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Extract from the Register of European Patents

EP About this file: EP1113393

EP1113393 - Object inspection process and arrangement [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  08.09.2006
Database last updated on 03.09.2024
Most recent event   Tooltip26.06.2009Change - representativepublished on 29.07.2009  [2009/31]
Applicant(s)For all designated states
ARC Seibersdorf Research GmbH
Kramergasse 1
1010 Wien / AT
[N/P]
Former [2005/08]For all designated states
ARC Seibersdorf research GmbH
Kramergasse 1
1010 Wien / AT
Former [2001/27]For all designated states
ÖSTERREICHISCHES FORSCHUNGSZENTRUM SEIBERSDORF GES.M.B.H.
2444 Seibersdorf / AT
Inventor(s)01 / Penz, Harald, Dr.
Pohlgasse 21/7
1120 Wien / AT
02 / Vrabl, Andreas, Dipl.-Ing.
Hentzigasse 13/8
1100 Wien / AT
03 / Krattenthaler, Werner, Dr.
Erlaufstrasse 36/4
2344 Maria Enzersdorf / AT
04 / Mayer, Konrad, Dipl.-Ing.
Baumgartnerstrasse 44/C4/03/02
1230 Wien / AT
 [2001/27]
Representative(s)Wildhack, Helmut
Wildhack & Jellinek Patentanwälte OG Landstrasser Hauptstrasse 50
1030 Wien / AT
[2009/31]
Former [2001/27]Wildhack, Helmut, Dipl.-Ing. Dr.
Patentanwälte Dipl.-Ing. Leo Brauneiss, Dipl.-Ing. Dr. Helmut Wildhack, Dipl.-Ing. Dr. Gerhard Jellinek, Landstrasser Hauptstrasse 50
1030 Wien / AT
Application number, filing date00890384.122.12.2000
[2001/27]
Priority number, dateAT1999000220529.12.1999         Original published format: AT 220599
[2001/27]
Filing languageDE
Procedural languageDE
PublicationType: A2 Application without search report 
No.:EP1113393
Date:04.07.2001
Language:DE
[2001/27]
Type: A3 Search report 
No.:EP1113393
Date:28.01.2004
[2004/05]
Type: B1 Patent specification 
No.:EP1113393
Date:02.11.2005
Language:DE
[2005/44]
Search report(s)(Supplementary) European search report - dispatched on:EP15.12.2003
ClassificationIPC:G06T7/00
[2001/27]
CPC:
G06T7/001 (EP,US); G06F18/40 (EP); G06V10/94 (EP,US);
G06T2207/30108 (EP)
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   TR [2001/27]
TitleGerman:Verfahren und Anordnung zur Prüfung von Gegenständen[2001/27]
English:Object inspection process and arrangement[2001/27]
French:Procédé et arrangement pour l'inspection d'objets[2001/27]
Examination procedure10.07.2004Examination requested  [2004/37]
12.05.2005Communication of intention to grant the patent
26.08.2005Fee for grant paid
26.08.2005Fee for publishing/printing paid
Opposition(s)03.08.2006No opposition filed within time limit [2006/41]
Fees paidRenewal fee
14.12.2002Renewal fee patent year 03
23.12.2003Renewal fee patent year 04
17.12.2004Renewal fee patent year 05
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipFI02.11.2005
FR02.11.2005
IE02.11.2005
IT02.11.2005
NL02.11.2005
TR02.11.2005
AT22.12.2005
CY22.12.2005
BE31.12.2005
CH31.12.2005
LI31.12.2005
MC31.12.2005
LU02.01.2006
DK02.02.2006
GB02.02.2006
GR02.02.2006
SE02.02.2006
ES13.02.2006
PT03.04.2006
[2008/52]
Former [2008/40]FI02.11.2005
IE02.11.2005
IT02.11.2005
NL02.11.2005
TR02.11.2005
AT22.12.2005
CY22.12.2005
BE31.12.2005
CH31.12.2005
FR31.12.2005
LI31.12.2005
MC31.12.2005
LU02.01.2006
DK02.02.2006
GB02.02.2006
GR02.02.2006
SE02.02.2006
ES13.02.2006
PT03.04.2006
Former [2007/35]FI02.11.2005
IE02.11.2005
IT02.11.2005
NL02.11.2005
TR02.11.2005
AT22.12.2005
CY22.12.2005
BE31.12.2005
CH31.12.2005
LI31.12.2005
MC31.12.2005
LU02.01.2006
DK02.02.2006
GB02.02.2006
GR02.02.2006
SE02.02.2006
ES13.02.2006
PT03.04.2006
Former [2007/27]FI02.11.2005
IE02.11.2005
NL02.11.2005
TR02.11.2005
AT22.12.2005
CY22.12.2005
BE31.12.2005
CH31.12.2005
LI31.12.2005
MC31.12.2005
LU02.01.2006
DK02.02.2006
GB02.02.2006
GR02.02.2006
SE02.02.2006
ES13.02.2006
PT03.04.2006
Former [2007/20]FI02.11.2005
IE02.11.2005
NL02.11.2005
TR02.11.2005
CY22.12.2005
BE31.12.2005
CH31.12.2005
LI31.12.2005
MC31.12.2005
LU02.01.2006
DK02.02.2006
GR02.02.2006
SE02.02.2006
ES13.02.2006
PT03.04.2006
Former [2007/13]FI02.11.2005
IE02.11.2005
NL02.11.2005
TR02.11.2005
BE31.12.2005
CH31.12.2005
LI31.12.2005
MC31.12.2005
LU02.01.2006
DK02.02.2006
GR02.02.2006
SE02.02.2006
ES13.02.2006
PT03.04.2006
Former [2007/08]FI02.11.2005
IE02.11.2005
NL02.11.2005
TR02.11.2005
CH31.12.2005
LI31.12.2005
MC31.12.2005
LU02.01.2006
DK02.02.2006
GR02.02.2006
SE02.02.2006
ES13.02.2006
PT03.04.2006
Former [2007/03]FI02.11.2005
IE02.11.2005
NL02.11.2005
TR02.11.2005
CH31.12.2005
LI31.12.2005
MC31.12.2005
DK02.02.2006
GR02.02.2006
SE02.02.2006
ES13.02.2006
PT03.04.2006
Former [2006/51]FI02.11.2005
IE02.11.2005
NL02.11.2005
TR02.11.2005
MC31.12.2005
DK02.02.2006
GR02.02.2006
SE02.02.2006
ES13.02.2006
PT03.04.2006
Former [2006/48]FI02.11.2005
IE02.11.2005
NL02.11.2005
MC31.12.2005
DK02.02.2006
GR02.02.2006
SE02.02.2006
ES13.02.2006
PT03.04.2006
Former [2006/40]FI02.11.2005
IE02.11.2005
NL02.11.2005
MC31.12.2005
DK02.02.2006
GR02.02.2006
SE02.02.2006
ES13.02.2006
Former [2006/38]FI02.11.2005
NL02.11.2005
DK02.02.2006
GR02.02.2006
SE02.02.2006
ES13.02.2006
Former [2006/35]FI02.11.2005
NL02.11.2005
DK02.02.2006
SE02.02.2006
ES13.02.2006
Former [2006/33]FI02.11.2005
NL02.11.2005
SE02.02.2006
ES13.02.2006
Former [2006/27]FI02.11.2005
NL02.11.2005
SE02.02.2006
Former [2006/23]FI02.11.2005
NL02.11.2005
Documents cited:Search[X]WO9960517  (DATACUBE INC [US]) [X] 1-13 * abstract * * page 3, line 13 - page 5, line 5 * * page 10, line 4 - page 17, line 28 *;
 [X]  - KRATTENTHALER W ET AL, "Point correlation: a reduced-cost template matching technique", PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING (ICIP) AUSTIN, NOV. 13 - 16, 1994, LOS ALAMITOS, IEEE COMP. SOC. PRESS, US, (19941113), vol. 3 CONF. 1, ISBN 0-8186-6952-7, pages 208 - 212, XP010145956 [X] 1-13 * abstract * * page 208, column R * * page 209, column R, paragraph 2 - page 212, column R, paragraph 2 *

DOI:   http://dx.doi.org/10.1109/ICIP.1994.413305
 [X]  - TANIMOTO S L, "TEMPLATE MATCHING IN PYRAMIDS", COMPUTER GRAPHICS AND IMAGE PROCESSING, ACADEMIC PRESS. NEW YORK, US, (1981), vol. 16, pages 356 - 369, XP000604892 [X] 1-13 * abstract * * page 358, paragraph 2 - page 369, paragraph 1 *

DOI:   http://dx.doi.org/10.1016/0146-664X(81)90046-0
 [X]  - YOSHIMURA S ET AL, "Fast template matching based on the normalized correlation by using multiresolution eigenimages", INTELLIGENT ROBOTS AND SYSTEMS '94. 'ADVANCED ROBOTIC SYSTEMS AND THE REAL WORLD', IROS '94. PROCEEDINGS OF THE IEEE/RSJ/GI INTERNATIONAL CONFERENCE ON MUNICH, GERMANY 12-16 SEPT. 1994, NEW YORK, NY, USA,IEEE, (19940912), ISBN 0-7803-1933-8, pages 2086 - 2093, XP010142022 [X] 1-13 * abstract * * page 2087, column L, paragraph 4 - page 2091, column L, paragraph 3 *

DOI:   http://dx.doi.org/10.1109/IROS.1994.407577
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.