EP1134699 - Image recording apparatus for flaw detection [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 01.02.2008 Database last updated on 24.08.2024 | Most recent event Tooltip | 01.02.2008 | Application deemed to be withdrawn | published on 05.03.2008 [2008/10] | Applicant(s) | For all designated states OMRON CORPORATION 801, Minamifudodo-cho, Horikawahigashiiru, Shiokoji-dori, Shimogyo-ku Kyoto-shi, Kyoto 600-8530 / JP | [N/P] |
Former [2001/38] | For all designated states Omron Corporation 801, Minamifudoudou-cho, Horikawahigashiiru, Shiokouji-doori, Shimogyo-ku Kyoto-shi, Kyoto-fu, 600-8530 / JP | Inventor(s) | 01 /
Iida, Toyoo, c/o Omron Corporation 801, Minamifudodo-cho, Horikawahigashiiru Shiokoji, Shimogyo-ku, Kyoto 600-8530 / JP | 02 /
Ishizawa, Tomoki, c/o Omron Corporation 801, Minamifudodo-cho, Horikawahigashiiru Shiokoji, Shimogyo-ku, Kyoto 600-8530 / JP | 03 /
Sato, Masanori, c/o Omron Corporation 801, Minamifudodo-cho, Horikawahigashiiru Shiokoji, Shimogyo-ku, Kyoto 600-8530 / JP | 04 /
Masaki, Toshimichi, c/o Omron Corporation 801, Minamifudodo-cho, Horikawahigashiiru Shiokoji, Shimogyo-ku, Kyoto 600-8530 / JP | [2001/38] | Representative(s) | Kilian, Helmut Wilhelms, Kilian & Partner Patentanwälte Eduard-Schmid-Strasse 2 81541 München / DE | [N/P] |
Former [2001/38] | Kilian, Helmut, Dr. Wilhelms, Kilian & Partner Patentanwälte Eduard-Schmid-Strasse 2 81541 München / DE | Application number, filing date | 01106149.6 | 13.03.2001 | [2001/38] | Priority number, date | JP20000076103 | 17.03.2000 Original published format: JP 2000076103 | [2001/38] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1134699 | Date: | 19.09.2001 | Language: | EN | [2001/38] | Type: | A3 Search report | No.: | EP1134699 | Date: | 14.01.2004 | [2004/03] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 27.11.2003 | Classification | IPC: | G06T7/00 | [2001/38] | CPC: |
G06T7/0004 (EP,US);
G06T7/0002 (EP,US);
G06T2200/24 (EP,US);
G06T2207/30164 (EP,US)
| Designated contracting states | DE, FR, GB, IT [2004/41] |
Former [2001/38] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR | Title | German: | Bildaufnahmegerät zur Fehlerdetektion | [2001/38] | English: | Image recording apparatus for flaw detection | [2001/38] | French: | Appareil d'enregistrement d'images pour la détection de défauts | [2001/38] | Examination procedure | 28.06.2004 | Examination requested [2004/35] | 17.09.2004 | Despatch of a communication from the examining division (Time limit: M06) | 24.03.2005 | Reply to a communication from the examining division | 27.06.2006 | Despatch of a communication from the examining division (Time limit: M06) | 08.01.2007 | Reply to a communication from the examining division | 20.04.2007 | Despatch of a communication from the examining division (Time limit: M04) | 31.08.2007 | Application deemed to be withdrawn, date of legal effect [2008/10] | 15.10.2007 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2008/10] | Fees paid | Renewal fee | 31.03.2003 | Renewal fee patent year 03 | 31.03.2004 | Renewal fee patent year 04 | 31.03.2005 | Renewal fee patent year 05 | 31.03.2006 | Renewal fee patent year 06 | 30.03.2007 | Renewal fee patent year 07 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]DE19749182 (TAS TECH ANLAGEN SERVICE GMBH [DE]) [X] 1,2,4 * column 1, line 44 - line 65 * * column 2, line 20 - line 31 *; | [X]DE29815797U (SIEMENS AG [DE]) [X] 1,2,4 * page 1, line 5 - line 10 * * page 1, line 26 - page 2, line 2 *; | [X]US4977451 (BESNARD SERGE [FR]) [X] 1,2,4 * column 1, line 7 - line 18 * * column 1, line 56 - column 2, line 40 *; | [X]US5822542 (SMITH GORDON W [US], et al) [X] 1,2,4 * column 40, line 44 - line 64 *; | [A]US5367332 (KERNS CHARLES [US], et al) [A] 1,2,4 * column 1, line 50 - line 62 *; | [X]US5329314 (CORREA CARLOS [DE], et al) [X] 3 * column 1, line 5 - line 25 * * column 2, line 44 - line 64 * * column 3, line 30 - line 35 * * column 4, line 17 - line 24 * * figures 1,2 *; | [X]EP0625860 (GOLD STAR CO [KR]) [X] 3 * column 5, line 15 - line 25 * * column 17, line 55 - column 18, line 23 * * column 18, line 32 - line 38 *; | [A] - THOMAS A D H ET AL, "Real-time Industrial Visual Inspection: A Review", REAL-TIME IMAGING, ACADEMIC PRESS LIMITED, GB, (199506), vol. 1, no. 2, ISSN 1077-2014, pages 139 - 158, XP004419709 [A] 1,2,4 * page 140, column L, paragraph 2 * DOI: http://dx.doi.org/10.1006/rtim.1995.1014 | [A] - MYEONG-HWAN LEE ET AL, "A NEW ALGORITHM FOR INTERLACED TO PROGRESSIVE SCAN CONVERSION BASEDON DIRECTIONAL CORRELATIONS AND ITS IC DESIGN", IEEE TRANSACTIONS ON CONSUMER ELECTRONICS, IEEE INC. NEW YORK, US, (19940501), vol. 40, no. 2, ISSN 0098-3063, pages 119 - 129, XP000459689 [A] 3 * page 119, "Introduction", paragraph 1-2 * DOI: http://dx.doi.org/10.1109/30.286406 |