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Extract from the Register of European Patents

EP About this file: EP1186856

EP1186856 - Device for measuring profiles [Right-click to bookmark this link]
Former [2002/11]Device for profiles measurement
[2008/16]
StatusNo opposition filed within time limit
Status updated on  07.08.2009
Database last updated on 03.10.2024
Most recent event   Tooltip30.09.2011Lapse of the patent in a contracting state
New state(s): CY, TR		published on 02.11.2011  [2011/44]
Applicant(s)For all designated states
Pieper, Siegfried
Pfeddersheimer Strasse 95
67549 Worms / DE
For all designated states
Rottner, Franz
Tuchschererstrasse 7
67551 Worms / DE
[2007/21]
Former [2002/11]For all designated states
INNOtec Europe GmbH
Tuchschererstrasse 7-9
67551 Worms / DE
Inventor(s)01 / see applicant
...
 [2007/21]
Former [2002/11]01 / Pieper, Siegfried
Tuchschererstrasse 7
67551 Worms / DE
02 / Rottner, Franz
Tuchschererstrasse 7
67551 Worms / DE
Representative(s)Thews, Gustav, et al
STT Sozietät Thews & Thews Patentanwälte Augustaanlage 32
68165 Mannheim / DE
[N/P]
Former [2008/10]Thews, Gustav, et al
Sartorius, Thews & Thews Patentanwälte Augustaanlage 32
68165 Mannheim / DE
Former [2006/02]Thews, Karl, et al
Patentanwaltskanzlei Sartorius - Thews & Thews Helmholtzstrasse 35
68723 Schwetzingen / DE
Former [2002/11]Sartorius, Peter, Dipl.-Ing.
Patentanwaltsbüro Allgeier & Sartorius Elisabethenstrasse 24
68535 Neckarhausen / DE
Application number, filing date01118570.902.08.2001
[2002/11]
Priority number, dateDE200014415706.09.2000         Original published format: DE 10044157
[2002/11]
Filing languageDE
Procedural languageDE
PublicationType: A2 Application without search report 
No.:EP1186856
Date:13.03.2002
Language:DE
[2002/11]
Type: A3 Search report 
No.:EP1186856
Date:02.04.2003
[2003/14]
Type: B1 Patent specification 
No.:EP1186856
Date:01.10.2008
Language:DE
[2008/40]
Search report(s)(Supplementary) European search report - dispatched on:EP11.02.2003
ClassificationIPC:G01B11/24, G01B15/04, G01B17/06, B61K9/02
[2002/50]
CPC:
B61K9/02 (EP); G01B11/24 (EP); G01B21/20 (EP)
Former IPC [2002/11]G01B11/24
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   TR [2002/11]
TitleGerman:Vorrichtung zum Messen von Profilen[2002/11]
English:Device for measuring profiles[2008/16]
French:Dispositif de mesure des profils[2002/11]
Former [2002/11]Device for profiles measurement
Examination procedure26.11.2002Amendment by applicant (claims and/or description)
25.09.2003Examination requested  [2003/47]
30.05.2007Despatch of a communication from the examining division (Time limit: M04)
19.07.2007Reply to a communication from the examining division
11.09.2007Despatch of a communication from the examining division (Time limit: M04)
21.01.2008Reply to a communication from the examining division
15.04.2008Communication of intention to grant the patent
13.08.2008Fee for grant paid
13.08.2008Fee for publishing/printing paid
Opposition(s)02.07.2009No opposition filed within time limit [2009/37]
Fees paidRenewal fee
28.07.2003Renewal fee patent year 03
24.08.2004Renewal fee patent year 04
24.08.2005Renewal fee patent year 05
17.08.2006Renewal fee patent year 06
08.08.2007Renewal fee patent year 07
14.08.2008Renewal fee patent year 08
Opt-out from the exclusive  Tooltip
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Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipCY01.10.2008
DK01.10.2008
FI01.10.2008
IE01.10.2008
IT01.10.2008
NL01.10.2008
TR01.10.2008
SE01.01.2009
GR02.01.2009
ES12.01.2009
PT02.03.2009
[2011/43]
Former [2010/47]DK01.10.2008
FI01.10.2008
IE01.10.2008
IT01.10.2008
NL01.10.2008
SE01.01.2009
GR02.01.2009
ES12.01.2009
PT02.03.2009
Former [2009/39]DK01.10.2008
FI01.10.2008
IE01.10.2008
IT01.10.2008
NL01.10.2008
SE01.01.2009
ES12.01.2009
PT02.03.2009
Former [2009/38]DK01.10.2008
FI01.10.2008
IE01.10.2008
NL01.10.2008
SE01.01.2009
ES12.01.2009
PT02.03.2009
Former [2009/34]DK01.10.2008
FI01.10.2008
IE01.10.2008
NL01.10.2008
ES12.01.2009
PT02.03.2009
Former [2009/25]FI01.10.2008
NL01.10.2008
ES12.01.2009
PT02.03.2009
Former [2009/20]ES12.01.2009
Documents cited:Search[A]DE19646098  (LAUCK LOTHAR DR [DE], et al) [A] 1 * column 2; figures 1,2 *;
 [A]US5903355  (SCHWARZ FRANZ [DE]) [A] 1* column 4 - column 6; figures 1,2 *
ExaminationUS4699478
by applicantDE3005493
 DE3624782
 DE4015086
 US5903355
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.