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Extract from the Register of European Patents

EP About this file: EP1157595

EP1157595 - METHOD OF GENERATING EXTREMELY SHORT-WAVE RADIATION, METHOD OF MANUFACTURING A DEVICE BY MEANS OF SAID RADIATION, EXTREMELY SHORT-WAVE RADIATION SOURCE UNIT AND LITHOGRAPHIC PROJECTION APPARATUS PROVIDED WITH SUCH A RADIATION SOURCE UNIT [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  18.04.2008
Database last updated on 15.11.2024
Most recent event   Tooltip18.04.2008Application deemed to be withdrawnpublished on 21.05.2008  [2008/21]
Applicant(s)For all designated states
Koninklijke Philips Electronics N.V.
Groenewoudseweg 1
5621 BA Eindhoven / NL
[N/P]
Former [2001/48]For all designated states
Koninklijke Philips Electronics N.V.
Groenewoudseweg 1
5621 BA Eindhoven / NL
Inventor(s)01 / BISSCHOPS, Theodorus, H., J.
Prof. Holstlaan 6
NL-5656 AA Eindhoven / NL
 [2001/48]
Representative(s)Duijvestijn, Adrianus Johannes, et al
Philips Intellectual Property & Standards
High Tech Campus 5
5656 AE Eindhoven / NL
[N/P]
Former [2004/13]Duijvestijn, Adrianus Johannes, et al
Philips Intellectual Property & Standards P.O. Box 220
5600 AE Eindhoven / NL
Former [2001/48]Cobben, Louis Marie Hubert, et al
INTERNATIONAAL OCTROOIBUREAU B.V., Prof. Holstlaan 6
5656 AA Eindhoven / NL
Application number, filing date00981363.511.12.2000
[2001/48]
WO2000EP12525
Priority number, dateEP1999020450023.12.1999         Original published format: EP 99204500
[2001/48]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO0149085
Date:05.07.2001
Language:EN
[2001/27]
Type: A1 Application with search report 
No.:EP1157595
Date:28.11.2001
Language:EN
The application published by WIPO in one of the EPO official languages on 05.07.2001 takes the place of the publication of the European patent application.
[2001/48]
Search report(s)International search report - published on:EP05.07.2001
ClassificationIPC:H05G2/00
[2001/48]
CPC:
H05G2/001 (EP,US); B82Y10/00 (EP,US); G03F7/70033 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT,   NL [2004/21]
Former [2001/48]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
Extension statesALNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
RONot yet paid
SINot yet paid
TitleGerman:VERFAHREN ZUR ERZEUGUNG VON EXTREM-KURZWELLEN-STRAHLUNG, VERFAHREN ZUR HERSTELLUNG EINER VORRICHTUNG DURCH DIESE STRAHLUNG, EXTREM-KURZWELLEN-STRAHLUNGSQUELLENEINHEIT[2001/48]
English:METHOD OF GENERATING EXTREMELY SHORT-WAVE RADIATION, METHOD OF MANUFACTURING A DEVICE BY MEANS OF SAID RADIATION, EXTREMELY SHORT-WAVE RADIATION SOURCE UNIT AND LITHOGRAPHIC PROJECTION APPARATUS PROVIDED WITH SUCH A RADIATION SOURCE UNIT[2001/48]
French:PROCEDE PERMETTANT DE GENERER DES RAYONNEMENTS D'EXTREMEMENT COURTES LONGUEURS D'ONDE, PROCEDE DE FABRICATION D'UN DISPOSITIF AU MOYEN DE CES RAYONNEMENTS, UNITE DE SOURCE DE RAYONNEMENTS D'EXTREMEMENT COURTES LONGUEURS D'ONDE ET APPAREIL DE PROJECTION LITHOGRAPHIQUE DOTE D'UNE TELLE UNITE[2001/48]
Entry into regional phase24.09.2001National basic fee paid 
07.01.2002Designation fee(s) paid 
07.01.2002Examination fee paid 
Examination procedure07.01.2002Examination requested  [2002/12]
08.05.2007Despatch of a communication from the examining division (Time limit: M06)
20.11.2007Application deemed to be withdrawn, date of legal effect  [2008/21]
02.01.2008Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2008/21]
Fees paidRenewal fee
02.01.2003Renewal fee patent year 03
02.01.2004Renewal fee patent year 04
03.01.2005Renewal fee patent year 05
02.01.2006Renewal fee patent year 06
02.01.2007Renewal fee patent year 07
Penalty fee
Additional fee for renewal fee
31.12.200708   M06   Not yet paid
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Cited inInternational search[XAY]US4860328  (FRANKEL ROBERT D [US], et al) [X] 1,5,10,14 * column 6, line 60 - column 7, line 48 * * column 11, line 15 - column 12, line 24 * * figures 5,6,12 * [A] 8 [Y] 20;
 [YA]EP0957402  (ASM LITHOGRAPHY BV [NL]) [Y] 20 * page 7, line 1 - line 11 * * figures 1,2 * [A] 9;
 [A]JPH11250842  ;
 [A]JPH05119199  ;
 [A]JPH1140480  ;
 US6069937  [ ] (OSHINO TETSUYA [JP], et al) [ ] * column 5, line 55 - column 6, line 25 * * claims 1-3 *;
 [A]US4952145  (KWIATKOWSKI KURT VON [DE], et al) [A] 6,7 * column 6, line 45 - line 54 * * figure 1 *;
 [PX]JP2000299196
 [A]  - PATENT ABSTRACTS OF JAPAN, (19991222), vol. 1999, no. 14, & JP11250842 A 19990917 (AGENCY OF IND SCIENCE &TECHNOL; TOMIE TOSHIHISA) [A] 1,2,10,11 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19930831), vol. 017, no. 481, Database accession no. (P - 1604), & JP05119199 A 19930518 (NIKON CORP) [A] 2,11 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19990531), vol. 1999, no. 05, & JP11040480 A 19990212 (NIKON CORP) [A] 1-3,5,11,12,14,20
 [PX]  - DATABASE WPI, 1, Derwent World Patents Index, vol. 2001, no. 04, Database accession no. 2001-029175, XP002162344 & JP2000299196 A 20001024 (AGENCY OF IND SCI & TECHNOLOGY) [PX] 1 * abstract *
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