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Extract from the Register of European Patents

EP About this file: EP1169626

EP1169626 - DEVICE AND METHOD FOR OPTICAL SPECTROSCOPY [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  15.08.2008
Database last updated on 19.07.2024
Most recent event   Tooltip15.08.2008No opposition filed within time limitpublished on 17.09.2008  [2008/38]
Applicant(s)For all designated states
Campus Technologies AG
Baarerstrasse 112
6300 Zug / CH
[2002/02]
Inventor(s)01 / WEITZEL, Thilo
Hartmeyerstrasse 50
D-72070 Tübingen / DE
 [2002/02]
Representative(s)Lorenz, Eduard, et al
Lorenz-Seidler-Gossel
Widenmayerstrasse 23
80538 München / DE
[N/P]
Former [2002/02]Lorenz, Eduard, et al
Lorenz-Seidler-Gossel, Widenmayerstrasse 23
D-80538 München / DE
Application number, filing date00918863.207.04.2000
[2002/02]
WO2000EP03145
Priority number, dateDE199911607209.04.1999         Original published format: DE 19916072
DE199912278318.05.1999         Original published format: DE 19922783
DE199913329015.07.1999         Original published format: DE 19933290
[2002/02]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO0062026
Date:19.10.2000
Language:DE
[2000/42]
Type: A1 Application with search report 
No.:EP1169626
Date:09.01.2002
Language:DE
The application published by WIPO in one of the EPO official languages on 19.10.2000 takes the place of the publication of the European patent application.
[2002/02]
Type: B1 Patent specification 
No.:EP1169626
Date:10.10.2007
Language:DE
[2007/41]
Search report(s)International search report - published on:EP19.10.2000
ClassificationIPC:G01J3/453, G01J9/02
[2002/02]
CPC:
G01J9/02 (EP,US); G01J3/453 (EP,US); G01J3/457 (EP,US);
G01J2003/2866 (EP,US)
Designated contracting statesDE,   FR,   GB [2004/21]
Former [2002/02]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:VORRICHTUNG UND VERFAHREN ZUR OPTISCHEN SPEKTROSKOPIE[2002/02]
English:DEVICE AND METHOD FOR OPTICAL SPECTROSCOPY[2002/02]
French:DISPOSITIF ET PROCEDE DE SPECTROSCOPIE OPTIQUE[2002/02]
Entry into regional phase09.10.2001National basic fee paid 
09.10.2001Designation fee(s) paid 
09.10.2001Examination fee paid 
Examination procedure27.10.2000Request for preliminary examination filed
International Preliminary Examining Authority: EP
09.10.2001Examination requested  [2002/02]
28.03.2002Despatch of a communication from the examining division (Time limit: M08)
02.12.2002Reply to a communication from the examining division
23.10.2003Despatch of a communication from the examining division (Time limit: M06)
22.04.2004Reply to a communication from the examining division
03.06.2005Despatch of a communication from the examining division (Time limit: M06)
13.12.2005Reply to a communication from the examining division
08.06.2007Communication of intention to grant the patent
21.08.2007Fee for grant paid
21.08.2007Fee for publishing/printing paid
Opposition(s)11.07.2008No opposition filed within time limit [2008/38]
Fees paidRenewal fee
30.04.2002Renewal fee patent year 03
30.04.2003Renewal fee patent year 04
29.04.2004Renewal fee patent year 05
29.04.2005Renewal fee patent year 06
30.06.2006Renewal fee patent year 07
27.04.2007Renewal fee patent year 08
Penalty fee
Additional fee for renewal fee
30.04.200607   M06   Fee paid on   30.06.2006
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Cited inInternational search[XAY]US5059027  (ROESLER FRED L [US], et al) [X] 1,3-8,12,20-23,26,29,30 * column 1, line 56 - column 2, line 22 * * column 3, line 22 - column 4, line 8 * * column 4, line 27 - line 34 * * column 5, line 4 - line 39 * * column 9, line 39 - line 68 * * figures 1,2,12,13 * [A] 2,31,32,34 [Y] 10,13-18,24,25,33,35,36;
 [XY]JPH05180696  ;
 [YA]EP0767361  (C I SYSTEMS ISRAEL LTD [IL], et al) [Y] 10,13-18 * page 5, line 6 - line 25 * * page 10, line 40 - line 44 * * page 12, line 9 - line 18 * * figures 3,4,6,10 * [A] 11;
 [YA]EP0415143  (SEL ALCATEL AG [DE], et al) [Y] 24,25 * column 2, line 44 - column 3, line 27 * * column 3, line 52 - column 4, line 14 * * figures 1,2 * [A] 31,32,34;
 [X]JPH0455726
 [XY]  - PATENT ABSTRACTS OF JAPAN, (19931029), vol. 017, no. 596, Database accession no. (P - 1636), & JP05180696 A 19930723 (NEC CORP) [X] 1,3-6,8,9,13,14,26-29 * abstract * [Y] 33,35,36
 [X]  - PATENT ABSTRACTS OF JAPAN, (19920605), vol. 016, no. 247, Database accession no. (P - 1365), & JP04055726 A 19920224 (CANON INC) [X] 1 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.