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Extract from the Register of European Patents

EP About this file: EP1206128

EP1206128 - Method for equalising technologically caused inhomogeneities in single image pickup detector elements [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  06.09.2013
Database last updated on 17.07.2024
Most recent event   Tooltip06.09.2013No opposition filed within time limitpublished on 09.10.2013  [2013/41]
Applicant(s)For all designated states
Cassidian Optronics GmbH
Carl-Zeiss-Strasse 22
73447 Oberkochen / DE
[2012/48]
Former [2006/23]For all designated states
Carl Zeiss Optronics GmbH
Carl-Zeiss-Strasse 22
73447 Oberkochen / DE
Former [2002/20]For all designated states
Zeiss Optronik GmbH
Carl-Zeiss-Strasse 22
73447 Oberkochen / DE
Inventor(s)01 / Wiedmann, Wolfgang
Rechbergweg 4
73457 Essingen / DE
 [2002/20]
Representative(s)FDST Patentanwälte
Nordostpark 16
90411 Nürnberg / DE
[2012/48]
Former [2012/44]Gnatzig, Klaus
Carl Zeiss Patentabteilung
73446 Oberkochen / DE
Former [2002/20]Gnatzig, Klaus
Carl Zeiss Patentabteilung
73446 Oberkochen / DE
Application number, filing date01122502.620.09.2001
[2002/20]
Priority number, dateDE200015586210.11.2000         Original published format: DE 10055862
[2002/20]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP1206128
Date:15.05.2002
Language:DE
[2002/20]
Type: B1 Patent specification 
No.:EP1206128
Date:31.10.2012
Language:DE
[2012/44]
Type: B8 Corrected title page of specification 
No.:EP1206128
Date:19.12.2012
[2012/51]
Search report(s)(Supplementary) European search report - dispatched on:EP19.02.2002
ClassificationIPC:H04N5/365, H04N5/33
[2012/22]
CPC:
H04N25/671 (EP); G06T5/94 (EP); H04N25/672 (EP);
H04N25/76 (EP); G06T2207/10048 (EP)
Former IPC [2002/20]H04N5/217, H04N5/33
Designated contracting statesDE,   FR,   GB [2003/06]
Former [2002/20]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Verfahren zum Ausgleich von technologisch bedingten Inhomogenitäten in einzelnen Bildaufnahmedetektorelementen[2002/20]
English:Method for equalising technologically caused inhomogeneities in single image pickup detector elements[2002/20]
French:Procédé d'égalisation des inhomogénéitiés technologiques dans des éléments individuels d'un détecteur de prise de vues[2002/20]
Examination procedure21.09.2002Examination requested  [2002/47]
13.04.2007Despatch of a communication from the examining division (Time limit: M04)
04.08.2007Reply to a communication from the examining division
26.04.2012Cancellation of oral proceeding that was planned for 20.06.2012
14.05.2012Communication of intention to grant the patent
20.06.2012Date of oral proceedings (cancelled)
16.08.2012Fee for grant paid
16.08.2012Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  13.04.2007
Opposition(s)01.08.2013No opposition filed within time limit [2013/41]
Fees paidRenewal fee
22.08.2003Renewal fee patent year 03
07.09.2004Renewal fee patent year 04
15.09.2005Renewal fee patent year 05
14.09.2006Renewal fee patent year 06
13.09.2007Renewal fee patent year 07
11.09.2008Renewal fee patent year 08
23.09.2009Renewal fee patent year 09
27.09.2010Renewal fee patent year 10
22.09.2011Renewal fee patent year 11
20.09.2012Renewal fee patent year 12
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Documents cited:Search[A]US4975864  (SENDALL ROBERT [US], et al);
 [A]US5631466  (BOTTI DOMINIC J [US], et al);
 [AD]EP0873011  (AEG INFRAROT MODULE GMBH [DE])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.