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Extract from the Register of European Patents

EP About this file: EP1326082

EP1326082 - Integrated circuit with configurable scan path [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  20.11.2009
Database last updated on 02.11.2024
Most recent event   Tooltip20.11.2009Application deemed to be withdrawnpublished on 23.12.2009  [2009/52]
Applicant(s)For all designated states
Infineon Technologies AG
St.-Martin-Strasse 53
81669 München / DE
[2003/28]
Inventor(s)01 / Huch, Martin, Dr.
Dornröschenstrasse 10
81739 München / DE
02 / Kock, Ernst-Josef, Dr.
Bahnsteg 1
85614 Kirchseeon / DE
03 / Mammitzsch, Jürgen
Münchener Strasse 48
82131 Gauting / DE
04 / Wagner, Wolfgang
Wachenheimer Strasse 15
81539 München / DE
05 / Sulzer, Hans
Alte Römerstrasse 188
85435 Erding / DE
 [2003/28]
Representative(s)Jannig, Peter, et al
Jannig & Repkow
Patentanwälte PartG mbB
Klausenberg 20
86199 Augsburg / DE
[N/P]
Former [2003/28]Jannig, Peter, Dipl.-Ing., et al
Jannig & Repkow, Patentanwälte, Klausenberg 20
86199 Augsburg / DE
Application number, filing date01130849.127.12.2001
[2003/28]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP1326082
Date:09.07.2003
Language:DE
[2003/28]
Search report(s)(Supplementary) European search report - dispatched on:EP10.07.2002
ClassificationIPC:G01R31/3185, G11C29/00
[2003/28]
CPC:
G11C29/32 (EP,US); G01R31/318536 (EP,US)
Designated contracting statesDE,   FR,   IT [2004/14]
Former [2003/28]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Integrierte Schaltung mit konfigurierbarem Abtastpfad[2003/28]
English:Integrated circuit with configurable scan path[2003/28]
French:Circuit integré avec trajet d'analyse[2003/28]
Examination procedure23.12.2003Examination requested  [2004/10]
11.01.2004Loss of particular rights, legal effect: designated state(s)
04.05.2004Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, CY, DK, ES, FI, GB, GR, IE, LU, MC, NL, PT, SE, TR
20.08.2004Despatch of a communication from the examining division (Time limit: M06)
14.03.2005Reply to a communication from the examining division
14.06.2005Despatch of a communication from the examining division (Time limit: M06)
27.12.2005Reply to a communication from the examining division
13.06.2007Despatch of a communication from the examining division (Time limit: M06)
23.12.2007Reply to a communication from the examining division
01.04.2009Communication of intention to grant the patent
01.07.2009Application deemed to be withdrawn, date of legal effect  [2009/52]
10.08.2009Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time  [2009/52]
Request for further processing for:14.03.2005Request for further processing filed
14.03.2005Full payment received (date of receipt of payment)
Request granted
30.03.2005Decision despatched
Fees paidRenewal fee
17.12.2003Renewal fee patent year 03
22.12.2004Renewal fee patent year 04
22.12.2005Renewal fee patent year 05
22.12.2006Renewal fee patent year 06
11.12.2007Renewal fee patent year 07
Penalty fee
Penalty fee Rule 85a EPC 1973
18.02.2004AT   M01   Not yet paid
18.02.2004BE   M01   Not yet paid
18.02.2004CH   M01   Not yet paid
18.02.2004CY   M01   Not yet paid
18.02.2004DK   M01   Not yet paid
18.02.2004ES   M01   Not yet paid
18.02.2004FI   M01   Not yet paid
18.02.2004GB   M01   Not yet paid
18.02.2004GR   M01   Not yet paid
18.02.2004IE   M01   Not yet paid
18.02.2004LU   M01   Not yet paid
18.02.2004MC   M01   Not yet paid
18.02.2004NL   M01   Not yet paid
18.02.2004PT   M01   Not yet paid
18.02.2004SE   M01   Not yet paid
18.02.2004TR   M01   Not yet paid
Additional fee for renewal fee
31.12.200808   M06   Not yet paid
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Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]US5386423  (KOO CATHERINE C [US], et al) [A] 1-3 * column 2, line 33 - column 3, line 2; figures 1,2A *;
 [A]US6106568  (BEAUSANG JAMES [US], et al) [A] 7 * column 34, line 17 - line 27; figure 9B *;
 [XY]US6145105  (NADEAU-DOSTIE BENOIT [CA], et al) [X] 1-3 * column 4, line 59 - column 5, line 30; figures 5A-5D * [Y] 4-6;
 [Y]US6158032  (CURRIER GUY RICHARD [US], et al) [Y] 4-6 * column 3, line 1 - line 55; figures 2-8 *;
 [A]WO0153845  (SUN MICROSYSTEMS INC [US]) [A] 1-21* the whole document *
ExaminationUS3675204
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.