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Extract from the Register of European Patents

EP About this file: EP1139419

EP1139419 - Method of manufacturing an electrically programmable, non-volatile memory with logic circuitry [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  20.02.2009
Database last updated on 13.07.2024
Most recent event   Tooltip20.02.2009Application deemed to be withdrawnpublished on 25.03.2009  [2009/13]
Applicant(s)For all designated states
STMicroelectronics Srl
Via C. Olivetti, 2
20041 Agrate Brianza (Milano) / IT
[N/P]
Former [2001/40]For all designated states
STMicroelectronics S.r.l.
Via C. Olivetti, 2
20041 Agrate Brianza (Milano) / IT
Inventor(s)01 / Peschiaroli, Daniela
Via Porpora, 154
20131 Milano / IT
02 / Maurelli, Alfonso
Via Moro, 6
20050 Sulbiate (Milano) / IT
03 / Palumbo, Elisabetta
Via Carlo Vittadini, 6
20136 Milano / IT
04 / Piazza, Fausto
Via Battisti, 12
20041 Agrate Brianza / IT
 [2001/40]
Representative(s)Maccalli, Marco, et al
Jacobacci & Perani S.p.A.
Via Senato, 8
20121 Milano / IT
[N/P]
Former [2001/40]Maccalli, Marco, et al
Jacobacci & Perani S.p.A. Via Senato, 8
20121 Milano / IT
Application number, filing date00830236.629.03.2000
[2001/40]
Filing languageIT
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1139419
Date:04.10.2001
Language:EN
[2001/40]
Search report(s)(Supplementary) European search report - dispatched on:EP18.09.2000
ClassificationIPC:H01L21/8247, H01L27/115
[2001/40]
CPC:
H10B41/40 (EP,US); H10B41/47 (EP,US); H10B99/00 (US)
Designated contracting statesDE,   FR,   GB,   IT [2002/26]
Former [2001/40]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Herstellungsverfahren eines elektrisch programmierbaren Festwertspeichers mit Logikschaltung[2001/40]
English:Method of manufacturing an electrically programmable, non-volatile memory with logic circuitry[2001/40]
French:Procédé de fabrication d'une mémoire non-volatile programmable électriquement avec circuit logique[2001/40]
Examination procedure18.03.2002Examination requested  [2002/22]
07.04.2002Loss of particular rights, legal effect: designated state(s)
08.10.2002Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, CY, DK, ES, FI, GR, IE, LU, MC, NL, PT, SE
02.02.2007Despatch of a communication from the examining division (Time limit: M06)
07.08.2007Reply to a communication from the examining division
01.10.2008Application deemed to be withdrawn, date of legal effect  [2009/13]
04.11.2008Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time  [2009/13]
Fees paidRenewal fee
25.03.2002Renewal fee patent year 03
28.03.2003Renewal fee patent year 04
29.03.2004Renewal fee patent year 05
25.03.2005Renewal fee patent year 06
29.03.2006Renewal fee patent year 07
27.03.2007Renewal fee patent year 08
Penalty fee
Penalty fee Rule 85a EPC 1973
23.07.2002AT   M01   Not yet paid
23.07.2002BE   M01   Not yet paid
23.07.2002CH   M01   Not yet paid
23.07.2002CY   M01   Not yet paid
23.07.2002DK   M01   Not yet paid
23.07.2002ES   M01   Not yet paid
23.07.2002FI   M01   Not yet paid
23.07.2002GR   M01   Not yet paid
23.07.2002IE   M01   Not yet paid
23.07.2002LU   M01   Not yet paid
23.07.2002MC   M01   Not yet paid
23.07.2002NL   M01   Not yet paid
23.07.2002PT   M01   Not yet paid
23.07.2002SE   M01   Not yet paid
Additional fee for renewal fee
31.03.200809   M06   Not yet paid
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Documents cited:Search[Y]US5668034  (SERY GEORGE E [US], et al) [Y] 1-8 * the whole document *;
 [A]US5768194  (MATSUBARA KIYOSHI [JP], et al) [A] 1-8 * column 43, line 44 - column 47, line 61; figures 58A-62 *;
 [A]US5908311  (CHI MIN-HWA [US], et al) [A] 1-8* the whole document *;
 [Y]  - TAKEUCHI Y ET AL, "A SELF-ALIGNED STI PROCESS INTEGRATION FOR LOW COST AND HIGHLY RELIABLE 1GBIT FLASH MEMORIES", SYMPOSIUM ON VLSI TECHNOLOGY,US,NEW YORK, NY: IEEE, (19980609), vol. CONF. 18, ISBN 0-7803-4771-4, pages 102 - 103, XP000802764 [Y] 1-8 * the whole document *
ExaminationEP1109217
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.