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Extract from the Register of European Patents

EP About this file: EP1150498

EP1150498 - Photosensor array using multiple exposures to reduce thermal noise [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  11.02.2011
Database last updated on 03.09.2024
Most recent event   Tooltip06.01.2012Lapse of the patent in a contracting statepublished on 08.02.2012  [2012/06]
Applicant(s)For all designated states
Hewlett-Packard Company
3000 Hanover Street
Palo Alto, CA 94304-1112 / US
[N/P]
Former [2008/38]For all designated states
Hewlett-Packard Company
3000 Hanover Street
Palo Alto CA 94304-1112 / US
Former [2001/44]For all designated states
Hewlett-Packard Company
3000 Hanover Street
Palo Alto, CA 94304 / US
Inventor(s)01 / Spears, Kurt
319 Spinnaker Lane
Fort Collins, CA 80525 / US
02 / Beeman, Edward S.
33766 Cliff Road
Windsor, CO 80550 / US
03 / Albritton-McDonald, James C.
3805 Davis Ranch Road
Bellvue, CO 80512 / US
 [2001/44]
Representative(s)Durville, Guillaume, et al
Hewlett-Packard Española, S.L.
Legal Department
Cami de Can Graells, 1-21
Sant Cugat del Valles
08174 Barcelona / ES
[N/P]
Former [2010/02]Durville, Guillaume, et al
Hewlett-Packard Española, S.L. Legal Department Cami de Can Graells, 1-21 Sant Cugat del Valles
08174 Barcelona / ES
Former [2008/41]Carpmaels & Ransford
One Southampton Row London
WC1B 5HA / GB
Former [2002/31]Carpmaels & Ransford
43 Bloomsbury Square
London WC1A 2RA / GB
Former [2001/44]Colgan, Stephen James, et al
CARPMAELS & RANSFORD 43 Bloomsbury Square
London WC1A 2RA / GB
Application number, filing date01303638.920.04.2001
[2001/44]
Priority number, dateUS2000055843425.04.2000         Original published format: US 558434
[2001/44]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1150498
Date:31.10.2001
Language:EN
[2001/44]
Type: A3 Search report 
No.:EP1150498
Date:10.09.2003
[2003/37]
Type: B1 Patent specification 
No.:EP1150498
Date:07.04.2010
Language:EN
[2010/14]
Search report(s)(Supplementary) European search report - dispatched on:EP28.07.2003
ClassificationIPC:H04N5/217, H04N3/15
[2003/37]
CPC:
H04N25/701 (EP,US); H04N25/63 (EP,US); H04N25/713 (EP,US)
Former IPC [2001/44]H04N5/217
Designated contracting statesDE,   FR,   GB [2004/23]
Former [2001/44]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Photodetektor-Matrix mit Mehrfachbelichtung zur Reduzierung des thermischen Rauschen[2002/38]
English:Photosensor array using multiple exposures to reduce thermal noise[2001/44]
French:Matrice d'éléments photodétecteurs à expositions multiples pour réduire le bruit thermique[2001/44]
Former [2001/44]Photodetektor-Matrix mit Mehrfachbelichtung zur reduzierung des thermischen Rauschen
Examination procedure08.01.2004Examination requested  [2004/12]
06.12.2006Despatch of a communication from the examining division (Time limit: M04)
21.03.2007Reply to a communication from the examining division
02.04.2008Despatch of a communication from the examining division (Time limit: M04)
11.08.2008Reply to a communication from the examining division
11.11.2009Communication of intention to grant the patent
23.02.2010Fee for grant paid
23.02.2010Fee for publishing/printing paid
Opposition(s)10.01.2011No opposition filed within time limit [2011/11]
Fees paidRenewal fee
22.04.2003Renewal fee patent year 03
26.04.2004Renewal fee patent year 04
20.04.2005Renewal fee patent year 05
26.04.2006Renewal fee patent year 06
27.04.2007Renewal fee patent year 07
25.04.2008Renewal fee patent year 08
29.04.2009Renewal fee patent year 09
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipFR07.06.2010
[2012/06]
Documents cited:Search[Y]JPH10224808  ;
 [A]JPH10229521  ;
 [Y]US4750041  (VOGEL RICHARD M [US], et al);
 [Y]US5896172  (KORTHOUT ALOUISIUS W M [NL], et al);
 US6545713  [ ] (WATANABE TOHRU [JP])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.