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Extract from the Register of European Patents

EP About this file: EP1152211

EP1152211 - Optical measuring device in particular for measuring thickness of coating [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  22.08.2008
Database last updated on 09.09.2024
Most recent event   Tooltip22.08.2008Application deemed to be withdrawnpublished on 24.09.2008  [2008/39]
Applicant(s)For all designated states
Vistec Semiconductor Systems Jena GmbH
Göschwitzer Str. 25
07745 Jena / DE
[2008/12]
Former [2001/45]For all designated states
Leica Microsystems Jena GmbH
Göschwitzer Str. 25
07745 Jena / DE
Inventor(s)01 / Engel, Horst, Dr.
August-Messer-Strasse 4
35394 Giessen / DE
02 / Mikkelsen, Hakon, Dr.
Karl-Freyberg-Strasse 6
99441 Magdala / DE
03 / Danner, Lambert
Weingartenstrasse 37
35584 Wetzlar-Naunheim / DE
04 / Slodowski, Matthias
Ricarda-Huch-Weg 24
07743 Jena / DE
05 / Backhaus, Kuno
In der Salschge 1
07751 Zöllnitz / DE
06 / Wienecke, Joachim, Dr.
Liselotte-Herrmann-Strasse 14B
07747 Jena / DE
 [2001/45]
Representative(s)Reichert, Werner Franz, et al
Reichert & Kollegen
Bismarckplatz 8
93047 Regensburg / DE
[N/P]
Former [2006/38]Reichert, Werner Franz, et al
Reichert Patents & Trademarks Kumpfmühlerstrasse 3
93047 Regensburg / DE
Former [2001/45]Reichert, Werner F., Dr.
Leica Microsystems AG, Corporate Patents + Trademarks Department, Ernst-Leitz-Strasse 17-37
35578 Wetzlar / DE
Application number, filing date01109784.720.04.2001
[2001/45]
Priority number, dateDE200012137902.05.2000         Original published format: DE 10021379
[2001/45]
Filing languageDE
Procedural languageDE
PublicationType: A2 Application without search report 
No.:EP1152211
Date:07.11.2001
Language:DE
[2001/45]
Type: A3 Search report 
No.:EP1152211
Date:29.05.2002
[2002/22]
Search report(s)(Supplementary) European search report - dispatched on:EP15.04.2002
ClassificationIPC:G01B11/06
[2001/45]
CPC:
G01B11/0625 (EP,US)
Designated contracting statesDE,   FR,   GB [2003/08]
Former [2001/45]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Optische Messanordnung insbesondere zur Schichtdickenmessung[2001/45]
English:Optical measuring device in particular for measuring thickness of coating[2001/45]
French:Dispositif optique de mesure particulièrement pour mesurer l'épaisseur de couches[2001/45]
Examination procedure02.11.2002Examination requested  [2003/01]
19.11.2007Despatch of a communication from the examining division (Time limit: M04)
01.04.2008Application deemed to be withdrawn, date of legal effect  [2008/39]
09.05.2008Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2008/39]
Fees paidRenewal fee
27.03.2003Renewal fee patent year 03
31.03.2004Renewal fee patent year 04
11.04.2005Renewal fee patent year 05
13.04.2006Renewal fee patent year 06
11.04.2007Renewal fee patent year 07
Penalty fee
Additional fee for renewal fee
30.04.200808   M06   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[XAY]DE19522188  (WISSENSCHAFTLICH TECH OPTIKZEN [DE]) [X] 1,2 * page 4, line 65 - page 5, line 29 * * figure 1 * [A] 4-9 [Y] 3,10;
 [Y]EP0922980  (AT & T CORP [US]) [Y] 3 * claim 1 * * figures 8-13 *;
 [Y]US5212588  (VISWANATHAN VRIDDHACHALAM K [US], et al) [Y] 10 * column 10, line 34 - column 11, line 13 * * figures 1,2 *;
 [A]JPH09152375  ;
 [A]US6025916  (QUICK ANTHONY K [US], et al) [A] 1-10 * the whole document *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19971031), vol. 1997, no. 10, & JP09152375 A 19970610 (SHIMADZU CORP) [A] 10 * abstract * * figures 1-4 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.