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Extract from the Register of European Patents

EP About this file: EP1196803

EP1196803 - NEAR FIELD OPTICAL EXAMINATION DEVICE [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  06.02.2004
Database last updated on 30.09.2024
Most recent event   Tooltip17.02.2006Lapse of the patent in a contracting state
New state(s): FR		published on 05.04.2006  [2006/14]
Applicant(s)For all designated states
Laser- und Medizin-Technologie GmbH Berlin
Fabeckstrasse 60-62
14195 Berlin / DE
[N/P]
Former [2002/16]For all designated states
Laser- und Medizin-Technologie GmbH
Fabeckstrasse 60-62
14195 Berlin / DE
Inventor(s)01 / MÜLLER, Gerhard
An der Rehwiese 8
D-14129 Berlin / DE
02 / HELFMANN, Jürgen
Clara-Zetkin-Strasse 22
D-14532 Berlin / DE
 [2002/16]
Representative(s)Eisenführ Speiser
Patentanwälte Rechtsanwälte PartGmbB
Stralauer Platz 34
10243 Berlin / DE
[N/P]
Former [2002/16]Eisenführ, Speiser & Partner
Pacelliallee 43/45
14195 Berlin / DE
Application number, filing date00942148.829.06.2000
[2002/16]
WO2000EP06088
Priority number, dateDE1999102987529.06.1999         Original published format: DE 19929875
[2002/16]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO0101183
Date:04.01.2001
Language:DE
[2001/01]
Type: A1 Application with search report 
No.:EP1196803
Date:17.04.2002
Language:DE
The application published by WIPO in one of the EPO official languages on 04.01.2001 takes the place of the publication of the European patent application.
[2002/16]
Type: B1 Patent specification 
No.:EP1196803
Date:02.04.2003
Language:DE
[2003/14]
Search report(s)International search report - published on:EP04.01.2001
ClassificationIPC:G02B21/00, G02B21/06
[2002/16]
CPC:
G02B21/34 (EP); G01Q60/22 (EP)
Designated contracting statesDE,   FR,   GB [2003/14]
Former [2002/16]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:NAHFELDOPTISCHE UNTERSUCHUNGSVORRICHTUNG[2002/16]
English:NEAR FIELD OPTICAL EXAMINATION DEVICE[2002/16]
French:DISPOSITIF D'EXAMEN OPTIQUE A CHAMP PROCHE[2002/16]
Entry into regional phase29.01.2002National basic fee paid 
29.01.2002Designation fee(s) paid 
29.01.2002Examination fee paid 
Examination procedure19.01.2001Request for preliminary examination filed
International Preliminary Examining Authority: EP
29.01.2002Examination requested  [2002/16]
18.06.2002Despatch of communication of intention to grant (Approval: Yes)
17.10.2002Communication of intention to grant the patent
17.01.2003Fee for grant paid
17.01.2003Fee for publishing/printing paid
Opposition(s)05.01.2004No opposition filed within time limit [2004/13]
Fees paidRenewal fee
01.07.2002Renewal fee patent year 03
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipFR02.04.2003
GB02.04.2003
DE01.01.2004
[2006/14]
Former [2004/31]GB02.04.2003
DE01.01.2004
Former [2004/22]GB02.04.2003
Cited inInternational search[PXA]DE19858490  (LASER & MED TECH GMBH [DE]) [PX] 1,4,8-14,16,19-28 * the whole document * [PA] 29;
 [DA]DE19601109  (LASER & MED TECH GMBH [DE]) [DA] 1,29 * the whole document *;
 [A]GB2126778  (ERA PATENTS LTD) [A] 1,15,29 * page 1, line 82 - line 94 * * page 4, line 19 - line 101; figure 3 *;
 [A]US4041146  (GIAEVER IVAR) [A] 29 * column 6, line 42 - line 45 * * column 7, line 5 - column 8, line 42 *
 [A]  - POHL D W, "SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM)", ADVANCES IN OPTICAL AND ELECTRON MICROSCOPY,GB,LONDON, (1991), vol. 12, pages 243 - 312, XP000372084 [A] 1 * page 249, paragraph L - page 250, paragraph 1 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.