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Extract from the Register of European Patents

EP About this file: EP1186928

EP1186928 - Optical distance measurement device with parallel processing [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  24.11.2006
Database last updated on 13.07.2024
Most recent event   Tooltip12.12.2008Lapse of the patent in a contracting state
New state(s): CY		published on 14.01.2009  [2009/03]
Applicant(s)For all designated states
Heidelberger Druckmaschinen Aktiengesellschaft
Kurfürsten-Anlage 52-60
69115 Heidelberg / DE
[N/P]
Former [2006/03]For all designated states
Heidelberger Druckmaschinen Aktiengesellschaft
Kurfürsten-Anlage 52-60
69115 Heidelberg / DE
Former [2002/11]For all designated states
Heidelberger Druckmaschinen Aktiengesellschaft
Kurfürsten-Anlage 52-60
69115 Heidelberg / DE
Inventor(s)01 / Beier, Bernard, Dr.
Lustgartenstrasse 21
68526 Ladenburg / DE
02 / Vosseler, Bernd
Handschuhsheimer Landstrasse 36
69120 Heidelberg / DE
 [2002/11]
Representative(s)Fey, Hans-Jürgen, et al
Heidelberger Druckmaschinen AG
Patentabteilung
Kurfürsten-Anlage 52-60
69115 Heidelberg / DE
[N/P]
Former [2004/24]Fey, Hans-Jürgen, et al
Heidelberger Druckmaschinen AG Patentabteilung Kurfürsten-Anlage 52-60
69115 Heidelberg / DE
Former [2002/11]Duschl, Edgar Johannes, Dr., et al
Heidelberger Druckmaschinen AG, Kurfürsten-Anlage 52-60
69115 Heidelberg / DE
Application number, filing date01117770.601.08.2001
[2002/11]
Priority number, dateDE200014408207.09.2000         Original published format: DE 10044082
DE200111124509.03.2001         Original published format: DE 10111245
[2002/11]
Filing languageDE
Procedural languageDE
PublicationType: A2 Application without search report 
No.:EP1186928
Date:13.03.2002
Language:DE
[2002/11]
Type: A3 Search report 
No.:EP1186928
Date:28.04.2004
[2004/18]
Type: B1 Patent specification 
No.:EP1186928
Date:18.01.2006
Language:DE
[2006/03]
Search report(s)(Supplementary) European search report - dispatched on:EP16.03.2004
ClassificationIPC:G02B7/28, G01B11/25
[2004/17]
CPC:
G02B7/28 (EP,US)
Former IPC [2002/11]G02B7/28
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   TR [2002/11]
TitleGerman:Parallelverarbeitender optischer Entfernungsmesser[2002/11]
English:Optical distance measurement device with parallel processing[2002/11]
French:Appareil optique de mesure de distances à traitement parallèle[2002/11]
Examination procedure22.03.2004Examination requested  [2004/21]
07.06.2004Despatch of a communication from the examining division (Time limit: M04)
08.10.2004Reply to a communication from the examining division
16.11.2004Despatch of a communication from the examining division (Time limit: M04)
03.02.2005Reply to a communication from the examining division
14.03.2005Despatch of a communication from the examining division (Time limit: M04)
21.06.2005Reply to a communication from the examining division
01.08.2005Communication of intention to grant the patent
27.10.2005Fee for grant paid
27.10.2005Fee for publishing/printing paid
Opposition(s)19.10.2006No opposition filed within time limit [2006/52]
Fees paidRenewal fee
16.08.2003Renewal fee patent year 03
23.08.2004Renewal fee patent year 04
11.08.2005Renewal fee patent year 05
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipCY18.01.2006
FI18.01.2006
IE18.01.2006
NL18.01.2006
TR18.01.2006
DK18.04.2006
SE18.04.2006
GR19.04.2006
ES29.04.2006
PT19.06.2006
AT01.08.2006
LU01.08.2006
BE31.08.2006
MC31.08.2006
[2009/03]
Former [2008/37]FI18.01.2006
IE18.01.2006
NL18.01.2006
TR18.01.2006
DK18.04.2006
SE18.04.2006
GR19.04.2006
ES29.04.2006
PT19.06.2006
AT01.08.2006
LU01.08.2006
BE31.08.2006
MC31.08.2006
Former [2008/19]FI18.01.2006
IE18.01.2006
NL18.01.2006
DK18.04.2006
SE18.04.2006
GR19.04.2006
ES29.04.2006
PT19.06.2006
AT01.08.2006
BE31.08.2006
MC31.08.2006
Former [2007/50]FI18.01.2006
IE18.01.2006
NL18.01.2006
DK18.04.2006
SE18.04.2006
ES29.04.2006
PT19.06.2006
AT01.08.2006
BE31.08.2006
MC31.08.2006
Former [2007/45]FI18.01.2006
IE18.01.2006
NL18.01.2006
DK18.04.2006
SE18.04.2006
ES29.04.2006
PT19.06.2006
BE31.08.2006
MC31.08.2006
Former [2007/36]FI18.01.2006
IE18.01.2006
IT18.01.2006
NL18.01.2006
DK18.04.2006
SE18.04.2006
ES29.04.2006
PT19.06.2006
BE31.08.2006
MC31.08.2006
Former [2007/31]FI18.01.2006
IE18.01.2006
NL18.01.2006
DK18.04.2006
SE18.04.2006
ES29.04.2006
PT19.06.2006
BE31.08.2006
MC31.08.2006
Former [2007/19]FI18.01.2006
IE18.01.2006
NL18.01.2006
DK18.04.2006
SE18.04.2006
ES29.04.2006
PT19.06.2006
MC31.08.2006
Former [2006/51]FI18.01.2006
IE18.01.2006
NL18.01.2006
DK18.04.2006
SE18.04.2006
ES29.04.2006
PT19.06.2006
Former [2006/48]FI18.01.2006
IE18.01.2006
NL18.01.2006
SE18.04.2006
ES29.04.2006
PT19.06.2006
Former [2006/45]FI18.01.2006
NL18.01.2006
SE18.04.2006
ES29.04.2006
Former [2006/36]FI18.01.2006
ES29.04.2006
Former [2006/34]ES29.04.2006
Documents cited:Search[X]US4705401  (ADDLEMAN DAVID A [US], et al) [X] 1-9,21 * figures 1,2 ** column A *;
 [X]DE4013283  (HANS LANGER) [X] 1,3-11,13,21 * figure - * * abstract *;
 [X]US5675407  (GENG ZHENG JASON [US]) [X] 1-9,16,21 * figure 1 * * abstract *;
 [X]US6046812  (BAIK SUNG-HOON [KR], et al) [X] 1-9,12,16,21 * figure - * * column 3, line 22 - column 6, line 8 *;
 [X]  - T. PFEIFER, P. SOWA, "Untersuchung eines hochgenauen laseroptischen 3D-Konturmessverfahren für die Vermessung von Freiformflächen", 3D-OBJEKTVERMESSUNG AUF KLEINERE ENTFERNUNGEN, VDI Technologiezentrum Physikalische Technologien, Düsseldorf, (199505), pages 1 - 14, XP002271999 [X] 1,14,15,21,22 * figures 1-3 * * page 1 - page 9 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.