EP1174709 - Cream solder inspection [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 14.11.2003 Database last updated on 16.11.2024 | Most recent event Tooltip | 14.11.2003 | Application deemed to be withdrawn | published on 02.01.2004 [2004/01] | Applicant(s) | For all designated states Nagoya Electric Works Co. Ltd. 1-36, Yokobori-cho Nakagawa-ku Aichi 454-0021 / JP | [N/P] |
Former [2002/04] | For all designated states Nagoya Electric Works Co. Ltd. 1-36, Yokobori-cho Nakagawa-ku, Aichi 454-0021 / JP | Inventor(s) | 01 /
Murakoshi, Takayuki, Nagoya Electric Co. Ltd. OE Div., 550 Aza Takawari Katori, Tado-cho Kuwana-gun, Mie 511-0102 / JP | 02 /
Tanaka, Makoto, Nadex Co. Ltd. 9-27, Furuwatari-cho, Naka-ku Nagoya-shi, Aichi 460-0025 / JP | 03 /
Ohashi, Kazu, Nagoya Electric Works Co. Ltd. OE Div., 550 Aza Takawari, Oaza Katori, Tado-cho Kuwana-gun, Mie 511-0102 / JP | [2002/04] | Representative(s) | Finnie, Peter John Gill Jennings & Every LLP The Broadgate Tower 20 Primrose Street London EC2A 2ES / GB | [N/P] |
Former [2002/04] | Finnie, Peter John Gill Jennings & Every, Broadgate House, 7 Eldon Street London EC2M 7LH / GB | Application number, filing date | 01306116.3 | 17.07.2001 | [2002/04] | Priority number, date | JP20000216070 | 17.07.2000 Original published format: JP 2000216070 | JP20000353007 | 20.11.2000 Original published format: JP 2000353007 | JP20000366856 | 01.12.2000 Original published format: JP 2000366856 | [2002/04] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1174709 | Date: | 23.01.2002 | Language: | EN | [2002/04] | Type: | A3 Search report | No.: | EP1174709 | Date: | 02.10.2002 | [2002/40] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 19.08.2002 | Classification | IPC: | G01N21/956, G01R31/309 | [2002/04] | CPC: |
G01N21/95684 (EP,US);
H05K1/0269 (EP,US);
H05K3/3485 (EP,US)
| Designated contracting states | (deleted) [2003/26] |
Former [2002/04] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR | Title | German: | Kontrolle von Weichlot | [2002/04] | English: | Cream solder inspection | [2002/04] | French: | Inspection de pâte de soudure | [2002/04] | Examination procedure | 03.04.2003 | Application deemed to be withdrawn, date of legal effect [2004/01] | 29.07.2003 | Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time [2004/01] | Fees paid | Penalty fee | Penalty fee Rule 85a EPC 1973 | 12.05.2003 | DE   M01   Not yet paid | 12.05.2003 | FR   M01   Not yet paid | 12.05.2003 | GB   M01   Not yet paid | Penalty fee Rule 85b EPC 1973 | 12.05.2003 | M01   Not yet paid | Additional fee for renewal fee | 31.07.2003 | 03   M06   Not yet paid |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]US4677473 (OKAMOTO SHINJI [JP], et al) [X] 1-9 * column 2, line 46 - line 54; figures 2-5,7,8,10-12,16 * * column 4, line 26 - line 40 * * column 5, line 19 - column 7, line 28 * * column 8, line 7 - line 30 *; | [X]EP0452905 (HITACHI LTD [JP]) [X] 1-9 * column 4, line 34 - line 45 * * column 7, line 9 - line 24 * * column 7, line 48 - column 8, line 8 * * column 8, line 21 - line 39 * * column 11, line 17 - line 28 *; | [X]US5064291 (REISER KURT [US]) [X] 1-3,5,7,8 * column 2, line 41 - column 3, line 31; figures 7,10 * * column 8, line 31 - column 9, line 24 * * column 9, line 66 - column 11, line 37 *; | [A]JPH05296731 ; | [A]US5245421 (ROBERTSON GORDON I [US], et al) [A] 1-9 * column 4, line 3 - line 23; figure 3 * * column 9, line 14 - line 46 *; | [A]US5030008 (SCOTT RICHARD S F [US], et al) [A] 1-9 * column 8, line 3 - column 10, line 42 * | [A] - PATENT ABSTRACTS OF JAPAN, (19940214), vol. 018, no. 089, Database accession no. (P - 1692), & JP05296731 A 19931109 (MATSUSHITA ELECTRIC IND CO LTD) [A] 1,4,5 * abstract * | [A] - "MULTIPLE-IMAGE VISION INSPECTION PROCESS", IBM TECHNICAL DISCLOSURE BULLETIN, IBM CORP. NEW YORK, US, (19870901), vol. 30, no. 4, ISSN 0018-8689, pages 1647 - 1649, XP000021763 [A] 1-9 * the whole document * |