EP1219925 - Surveying apparatus [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 20.01.2012 Database last updated on 12.07.2024 | Most recent event Tooltip | 20.01.2012 | No opposition filed within time limit | published on 22.02.2012 [2012/08] | Applicant(s) | For all designated states Kabushiki Kaisha TOPCON 75-1, Hasunuma-cho Itabashi-ku Tokyo 174 / JP | [N/P] |
Former [2011/11] | For all designated states Kabushiki Kaisha TOPCON 75-1, Hasunuma-cho Itabashi-ku Tokyo 174 / JP | ||
Former [2002/27] | For all designated states KABUSHIKI KAISHA TOPCON 75-1, Hasunuma-cho Itabashi-ku Tokyo 174 / JP | Inventor(s) | 01 /
Ohtomo, Fumio, Kabushiki Kaisha Topcon 75-1, Hasunuma-Cho, Itabashi-Ku Tokyo, 174 / JP | 02 /
Horiguchi, Kiwami, Kabushiki Kaisha Topcon 75-1, Hasunuma-Cho, Itabashi-Ku Tokyo, 174 / JP | 03 /
Ohtani, Hitoshi, Kabushiki Kaisha Topcon 75-1, Hasunuma-Cho, Itabashi-Ku Tokyo, 174 / JP | [2011/11] |
Former [2002/27] | 01 /
Ohtomo, Fumio, Kabushiki Kaisha Topcon 75-1, Hasunuma-cho, Itabashi-ku Tokyo, 174 / JP | ||
02 /
Horiguchi, Kiwami, Kabushiki Kaisha Topcon 75-1, Hasunuma-cho, Itabashi-ku Tokyo, 174 / JP | |||
03 /
Ohtani, Hitoshi, i, Kabushiki Kaisha Topcon 75-1, Hasunuma-cho, Itabashi-ku Tokyo, 174 / JP | Representative(s) | Lang, Johannes, et al Bardehle Pagenberg Partnerschaft mbB Patentanwälte, Rechtsanwälte Prinzregentenplatz 7 81675 München / DE | [N/P] |
Former [2011/13] | Lang, Johannes, et al Bardehle Pagenberg Galileiplatz 1 81679 München / DE | ||
Former [2002/27] | Altenburg, Udo, Dipl.-Phys. Patent- und Rechtsanwälte Bardehle - Pagenberg - Dost - Altenburg - Geissler - Isenbruck, Galileiplatz 1 81679 München / DE | Application number, filing date | 01130623.0 | 27.12.2001 | [2002/27] | Priority number, date | JP20000403306 | 28.12.2000 Original published format: JP 2000403306 | [2002/27] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1219925 | Date: | 03.07.2002 | Language: | EN | [2002/27] | Type: | A3 Search report | No.: | EP1219925 | Date: | 02.06.2004 | [2004/23] | Type: | B1 Patent specification | No.: | EP1219925 | Date: | 16.03.2011 | Language: | EN | [2011/11] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 20.04.2004 | Classification | IPC: | G01C1/04, G01C15/00 | [2004/23] | CPC: |
G01C1/04 (EP,US)
|
Former IPC [2002/27] | G01C1/04 | Designated contracting states | CH, DE, LI, SE [2005/08] |
Former [2002/27] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR | Title | German: | Vermessungsinstrument | [2002/27] | English: | Surveying apparatus | [2002/27] | French: | Instrument d'arpentage | [2002/27] | Examination procedure | 04.11.2004 | Examination requested [2005/01] | 16.09.2005 | Despatch of a communication from the examining division (Time limit: M08) | 30.03.2006 | Reply to a communication from the examining division | 14.08.2006 | Despatch of a communication from the examining division (Time limit: M08) | 26.03.2007 | Reply to a communication from the examining division | 01.10.2010 | Communication of intention to grant the patent | 26.01.2011 | Fee for grant paid | 26.01.2011 | Fee for publishing/printing paid | Opposition(s) | 19.12.2011 | No opposition filed within time limit [2012/08] | Fees paid | Renewal fee | 29.12.2003 | Renewal fee patent year 03 | 10.03.2005 | Renewal fee patent year 04 | 22.12.2005 | Renewal fee patent year 05 | 27.12.2006 | Renewal fee patent year 06 | 27.05.2008 | Renewal fee patent year 07 | 15.12.2008 | Renewal fee patent year 08 | 11.12.2009 | Renewal fee patent year 09 | 22.12.2010 | Renewal fee patent year 10 | Penalty fee | Additional fee for renewal fee | 31.12.2004 | 04   M06   Fee paid on   10.03.2005 | 31.12.2007 | 07   M06   Fee paid on   27.05.2008 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [XA]EP0481278 (PIETZSCH IBP GMBH [DE]) [X] 1-3,6-8 * column 5, line 7 - line 27 * * column 6, line 7 - column 7, line 11 * * abstract * [A] 4,5; | [XA]EP1024342 (TOPCON CORP [JP]) [X] 1,3,8 * page 3, line 17 - line 37 * * page 5, line 45 - line 49 * * abstract * [A] 2,4-7; | [XA]US4682218 (KANEKO ATSUMI [JP]) [X] 1,3,8 * column 1, line 63 - column 2, line 16 * * abstract * [A] 2,4-7; | [XA]DE19922321 (ZEISS CARL JENA GMBH [DE]) [X] 1,3,8 * column 3, line 28 - line 64 * * column 6, line 29 - line 68 * * figures 1,5; claims 1,2,5 * [A] 2,4-7; | [XA]WO9960335 (MEASUREMENT DEVICES LTD [GB], et al) [X] 1,3,8 * page 7, line 36 - page 10, line 35 * * page 20, line 23 - page 21, line 31 * * page 25, line 11 - page 26, line 6 * * abstract * [A] 2,4-7; | [XA]EP0661519 (TOPCON CORP [JP]) [X] 1,3,8 * column 3, line 7 - line 43 * * column 4, line 5 - line 40 * * column 5, line 25 - line 33 * * figures 1,4 * [A] 2,4-7 |