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EP About this file: EP1096249

EP1096249 - Nondestructive flaw inspection method and apparatus [Right-click to bookmark this link]
Former [2001/18]	Nondestructive inspection method and apparatus
	[2012/10]
Status	No opposition filed within time limit Status updated on 07.03.2014 Database last updated on 31.08.2024
Most recent event Tooltip	07.03.2014	No opposition filed within time limit	published on 09.04.2014 [2014/15]
Applicant(s)	For all designated states Hitachi-GE Nuclear Energy, Ltd. 1-1 Saiwai-cho 3-chome Hitachi-shi Ibaraki 317-0073 / JP
	[2007/48]
Former [2001/18]	For all designated states Hitachi, Ltd. 6, Kanda Surugadai 4-chome Chiyoda-ku, Tokyo / JP
Inventor(s)	01 / Nomoto, Mineo, c/o Hitachi, Ltd., Int. Prop. Grp. New Marunouchi Bldg. 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	02 / Katsuta, Daiske, c/o Hitachi Ltd., Int. Prop. Grp. New Marunouchi Bldg. 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	03 / Asano, Toshio, c/o Hitachi, Ltd., Int. Prop. Grp. New Marunouchi Bldg. 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	04 / Sakai, Kaoru, c/o Hitachi Ltd., Int. Prop. Grp. New Marunouchi Bldg. 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	05 / Taguchi, Tetsuo, c/o Hitachi, Ltd., Int. Prop. Grp New Marunouchi Bldg. 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	06 / Tanaka, Isao, c/o Hitachi, Ltd., Int. Prop. Grp. New Marunouchi Bldg. 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	[2013/18]
Former [2001/18]	01 / Nomoto, Mineo, c/o Hitachi, Ltd., Int. Prop. Grp. New Marunouchi Bldg., 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	02 / Katsuta, Daiske, c/o Hitachi Ltd., Int. Prop. Grp. New Marunouchi Bldg., 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	03 / Asano, Toshio, c/o Hitachi, Ltd., Int. Prop. Grp. New Marunouchi Bldg., 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	04 / Sakai, Kaoru, c/o Hitachi Ltd., Int. Prop. Grp. New Marunouchi Bldg., 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	05 / Taguchi, Tetsuo, c/o Hitachi, Ltd., Int. Prop. Grp New Marunouchi Bldg., 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
	06 / Tanaka, Isao, c/o Hitachi, Ltd., Int. Prop. Grp. New Marunouchi Bldg., 5-1Marunouchi 1-chome Chiyoda-ku, Tokyo 100-8220 / JP
Representative(s)	Calderbank, Thomas Roger, et al Mewburn Ellis LLP City Tower 40 Basinghall Street London EC2V 5DE / GB
	[N/P]
Former [2013/18]	Calderbank, Thomas Roger, et al Mewburn Ellis LLP 33 Gutter Lane London EC2V 8AS / GB
Former [2001/18]	Calderbank, Thomas Roger, et al MEWBURN ELLIS York House 23 Kingsway London WC2B 6HP / GB
Application number, filing date	00309094.1	16.10.2000
	[2001/18]
Priority number, date	JP19990303480	26.10.1999 Original published format: JP 30348099
	[2001/18]
Filing language	EN
Procedural language	EN
Publication	Type:	A2 Application without search report
	No.:	EP1096249
	Date:	02.05.2001
	Language:	EN
	[2001/18]
	Type:	A3 Search report
	No.:	EP1096249
	Date:	07.11.2001
	[2001/45]
	Type:	B1 Patent specification
	No.:	EP1096249
	Date:	01.05.2013
	Language:	EN
	[2013/18]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	24.09.2001
Classification	IPC:	G06K9/46, G01N21/88, G01N27/84, G01N21/91, G06T7/00	[2012/10]
	CPC:	G01N21/91 (EP,US); G01N27/82 (KR); G06V10/56 (EP,US)
	Former IPC [2001/45]	G01N21/88, G01N27/84, G01N21/91, G06T7/00
	Former IPC [2001/18]	G01N21/88
Designated contracting states	DE, FR, GB, NL [2002/30]
Former [2001/18]	AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE
Title	German:	Verfahren und Vorrichtung zur zerstörungsfreien Prüfung	[2001/18]
	English:	Nondestructive flaw inspection method and apparatus	[2012/10]
	French:	Procédé et dispositif pour l'inspection non-destructive	[2001/18]
	Former [2001/18]	Nondestructive inspection method and apparatus
Examination procedure	06.11.2000	Examination requested [2001/18]
	26.01.2007	Despatch of a communication from the examining division (Time limit: M04)
	01.06.2007	Reply to a communication from the examining division
	24.03.2009	Despatch of a communication from the examining division (Time limit: M04)
	05.06.2009	Reply to a communication from the examining division
	30.09.2009	Despatch of a communication from the examining division (Time limit: M02)
	19.11.2009	Reply to a communication from the examining division
	30.11.2009	Despatch of a communication from the examining division (Time limit: M06)
	19.07.2010	Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
	12.08.2010	Reply to a communication from the examining division
	13.09.2010	Despatch of a communication from the examining division (Time limit: M06)
	18.03.2011	Reply to a communication from the examining division
	14.02.2012	Despatch of a communication from the examining division (Time limit: M04)
	15.06.2012	Reply to a communication from the examining division
	12.11.2012	Communication of intention to grant the patent
	15.03.2013	Fee for grant paid
	15.03.2013	Fee for publishing/printing paid
Divisional application(s)	The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 26.01.2007
Opposition(s)	04.02.2014	No opposition filed within time limit [2014/15]
Request for further processing for:	The application is deemed to be withdrawn due to failure to reply to the examination report
	12.08.2010	Request for further processing filed
	12.08.2010	Full payment received (date of receipt of payment)
Fees paid	Renewal fee
	22.10.2002	Renewal fee patent year 03
	22.10.2003	Renewal fee patent year 04
	22.10.2004	Renewal fee patent year 05
	24.10.2005	Renewal fee patent year 06
	24.10.2006	Renewal fee patent year 07
	23.10.2007	Renewal fee patent year 08
	21.10.2008	Renewal fee patent year 09
	20.10.2009	Renewal fee patent year 10
	21.10.2010	Renewal fee patent year 11
	20.10.2011	Renewal fee patent year 12
	22.10.2012	Renewal fee patent year 13
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[Y]JPH10300688 ;
		[XY]JPH05107202 ;
		[X]JPS5882147 ;
		[X]JPH04223262 ;
		[X]JPH06300739 ;
		[XY]US5039868 (KOBAYASHI SHIGEKI [JP], et al) [X] 26,27 * column 8, line 38 - line 51 * * column 8, line 57 - column 9, line 12 * [Y] 3,5-10;
		[XY]US5047851 (SAUERWEIN KURT [DE], et al) [X] 1,2,4,11,12,15-19,22-25 * column 1, line 10 - line 17 * * column 2, line 63 - column 3, line 20 * * column 4, line 39 - line 50 * [Y] 3,13,14,20,21;
		[XP]WO0060344 (HITACHI LTD [JP], et al) [XP] 1-29 * the whole document *
		[Y] - PATENT ABSTRACTS OF JAPAN, (19990226), vol. 1999, no. 02, & JP10300688 A 19981113 (FUJIMORI KOGYO KK) [Y] 5-10,13,20 * abstract *
		[XY] - PATENT ABSTRACTS OF JAPAN, (19930820), vol. 017, no. 457, Database accession no. (P - 1597), & JP05107202 A 19930427 (HITACHI LTD;OTHERS: 01) [X] 1 * abstract * [Y] 14,21
		[X] - PATENT ABSTRACTS OF JAPAN, (19830804), vol. 007, no. 176, Database accession no. (P - 214), & JP58082147 A 19830517 (TOKYO SHIBAURA DENKI KK) [X] 28,29 * abstract *
		[X] - PATENT ABSTRACTS OF JAPAN, (19921216), vol. 016, no. 577, Database accession no. (P - 1460), & JP04223262 A 19920813 (NIHON DENJI SOTSUKI KK) [X] 1 * abstract *
		[X] - PATENT ABSTRACTS OF JAPAN, (19950228), vol. 1995, no. 01, & JP06300739 A 19941028 (NIPPON STEEL CORP) [X] 28,29 * abstract *
	by applicant	US5047851
		JPH06300739
		JPH10300688

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