EP1096249 - Nondestructive flaw inspection method and apparatus [Right-click to bookmark this link] | |||
Former [2001/18] | Nondestructive inspection method and apparatus | ||
[2012/10] | Status | No opposition filed within time limit Status updated on 07.03.2014 Database last updated on 31.08.2024 | Most recent event Tooltip | 07.03.2014 | No opposition filed within time limit | published on 09.04.2014 [2014/15] | Applicant(s) | For all designated states Hitachi-GE Nuclear Energy, Ltd. 1-1 Saiwai-cho 3-chome Hitachi-shi Ibaraki 317-0073 / JP | [2007/48] |
Former [2001/18] | For all designated states Hitachi, Ltd. 6, Kanda Surugadai 4-chome Chiyoda-ku, Tokyo / JP | Inventor(s) | 01 /
Nomoto, Mineo, c/o Hitachi, Ltd., Int. Prop. Grp. New Marunouchi Bldg. 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | 02 /
Katsuta, Daiske, c/o Hitachi Ltd., Int. Prop. Grp. New Marunouchi Bldg. 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | 03 /
Asano, Toshio, c/o Hitachi, Ltd., Int. Prop. Grp. New Marunouchi Bldg. 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | 04 /
Sakai, Kaoru, c/o Hitachi Ltd., Int. Prop. Grp. New Marunouchi Bldg. 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | 05 /
Taguchi, Tetsuo, c/o Hitachi, Ltd., Int. Prop. Grp New Marunouchi Bldg. 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | 06 /
Tanaka, Isao, c/o Hitachi, Ltd., Int. Prop. Grp. New Marunouchi Bldg. 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | [2013/18] |
Former [2001/18] | 01 /
Nomoto, Mineo, c/o Hitachi, Ltd., Int. Prop. Grp. New Marunouchi Bldg., 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | ||
02 /
Katsuta, Daiske, c/o Hitachi Ltd., Int. Prop. Grp. New Marunouchi Bldg., 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | |||
03 /
Asano, Toshio, c/o Hitachi, Ltd., Int. Prop. Grp. New Marunouchi Bldg., 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | |||
04 /
Sakai, Kaoru, c/o Hitachi Ltd., Int. Prop. Grp. New Marunouchi Bldg., 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | |||
05 /
Taguchi, Tetsuo, c/o Hitachi, Ltd., Int. Prop. Grp New Marunouchi Bldg., 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | |||
06 /
Tanaka, Isao, c/o Hitachi, Ltd., Int. Prop. Grp. New Marunouchi Bldg., 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP | Representative(s) | Calderbank, Thomas Roger, et al Mewburn Ellis LLP City Tower 40 Basinghall Street London EC2V 5DE / GB | [N/P] |
Former [2013/18] | Calderbank, Thomas Roger, et al Mewburn Ellis LLP 33 Gutter Lane London EC2V 8AS / GB | ||
Former [2001/18] | Calderbank, Thomas Roger, et al MEWBURN ELLIS York House 23 Kingsway London WC2B 6HP / GB | Application number, filing date | 00309094.1 | 16.10.2000 | [2001/18] | Priority number, date | JP19990303480 | 26.10.1999 Original published format: JP 30348099 | [2001/18] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1096249 | Date: | 02.05.2001 | Language: | EN | [2001/18] | Type: | A3 Search report | No.: | EP1096249 | Date: | 07.11.2001 | [2001/45] | Type: | B1 Patent specification | No.: | EP1096249 | Date: | 01.05.2013 | Language: | EN | [2013/18] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 24.09.2001 | Classification | IPC: | G06K9/46, G01N21/88, G01N27/84, G01N21/91, G06T7/00 | [2012/10] | CPC: |
G01N21/91 (EP,US);
G01N27/82 (KR);
G06V10/56 (EP,US)
|
Former IPC [2001/45] | G01N21/88, G01N27/84, G01N21/91, G06T7/00 | ||
Former IPC [2001/18] | G01N21/88 | Designated contracting states | DE, FR, GB, NL [2002/30] |
Former [2001/18] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE | Title | German: | Verfahren und Vorrichtung zur zerstörungsfreien Prüfung | [2001/18] | English: | Nondestructive flaw inspection method and apparatus | [2012/10] | French: | Procédé et dispositif pour l'inspection non-destructive | [2001/18] |
Former [2001/18] | Nondestructive inspection method and apparatus | Examination procedure | 06.11.2000 | Examination requested [2001/18] | 26.01.2007 | Despatch of a communication from the examining division (Time limit: M04) | 01.06.2007 | Reply to a communication from the examining division | 24.03.2009 | Despatch of a communication from the examining division (Time limit: M04) | 05.06.2009 | Reply to a communication from the examining division | 30.09.2009 | Despatch of a communication from the examining division (Time limit: M02) | 19.11.2009 | Reply to a communication from the examining division | 30.11.2009 | Despatch of a communication from the examining division (Time limit: M06) | 19.07.2010 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time | 12.08.2010 | Reply to a communication from the examining division | 13.09.2010 | Despatch of a communication from the examining division (Time limit: M06) | 18.03.2011 | Reply to a communication from the examining division | 14.02.2012 | Despatch of a communication from the examining division (Time limit: M04) | 15.06.2012 | Reply to a communication from the examining division | 12.11.2012 | Communication of intention to grant the patent | 15.03.2013 | Fee for grant paid | 15.03.2013 | Fee for publishing/printing paid | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 26.01.2007 | Opposition(s) | 04.02.2014 | No opposition filed within time limit [2014/15] | Request for further processing for: | The application is deemed to be withdrawn due to failure to reply to the examination report | 12.08.2010 | Request for further processing filed | 12.08.2010 | Full payment received (date of receipt of payment) | Fees paid | Renewal fee | 22.10.2002 | Renewal fee patent year 03 | 22.10.2003 | Renewal fee patent year 04 | 22.10.2004 | Renewal fee patent year 05 | 24.10.2005 | Renewal fee patent year 06 | 24.10.2006 | Renewal fee patent year 07 | 23.10.2007 | Renewal fee patent year 08 | 21.10.2008 | Renewal fee patent year 09 | 20.10.2009 | Renewal fee patent year 10 | 21.10.2010 | Renewal fee patent year 11 | 20.10.2011 | Renewal fee patent year 12 | 22.10.2012 | Renewal fee patent year 13 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [Y]JPH10300688 ; | [XY]JPH05107202 ; | [X]JPS5882147 ; | [X]JPH04223262 ; | [X]JPH06300739 ; | [XY]US5039868 (KOBAYASHI SHIGEKI [JP], et al) [X] 26,27 * column 8, line 38 - line 51 * * column 8, line 57 - column 9, line 12 * [Y] 3,5-10; | [XY]US5047851 (SAUERWEIN KURT [DE], et al) [X] 1,2,4,11,12,15-19,22-25 * column 1, line 10 - line 17 * * column 2, line 63 - column 3, line 20 * * column 4, line 39 - line 50 * [Y] 3,13,14,20,21; | [XP]WO0060344 (HITACHI LTD [JP], et al) [XP] 1-29 * the whole document * | [Y] - PATENT ABSTRACTS OF JAPAN, (19990226), vol. 1999, no. 02, & JP10300688 A 19981113 (FUJIMORI KOGYO KK) [Y] 5-10,13,20 * abstract * | [XY] - PATENT ABSTRACTS OF JAPAN, (19930820), vol. 017, no. 457, Database accession no. (P - 1597), & JP05107202 A 19930427 (HITACHI LTD;OTHERS: 01) [X] 1 * abstract * [Y] 14,21 | [X] - PATENT ABSTRACTS OF JAPAN, (19830804), vol. 007, no. 176, Database accession no. (P - 214), & JP58082147 A 19830517 (TOKYO SHIBAURA DENKI KK) [X] 28,29 * abstract * | [X] - PATENT ABSTRACTS OF JAPAN, (19921216), vol. 016, no. 577, Database accession no. (P - 1460), & JP04223262 A 19920813 (NIHON DENJI SOTSUKI KK) [X] 1 * abstract * | [X] - PATENT ABSTRACTS OF JAPAN, (19950228), vol. 1995, no. 01, & JP06300739 A 19941028 (NIPPON STEEL CORP) [X] 28,29 * abstract * | by applicant | US5047851 | JPH06300739 | JPH10300688 |