EP1152211 - Optical measuring device in particular for measuring thickness of coating [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 22.08.2008 Database last updated on 09.09.2024 | Most recent event Tooltip | 22.08.2008 | Application deemed to be withdrawn | published on 24.09.2008 [2008/39] | Applicant(s) | For all designated states Vistec Semiconductor Systems Jena GmbH Göschwitzer Str. 25 07745 Jena / DE | [2008/12] |
Former [2001/45] | For all designated states Leica Microsystems Jena GmbH Göschwitzer Str. 25 07745 Jena / DE | Inventor(s) | 01 /
Engel, Horst, Dr. August-Messer-Strasse 4 35394 Giessen / DE | 02 /
Mikkelsen, Hakon, Dr. Karl-Freyberg-Strasse 6 99441 Magdala / DE | 03 /
Danner, Lambert Weingartenstrasse 37 35584 Wetzlar-Naunheim / DE | 04 /
Slodowski, Matthias Ricarda-Huch-Weg 24 07743 Jena / DE | 05 /
Backhaus, Kuno In der Salschge 1 07751 Zöllnitz / DE | 06 /
Wienecke, Joachim, Dr. Liselotte-Herrmann-Strasse 14B 07747 Jena / DE | [2001/45] | Representative(s) | Reichert, Werner Franz, et al Reichert & Kollegen Bismarckplatz 8 93047 Regensburg / DE | [N/P] |
Former [2006/38] | Reichert, Werner Franz, et al Reichert Patents & Trademarks Kumpfmühlerstrasse 3 93047 Regensburg / DE | ||
Former [2001/45] | Reichert, Werner F., Dr. Leica Microsystems AG, Corporate Patents + Trademarks Department, Ernst-Leitz-Strasse 17-37 35578 Wetzlar / DE | Application number, filing date | 01109784.7 | 20.04.2001 | [2001/45] | Priority number, date | DE2000121379 | 02.05.2000 Original published format: DE 10021379 | [2001/45] | Filing language | DE | Procedural language | DE | Publication | Type: | A2 Application without search report | No.: | EP1152211 | Date: | 07.11.2001 | Language: | DE | [2001/45] | Type: | A3 Search report | No.: | EP1152211 | Date: | 29.05.2002 | [2002/22] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 15.04.2002 | Classification | IPC: | G01B11/06 | [2001/45] | CPC: |
G01B11/0625 (EP,US)
| Designated contracting states | DE, FR, GB [2003/08] |
Former [2001/45] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR | Title | German: | Optische Messanordnung insbesondere zur Schichtdickenmessung | [2001/45] | English: | Optical measuring device in particular for measuring thickness of coating | [2001/45] | French: | Dispositif optique de mesure particulièrement pour mesurer l'épaisseur de couches | [2001/45] | Examination procedure | 02.11.2002 | Examination requested [2003/01] | 19.11.2007 | Despatch of a communication from the examining division (Time limit: M04) | 01.04.2008 | Application deemed to be withdrawn, date of legal effect [2008/39] | 09.05.2008 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2008/39] | Fees paid | Renewal fee | 27.03.2003 | Renewal fee patent year 03 | 31.03.2004 | Renewal fee patent year 04 | 11.04.2005 | Renewal fee patent year 05 | 13.04.2006 | Renewal fee patent year 06 | 11.04.2007 | Renewal fee patent year 07 | Penalty fee | Additional fee for renewal fee | 30.04.2008 | 08   M06   Not yet paid |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [XAY]DE19522188 (WISSENSCHAFTLICH TECH OPTIKZEN [DE]) [X] 1,2 * page 4, line 65 - page 5, line 29 * * figure 1 * [A] 4-9 [Y] 3,10; | [Y]EP0922980 (AT & T CORP [US]) [Y] 3 * claim 1 * * figures 8-13 *; | [Y]US5212588 (VISWANATHAN VRIDDHACHALAM K [US], et al) [Y] 10 * column 10, line 34 - column 11, line 13 * * figures 1,2 *; | [A]JPH09152375 ; | [A]US6025916 (QUICK ANTHONY K [US], et al) [A] 1-10 * the whole document * | [A] - PATENT ABSTRACTS OF JAPAN, (19971031), vol. 1997, no. 10, & JP09152375 A 19970610 (SHIMADZU CORP) [A] 10 * abstract * * figures 1-4 * |