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EP1162566

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EP About this file: EP1162566

EP1162566 - Methods and apparatuses for recognising or checking patterns [Right-click to bookmark this link]
Status	The application is deemed to be withdrawn Status updated on 13.01.2006 Database last updated on 03.10.2024
Most recent event Tooltip	18.12.2009	Change - representative	published on 20.01.2010 [2010/03]
Applicant(s)	For all designated states MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 1006, Oaza Kadoma Kadoma-shi Osaka 571-8501 / JP
	[N/P]
Former [2001/50]	For all designated states MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 1006, Oaza-Kadoma Kadoma-shi, Osaka 571-8501 / JP
Inventor(s)	01 / Nagao, Kenji 359-21, Oba-cho, Aoba-ku Yokohama-shi, Kanagawa 225-0023 / JP
	[2001/50]
Representative(s)	Balsters, Robert, et al Novagraaf International S.A. Chemin de l'Echo 3 1213 Onex / CH
	[N/P]
Former [2010/03]	Balsters, Robert, et al Novagraaf International S.A. Avenue du Pailly 25 1220 Les Avanchets-Genève / CH
Former [2001/50]	Balsters, Robert, et al Novapat International SA, 9, rue du Valais 1202 Genève / CH
Application number, filing date	01112830.3	30.05.2001
	[2001/50]
Priority number, date	JP20000168560	06.06.2000 Original published format: JP 2000168560
	[2001/50]
Filing language	EN
Procedural language	EN
Publication	Type:	A2 Application without search report
	No.:	EP1162566
	Date:	12.12.2001
	Language:	EN
	[2001/50]
	Type:	A3 Search report
	No.:	EP1162566
	Date:	28.07.2004
	[2004/31]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	16.06.2004
Classification	IPC:	G06K9/62, G06K9/68, G06K9/00	[2004/31]
	CPC:	G06V40/168 (EP,US)
	Former IPC [2001/50]	G06K9/62
Designated contracting states	DE, FR, GB [2005/16]
Former [2001/50]	AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR
Title	German:	Verfahren und Geräte zur Erkennung oder Prüfen von Mustern	[2004/52]
	English:	Methods and apparatuses for recognising or checking patterns	[2001/50]
	French:	Procédés et appareils de reconnaissance ou d'inspection des modèles	[2001/50]
	Former [2001/50]	Verfaren und Geräte zur Erkennung oder Prüfen von Mustern
Examination procedure	11.08.2004	Examination requested [2004/42]
	31.03.2005	Despatch of a communication from the examining division (Time limit: M04)
	11.08.2005	Application deemed to be withdrawn, date of legal effect [2006/09]
	19.09.2005	Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2006/09]
Fees paid	Renewal fee
	26.05.2003	Renewal fee patent year 03
	25.05.2004	Renewal fee patent year 04
	31.05.2005	Renewal fee patent year 05
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[DA]EP0944018 (MATSUSHITA ELECTRIC IND CO LTD [JP]) [DA] 1,2,6,7,11,12,15,16,19,20 * the whole document *;
		[A] - BELHUMEUR P N ET AL, "EIGENFACES VS. FISHERFACES: RECOGNITION USING CLASS SPECIFIC LINEAR PROJECTION", IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, IEEE INC. NEW YORK, US, (19970701), vol. 19, no. 7, ISSN 0162-8828, pages 711 - 720, XP000698170 [A] 1,2,6,7,11,12,15,16,19,20 * paragraph [02.4] * DOI: http://dx.doi.org/10.1109/34.598228
		[A] - THEODORIS, SERGIOS; KOUTROUMBAS, KONSTANTINOS, Pattern Recognition, ISBN 0-12-686140-4, ACADEMIC PRESS, SAN DIEGO, USA, (1999), XP002280745 [A] 1,2,6,7,11,12,15,16,19,20 * page 155, paragraph 5.3.3 - page 167, paragraph 5.7 *
		[A] - WATANABE H ET AL, "DISCRIMINATIVE METRIC DESIGN FOR ROBUST PATTERN RECOGNITION", IEEE TRANSACTIONS ON SIGNAL PROCESSING, IEEE, INC. NEW YORK, US, (19971101), vol. 45, no. 11, ISSN 1053-587X, pages 2655 - 2662, XP000754250 [A] 1,2,6,7,11,12,15,16,19,20 * page 2655, column 2, paragraph LAST - page 2656, paragraph FIRST * * page 2657, column 1, line 34, paragraph 2 * [A] [A] DOI: http://dx.doi.org/10.1109/78.650091

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