29.03.2005
ES09.04.2005
LU30.06.2005
MC30.06.2005
Former [2006/28]AT29.12.2004
BE29.12.2004
CH29.12.2004
FI29.12.2004
LI29.12.2004
NL29.12.2004
DK29.03.2005
GR29.03.2005
ES09.04.2005
MC30.06.2005
Former [2006/14]AT29.12.2004
BE29.12.2004
CH29.12.2004
FI29.12.2004
LI29.12.2004
NL29.12.2004
DK29.03.2005
GR29.03.2005
ES09.04.2005
Former [2006/12]AT29.12.2004
BE29.12.2004
CH29.12.2004
FI29.12.2004
LI29.12.2004
DK29.03.2005
GR29.03.2005
ES09.04.2005
Former [2005/51]AT29.12.2004
BE29.12.2004
FI29.12.2004
GR29.03.2005
Former [2005/36]AT29.12.2004
FI29.12.2004
GR29.03.2005
Former [2005/26]FI29.12.2004
GR29.03.2005
Former [2005/24]FI29.12.2004
Documents cited:Search[A]US4864227  (SATO MITSUYA [JP]) [A] 1 * abstract *;
 [AD]US4918374  (STEWART JOHN P [US], et al) [AD] 1 * abstract *;
 [A]US5644245  (SAITOH SATOSHI [JP], et al) [A] 1 * abstract * * column 2, line 19 - line 56 * * column 3, line 9 - line 35 * * column 7, line 19 - column 8, line 16 * * column 8, line 53 - line 59 * * column 9, line 14 - column 10, line 21 * * column 13, line 30 - line 39 * * column 21, line 22 - line 29 ** column 22, line 4 - line 32; figures 1,3,5,7-18,20 *;
 [DA]US5657394  (SCHWARTZ RODNEY E [US], et al) [DA] 1 * column 3, line 19 - column 4, line 5 * * column 4, line 52 - column 6, line 33 * * column 15, line 13 - line 26 * * column 15, line 50 - line 54; figure 6 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.