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Extract from the Register of European Patents

EP About this file: EP1122528

EP1122528 - Arrangement and method for determining dilatations and temperature and variations thereof of a covering layer applied on a support [Right-click to bookmark this link]
Former [2001/32]Arrangement and method for determining dilatations and temperature as well variations thereof of a covering layer applied on a support
[2009/38]
StatusNo opposition filed within time limit
Status updated on  26.11.2010
Database last updated on 12.07.2024
Most recent event   Tooltip19.10.2012Lapse of the patent in a contracting state
New state(s): TR		published on 21.11.2012  [2012/47]
Applicant(s)For all designated states
Airbus Deutschland GmbH
Kreetslag 10
21129 Hamburg / DE
[2010/03]
Former [2002/06]For all designated states
Airbus Deutschland GmbH
Kreetslag 10
21129 Hamburg / DE
Former [2001/32]For all designated states
EADS Airbus GmbH
Kreetslag 10
21129 Hamburg / DE
Inventor(s)01 / Gleine, Wolfgang, Dr.-Ing.
Rademacher Kamp 1
21255 Kakenstorf / DE
02 / Trutzel, Michael, Dipl.-Ing.
Burgsteige 18
89134 Blaustein/Ulm / DE
 [2001/32]
Representative(s)Hansmann, Dierk
Patentanwälte
Hansmann-Klickow-Hansmann
Jessenstrasse 4
22767 Hamburg / DE
[N/P]
Former [2001/32]Hansmann, Dierk, Dipl.-Ing.
Patentanwälte Hansmann-Klickow-Hansmann Jessenstrasse 4
22767 Hamburg / DE
Application number, filing date01101332.322.01.2001
[2001/32]
Priority number, dateDE200010438402.02.2000         Original published format: DE 10004384
[2001/32]
Filing languageDE
Procedural languageDE
PublicationType: A2 Application without search report 
No.:EP1122528
Date:08.08.2001
Language:DE
[2001/32]
Type: A3 Search report 
No.:EP1122528
Date:23.04.2003
[2003/17]
Type: B1 Patent specification 
No.:EP1122528
Date:20.01.2010
Language:DE
[2010/03]
Search report(s)(Supplementary) European search report - dispatched on:EP06.03.2003
ClassificationIPC:G01L1/24
[2001/32]
CPC:
G01M11/086 (EP,US); G01K11/3206 (EP,US); G01L5/0047 (EP,US)
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   TR [2001/32]
TitleGerman:Anordnung und Verfahren zur Erfassung von Dehnungen und Temperaturen und deren Veränderungen einer auf einem Träger applizierten Deckschicht[2001/32]
English:Arrangement and method for determining dilatations and temperature and variations thereof of a covering layer applied on a support[2009/38]
French:Arrangement et méthode pour déterminer dilatations et températures et ses variations d'une couche de couverture appliquée sur un support[2001/32]
Former [2001/32]Arrangement and method for determining dilatations and temperature as well variations thereof of a covering layer applied on a support
Examination procedure23.10.2003Examination requested  [2004/01]
25.02.2008Despatch of a communication from the examining division (Time limit: M06)
29.07.2008Reply to a communication from the examining division
07.10.2009Communication of intention to grant the patent
08.12.2009Fee for grant paid
08.12.2009Fee for publishing/printing paid
Opposition(s)21.10.2010No opposition filed within time limit [2010/52]
Fees paidRenewal fee
31.01.2003Renewal fee patent year 03
02.02.2004Renewal fee patent year 04
31.01.2005Renewal fee patent year 05
31.01.2006Renewal fee patent year 06
31.01.2007Renewal fee patent year 07
31.01.2008Renewal fee patent year 08
14.01.2009Renewal fee patent year 09
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipCY20.01.2010
DK20.01.2010
FI20.01.2010
IE20.01.2010
NL20.01.2010
SE20.01.2010
TR20.01.2010
AT22.01.2010
LU22.01.2010
BE31.01.2010
CH31.01.2010
LI31.01.2010
MC31.01.2010
GR21.04.2010
ES01.05.2010
PT20.05.2010
[2012/47]
Former [2012/43]CY20.01.2010
DK20.01.2010
FI20.01.2010
IE20.01.2010
NL20.01.2010
SE20.01.2010
AT22.01.2010
LU22.01.2010
BE31.01.2010
CH31.01.2010
LI31.01.2010
MC31.01.2010
GR21.04.2010
ES01.05.2010
PT20.05.2010
Former [2011/31]CY20.01.2010
DK20.01.2010
FI20.01.2010
IE20.01.2010
NL20.01.2010
SE20.01.2010
AT22.01.2010
BE31.01.2010
CH31.01.2010
LI31.01.2010
MC31.01.2010
GR21.04.2010
ES01.05.2010
PT20.05.2010
Former [2011/13]CY20.01.2010
DK20.01.2010
FI20.01.2010
IE20.01.2010
NL20.01.2010
SE20.01.2010
BE31.01.2010
CH31.01.2010
LI31.01.2010
MC31.01.2010
GR21.04.2010
ES01.05.2010
PT20.05.2010
Former [2011/07]CY20.01.2010
DK20.01.2010
FI20.01.2010
IE20.01.2010
NL20.01.2010
SE20.01.2010
CH31.01.2010
LI31.01.2010
MC31.01.2010
GR21.04.2010
ES01.05.2010
PT20.05.2010
Former [2010/49]CY20.01.2010
FI20.01.2010
IE20.01.2010
NL20.01.2010
SE20.01.2010
CH31.01.2010
LI31.01.2010
MC31.01.2010
GR21.04.2010
ES01.05.2010
PT20.05.2010
Former [2010/47]CY20.01.2010
FI20.01.2010
IE20.01.2010
NL20.01.2010
CH31.01.2010
LI31.01.2010
MC31.01.2010
GR21.04.2010
ES01.05.2010
PT20.05.2010
Former [2010/46]FI20.01.2010
IE20.01.2010
NL20.01.2010
MC31.01.2010
GR21.04.2010
ES01.05.2010
PT20.05.2010
Former [2010/38]FI20.01.2010
NL20.01.2010
MC31.01.2010
ES01.05.2010
PT20.05.2010
Former [2010/37]NL20.01.2010
MC31.01.2010
ES01.05.2010
PT20.05.2010
Former [2010/35]NL20.01.2010
ES01.05.2010
PT20.05.2010
Former [2010/32]ES01.05.2010
Documents cited:Search[YD]DE3142392  (VER FLUGTECHNISCHE WERKE [DE]) [YD] 1 * page 5 - page 6 *;
 [A]US5345519  (LU ZHUO J [CA]) [A] 1 * claims 1-10 *;
 [AD]WO9524614  (UNITED TECHNOLOGIES CORP [US], et al) [AD] 1 * page 2 - page 3 *;
 [A]WO9726572  (CORNING INC [US], et al) [A] 1* claims 23-40 *;
 [A]US5680489  (KERSEY ALAN D [US]) [A] 1 * claims 1-17 *;
 [A]WO9827446  (MICRON OPTICS INC [US]) [A] 1 * page 6 - page 8 *;
 [A]WO9950699  (CORNING INC [US], et al) [A] 1 * page 7 - page 10 *;
 [A]WO9961875  (MINNESOTA MINING & MFG [US]) [A] 1 * page 5 - page 11 *;
 [Y]US6018160  (BENNION IAN [GB], et al) [Y] 1 * claims 1-8 *;
 [AP]EP1014123  (OTC OPTICAL TECHNOLOGIES CENTE [IT]) [AP] 1 * claims 1-4 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.