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EP About this file: EP1134699

EP1134699 - Image recording apparatus for flaw detection [Right-click to bookmark this link]
Status	The application is deemed to be withdrawn Status updated on 01.02.2008 Database last updated on 24.08.2024
Most recent event Tooltip	01.02.2008	Application deemed to be withdrawn	published on 05.03.2008 [2008/10]
Applicant(s)	For all designated states OMRON CORPORATION 801, Minamifudodo-cho, Horikawahigashiiru, Shiokoji-dori, Shimogyo-ku Kyoto-shi, Kyoto 600-8530 / JP
	[N/P]
Former [2001/38]	For all designated states Omron Corporation 801, Minamifudoudou-cho, Horikawahigashiiru, Shiokouji-doori, Shimogyo-ku Kyoto-shi, Kyoto-fu, 600-8530 / JP
Inventor(s)	01 / Iida, Toyoo, c/o Omron Corporation 801, Minamifudodo-cho, Horikawahigashiiru Shiokoji, Shimogyo-ku, Kyoto 600-8530 / JP
	02 / Ishizawa, Tomoki, c/o Omron Corporation 801, Minamifudodo-cho, Horikawahigashiiru Shiokoji, Shimogyo-ku, Kyoto 600-8530 / JP
	03 / Sato, Masanori, c/o Omron Corporation 801, Minamifudodo-cho, Horikawahigashiiru Shiokoji, Shimogyo-ku, Kyoto 600-8530 / JP
	04 / Masaki, Toshimichi, c/o Omron Corporation 801, Minamifudodo-cho, Horikawahigashiiru Shiokoji, Shimogyo-ku, Kyoto 600-8530 / JP
	[2001/38]
Representative(s)	Kilian, Helmut Wilhelms, Kilian & Partner Patentanwälte Eduard-Schmid-Strasse 2 81541 München / DE
	[N/P]
Former [2001/38]	Kilian, Helmut, Dr. Wilhelms, Kilian & Partner Patentanwälte Eduard-Schmid-Strasse 2 81541 München / DE
Application number, filing date	01106149.6	13.03.2001
	[2001/38]
Priority number, date	JP20000076103	17.03.2000 Original published format: JP 2000076103
	[2001/38]
Filing language	EN
Procedural language	EN
Publication	Type:	A2 Application without search report
	No.:	EP1134699
	Date:	19.09.2001
	Language:	EN
	[2001/38]
	Type:	A3 Search report
	No.:	EP1134699
	Date:	14.01.2004
	[2004/03]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	27.11.2003
Classification	IPC:	G06T7/00	[2001/38]
	CPC:	G06T7/0004 (EP,US); G06T7/0002 (EP,US); G06T2200/24 (EP,US); G06T2207/30164 (EP,US)
Designated contracting states	DE, FR, GB, IT [2004/41]
Former [2001/38]	AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR
Title	German:	Bildaufnahmegerät zur Fehlerdetektion	[2001/38]
	English:	Image recording apparatus for flaw detection	[2001/38]
	French:	Appareil d'enregistrement d'images pour la détection de défauts	[2001/38]
Examination procedure	28.06.2004	Examination requested [2004/35]
	17.09.2004	Despatch of a communication from the examining division (Time limit: M06)
	24.03.2005	Reply to a communication from the examining division
	27.06.2006	Despatch of a communication from the examining division (Time limit: M06)
	08.01.2007	Reply to a communication from the examining division
	20.04.2007	Despatch of a communication from the examining division (Time limit: M04)
	31.08.2007	Application deemed to be withdrawn, date of legal effect [2008/10]
	15.10.2007	Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2008/10]
Fees paid	Renewal fee
	31.03.2003	Renewal fee patent year 03
	31.03.2004	Renewal fee patent year 04
	31.03.2005	Renewal fee patent year 05
	31.03.2006	Renewal fee patent year 06
	30.03.2007	Renewal fee patent year 07
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[X]DE19749182 (TAS TECH ANLAGEN SERVICE GMBH [DE]) [X] 1,2,4 * column 1, line 44 - line 65 * * column 2, line 20 - line 31 *;
		[X]DE29815797U (SIEMENS AG [DE]) [X] 1,2,4 * page 1, line 5 - line 10 * * page 1, line 26 - page 2, line 2 *;
		[X]US4977451 (BESNARD SERGE [FR]) [X] 1,2,4 * column 1, line 7 - line 18 * * column 1, line 56 - column 2, line 40 *;
		[X]US5822542 (SMITH GORDON W [US], et al) [X] 1,2,4 * column 40, line 44 - line 64 *;
		[A]US5367332 (KERNS CHARLES [US], et al) [A] 1,2,4 * column 1, line 50 - line 62 *;
		[X]US5329314 (CORREA CARLOS [DE], et al) [X] 3 * column 1, line 5 - line 25 * * column 2, line 44 - line 64 * * column 3, line 30 - line 35 * * column 4, line 17 - line 24 * * figures 1,2 *;
		[X]EP0625860 (GOLD STAR CO [KR]) [X] 3 * column 5, line 15 - line 25 * * column 17, line 55 - column 18, line 23 * * column 18, line 32 - line 38 *;
		[A] - THOMAS A D H ET AL, "Real-time Industrial Visual Inspection: A Review", REAL-TIME IMAGING, ACADEMIC PRESS LIMITED, GB, (199506), vol. 1, no. 2, ISSN 1077-2014, pages 139 - 158, XP004419709 [A] 1,2,4 * page 140, column L, paragraph 2 * DOI: http://dx.doi.org/10.1006/rtim.1995.1014
		[A] - MYEONG-HWAN LEE ET AL, "A NEW ALGORITHM FOR INTERLACED TO PROGRESSIVE SCAN CONVERSION BASEDON DIRECTIONAL CORRELATIONS AND ITS IC DESIGN", IEEE TRANSACTIONS ON CONSUMER ELECTRONICS, IEEE INC. NEW YORK, US, (19940501), vol. 40, no. 2, ISSN 0098-3063, pages 119 - 129, XP000459689 [A] 3 * page 119, "Introduction", paragraph 1-2 * DOI: http://dx.doi.org/10.1109/30.286406

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