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Extract from the Register of European Patents

EP About this file: EP1071120

EP1071120 - Method for providing pulsed plasma during a portion of a semiconductor wafer process [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  04.02.2005
Database last updated on 20.12.2024
Most recent event   Tooltip04.02.2005Withdrawal of applicationpublished on 23.03.2005  [2005/12]
Applicant(s)For all designated states
Applied Materials, Inc.
P.O. Box 450A
Santa Clara, California 95052 / US
[N/P]
Former [2001/04]For all designated states
Applied Materials, Inc.
P.O. Box 450A
Santa Clara, California 95052 / US
Inventor(s)01 / Paterson, Alex
1035 Coleman Road apt 7207
San Jose, CA 95123 / US
02 / Yamartino, John M.
385 Waverly Street
Palo Alto, CA / US
03 / Loewenhardt, Peter K.
1862 Rosswood Dr.
San Jose, CA / US
04 / Zawalski, Wade
539 27th Street
San Francisco, CA 94131 / US
 [2001/15]
Former [2001/04]01 / Paterson, Alex
5355 Wong Court, Apt. 332
San Jose, CA 95123 / US
02 / Yamartino, John M.
385 Waverly Street
Palo Alto, CA / US
03 / Loewenhardt, Peter K.
1862 Rosswood Dr.
San Jose, CA / US
04 / Zawalski, Wade
539 27th Street
San Francisco, CA 94131 / US
Representative(s)Zimmermann, Gerd Heinrich, et al
Zimmermann & Partner Patentanwälte mbB
Postfach 330 920
80069 München / DE
[N/P]
Former [2001/04]Zimmermann, Gerd Heinrich, et al
Zimmermann & Partner, P.O. Box 33 09 20
80069 München / DE
Application number, filing date00115860.924.07.2000
[2001/04]
Priority number, dateUS1999036088323.07.1999         Original published format: US 360883
[2001/04]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1071120
Date:24.01.2001
Language:EN
[2001/04]
Type: A3 Search report 
No.:EP1071120
Date:11.04.2001
[2001/15]
Search report(s)(Supplementary) European search report - dispatched on:EP22.02.2001
ClassificationIPC:H01L21/3065, H01J37/32, H01L21/3213
[2001/15]
CPC:
H01J37/321 (EP,US); H01L21/3065 (EP,KR,US); H01L21/32136 (EP,US);
H01L21/32137 (EP,US); H01J2237/0206 (EP,US)
Former IPC [2001/04]H01L21/3065, H01J37/32
Designated contracting statesGB [2002/01]
Former [2001/04]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Verfahren zur Behandlunhg eines halbleitenden Wafers mit einem zeitweiligem gepulsten Plasma[2001/04]
English:Method for providing pulsed plasma during a portion of a semiconductor wafer process[2001/04]
French:Procédé de traitement d'un substrate semiconducteur avec un plasma pulsé temporaire[2001/04]
Examination procedure18.06.2001Examination requested  [2001/33]
28.01.2005Application withdrawn by applicant  [2005/12]
Fees paidRenewal fee
30.07.2002Renewal fee patent year 03
04.07.2003Renewal fee patent year 04
Penalty fee
Additional fee for renewal fee
31.07.200405   M06   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[Y]US4889588  (FIOR GIANNI O [US]) [Y] 3-5 * the whole document *;
 [XY]US5352324  (GOTOH YASUSHI [JP], et al) [X] 1,2,6-8,15-19,22-33 * the whole document * [Y] 3-5;
 [X]EP0878842  (APPLIED MATERIALS INC [US]) [X] 22-35 * the whole document *;
 [A]  - MARUYAMA T ET AL, "REDUCTION OF CHARGE BUILD-UP WITH PULSE-MODULATED BIAS IN PULSED ELECTRON CYCLOTRON RESONANCE PLASMA", JAPANESE JOURNAL OF APPLIED PHYSICS,JP,PUBLICATION OFFICE JAPANESE JOURNAL OF APPLIED PHYSICS. TOKYO, (199804), vol. 37, no. 4B, ISSN 0021-4922, pages 2306 - 2310, XP000861729 [A] 1-10,15-17,29-33 * the whole document *

DOI:   http://dx.doi.org/10.1143/JJAP.37.2306
 [A]  - IKEDA Y ET AL, "TOP-PECVD: A NEW CONFORMAL PLASMA ENHANCED CVD TECHNOLOGY USING TEOS, OZONE AND PULSE-MODULATED RF PLASMA", SAN FRANCISCO, DEC. 13 - 16, 1992,NEW YORK, IEEE,US, (19921213), ISBN 0-7803-0818-2, pages 289 - 292, XP000687431 [A] 1,11,17,29-33 * the whole document *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.