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EP1275010
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EP About this file: EP1275010
| EP1275010 - METHOD AND APPARATUS FOR TESTING SIGNAL PATHS BETWEEN AN INTEGRATED CIRCUIT WAFER AND A WAFER TESTER [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 24.02.2012 Database last updated on 02.09.2024 | Most recent event Tooltip | 24.02.2012 | Application deemed to be withdrawn | published on 28.03.2012 [2012/13] | Applicant(s) | For all designated states FormFactor, Inc. 7005 Southfront Road Livermore, CA 94551 / US | [2005/49] |
| Former [2003/03] | For all designated states FORMFACTOR, INC. 2140 Research Drive Livermore, CA 94550 / US | Inventor(s) | 01 /
WHITTEN, Ralph, G. 5220 Sierra Road San Jose, CA 95132 / US | 02 /
ELDRIDGE, Benjamin, N. 651 Sheri Lane Danville, CA 94526 / US | [2003/03] | Representative(s) | Harris, Ian Richard, et al D Young & Co LLP 120 Holborn London EC1N 2DY / GB | [N/P] |
| Former [2009/28] | Harris, Ian Richard, et al D Young & Co 120 Holborn London EC1N 2DY / GB | ||
| Former [2003/03] | Käck, Jürgen Kahler Käck Mollekopf Vorderer Anger 239 86899 Landsberg / DE | Application number, filing date | 01922817.0 | 27.03.2001 | [2003/03] | WO2001US10030 | Priority number, date | US20000548885 | 13.04.2000 Original published format: US 548885 | US20000568460 | 09.05.2000 Original published format: US 568460 | [2003/03] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | WO0179863 | Date: | 25.10.2001 | Language: | EN | [2001/43] | Type: | A2 Application without search report | No.: | EP1275010 | Date: | 15.01.2003 | Language: | EN | The application published by WIPO in one of the EPO official languages on 25.10.2001 takes the place of the publication of the European patent application. | [2003/03] | Search report(s) | International search report - published on: | EP | 16.05.2002 | Classification | IPC: | G01R31/316, G01R35/00 | [2003/03] | CPC: |
G01R31/3167 (EP,US);
H01L22/00 (KR)
| Designated contracting states | DE, FR, GB, IT [2004/21] |
| Former [2003/03] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR | Extension states | AL | Not yet paid | LT | Not yet paid | LV | Not yet paid | MK | Not yet paid | RO | Not yet paid | SI | Not yet paid | Title | German: | VERFAHREN UND VORRICHTUNG ZUM TESTEN VON SIGNALWEGEN ZWISCHEN EINER INTEGRIERTEN SCHALTUNG UND EINEM WAFER-TESTER | [2003/03] | English: | METHOD AND APPARATUS FOR TESTING SIGNAL PATHS BETWEEN AN INTEGRATED CIRCUIT WAFER AND A WAFER TESTER | [2003/03] | French: | PROCEDE ET APPAREIL POUR TESTER DES CHEMINS DE SIGNAL ENTRE DES TRANCHES DE CIRCUITS INTEGRES ET UN TESTEUR DE TRANCHES | [2003/03] | Entry into regional phase | 12.11.2002 | National basic fee paid | 12.11.2002 | Designation fee(s) paid | 12.11.2002 | Examination fee paid | Examination procedure | 10.11.2001 | Request for preliminary examination filed International Preliminary Examining Authority: EP | 12.11.2002 | Examination requested [2003/03] | 07.03.2008 | Despatch of a communication from the examining division (Time limit: M06) | 29.08.2008 | Reply to a communication from the examining division | 01.04.2011 | Application deemed to be withdrawn, date of legal effect [2012/13] | 08.11.2011 | Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time [2012/13] | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 07.03.2008 | Fees paid | Renewal fee | 28.03.2003 | Renewal fee patent year 03 | 31.03.2004 | Renewal fee patent year 04 | 31.03.2005 | Renewal fee patent year 05 | 31.03.2006 | Renewal fee patent year 06 | 02.04.2007 | Renewal fee patent year 07 | 27.03.2008 | Renewal fee patent year 08 | 26.03.2009 | Renewal fee patent year 09 | 25.03.2010 | Renewal fee patent year 10 | Penalty fee | Additional fee for renewal fee | 31.03.2011 | 11 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [A]JPH11101849 ; | [A]EP0566823 (HEWLETT PACKARD CO [US]) [A] 1,11,14,23 * abstract *; | [A]US5414351 (HSU CHEN-CHUNG [TW], et al) [A] 1,26,27* abstract *; | [A]US6022750 (AKRAM SALMAN [US], et al) [A] 26,27 * abstract * | [A] - PATENT ABSTRACTS OF JAPAN, (19990730), vol. 1999, no. 09, & JP11101849 A 19990413 (ANDO ELECTRIC CO LTD) [A] 1 * abstract * | Examination | US5726920 |