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EP1061529
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EP About this file: EP1061529
| EP1061529 - A probe tip for the investigation of a surface and a method of fabrication thereof [Right-click to bookmark this link] | |||
| Former [2000/51] | A probe tip for the investigation of a substrate and a method of fabrication therof | ||
| [2001/04] | Status | The application is deemed to be withdrawn Status updated on 25.05.2007 Database last updated on 19.07.2024 | Most recent event Tooltip | 25.05.2007 | Application deemed to be withdrawn | published on 27.06.2007 [2007/26] | Applicant(s) | For all designated states INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM VZW Kapeldreef 75 3001 Leuven / BE | [N/P] |
| Former [2000/51] | For all designated states INTERUNIVERSITAIRE MICROELEKTRONICA CENTRUM VZW Kapeldreef 75 3001 Leuven / BE | Inventor(s) | 01 /
Hantschel, Thomas Osmarlebener Weg 6 39439 Amesdorf / DE | 02 /
Vandervorst, Wilfried Stuivenberglaan 106 2800 Mechelen / BE | [2000/51] | Representative(s) | Bird, William Edward, et al Bird Goën & Co Wetenschapspark Arenberg Gaston Geenslaan 9 3001 Heverlee / BE | [N/P] |
| Former [2000/51] | Bird, William Edward, et al Bird Goen & Co., Vilvoordsebaan 92 3020 Winksele / BE | Application number, filing date | 00870126.0 | 13.06.2000 | [2000/51] | Priority number, date | US19990138706P | 11.06.1999 Original published format: US 138706 P | [2000/51] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP1061529 | Date: | 20.12.2000 | Language: | EN | [2000/51] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 29.09.2000 | Classification | IPC: | G12B21/02, G12B21/04, G12B21/08, G12B21/10, G01B7/34, G01N27/00 | [2000/51] | CPC: |
G01Q70/10 (EP);
G01Q70/16 (EP)
| Designated contracting states | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE [2000/51] | Title | German: | Tastspitze für die Untersuchung von Oberflächen und Verfahren zu ihrer Herstellung | [2001/04] | English: | A probe tip for the investigation of a surface and a method of fabrication thereof | [2001/04] | French: | Pointe de sonde pour examiner des surfaces et procédé pour sa fabrication | [2001/04] |
| Former [2000/51] | Tastspitze für die Untersuchung eines Substrats unf verfahren zur Herstellung | ||
| Former [2000/51] | A probe tip for the investigation of a substrate and a method of fabrication therof | ||
| Former [2000/51] | Pointe de sonde pour l'inspection d'un substrat et procédé pour sa fabrication | Examination procedure | 11.06.2001 | Examination requested [2001/32] | 03.01.2007 | Application deemed to be withdrawn, date of legal effect [2007/26] | 07.02.2007 | Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time [2007/26] | Fees paid | Renewal fee | 27.05.2002 | Renewal fee patent year 03 | 26.05.2003 | Renewal fee patent year 04 | 30.06.2004 | Renewal fee patent year 05 | 19.05.2005 | Renewal fee patent year 06 | Penalty fee | Additional fee for renewal fee | 30.06.2006 | 07 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]EP0899538 (IMEC VZW [BE]) [A] 1-11 * the whole document *; | [A]EP0848248 (SEIKO INSTR INC [JP]) [A] 1 * abstract *; | [A]US5336369 (KADO HIROYUKI [JP], et al) [A] 7 * figure 7 *; | [A]JPH0371001 | [A] - PATENT ABSTRACTS OF JAPAN, (19910612), vol. 015, no. 230, Database accession no. (P - 1214), & JP03071001 A 19910326 (OLYMPUS OPTICAL CO LTD) [A] 1,7 * abstract * |