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Extract from the Register of European Patents

EP About this file: EP1321980

EP1321980 - SEMICONDUCTOR ELEMENT, METHOD OF MANUFACTURING SEMICONDUCTOR ELEMENT, MULTI-LAYER PRINTED CIRCUIT BOARD, AND METHOD OF MANUFACTURING MULTI-LAYER PRINTED CIRCUIT BOARD [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  19.04.2013
Database last updated on 20.09.2024
Most recent event   Tooltip19.04.2013Application deemed to be withdrawnpublished on 22.05.2013  [2013/21]
Applicant(s)For all designated states
IBIDEN CO., LTD.
1, Kandacho 2-chome
Ogaki-shi, Gifu 503-0917 / JP
[N/P]
Former [2003/26]For all designated states
Ibiden Co., Ltd.
1, Kandacho 2-chome
Ogaki-shi, Gifu 503-0917 / JP
Inventor(s)01 / SAKAMOTO, Hajime, Ogaki-kita-kojou, Ibiden Co., Ltd
1, Kitakata 1-chome, Ibigawacho
Ibi-gun, Gifu 501-0695 / JP
02 / WANG, Dongdong, Ogaki-kita-kojou, Ibiden Co., Ltd
1, Kitakata 1-chome, Ibigawacho
Ibi-gun, Gifu 501-0695 / JP
 [2003/26]
Representative(s)Vossius & Partner Patentanwälte Rechtsanwälte mbB
Siebertstrasse 3
81675 München / DE
[N/P]
Former [2008/35]Vossius & Partner
Siebertstrasse 3
81675 München / DE
Former [2003/26]VOSSIUS & PARTNER
Siebertstrasse 4
81675 München / DE
Application number, filing date01925925.825.04.2001
[2003/26]
WO2001JP03589
Priority number, dateJP2000029023125.09.2000         Original published format: JP 2000290231
JP2000029023225.09.2000         Original published format: JP 2000290232
JP2000038280615.12.2000         Original published format: JP 2000382806
JP2000038280715.12.2000         Original published format: JP 2000382807
JP2000038281315.12.2000         Original published format: JP 2000382813
JP2000038281415.12.2000         Original published format: JP 2000382814
[2003/26]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO0227786
Date:04.04.2002
Language:EN
[2002/12]
Type: A1 Application with search report 
No.:EP1321980
Date:25.06.2003
Language:EN
The application published by WIPO in one of the EPO official languages on 04.04.2002 takes the place of the publication of the European patent application.
[2003/26]
Search report(s)International search report - published on:JP04.04.2002
(Supplementary) European search report - dispatched on:EP01.03.2007
ClassificationIPC:H01L23/12, H01L21/60, H05K3/46
[2003/26]
CPC:
H01L21/568 (EP,US); H01L23/525 (KR); H01L23/49838 (US);
H01L21/6835 (EP,US); H01L23/49816 (EP,US); H01L23/49822 (US);
H01L23/49866 (US); H01L23/49894 (EP,US); H01L23/5389 (EP,US);
H01L24/19 (EP,US); H01L24/24 (EP,US); H01L24/27 (EP,US);
H01L24/97 (EP,US); H05K1/185 (EP,US); H01L2224/0401 (EP,US);
H01L2224/04105 (EP,US); H01L2224/1147 (EP,US); H01L2224/12105 (EP,US);
H01L2224/20 (EP,US); H01L2224/24137 (EP,US); H01L2224/24227 (EP,US);
H01L2224/274 (EP,US); H01L2224/32225 (EP,US); H01L2224/32245 (EP,US);
H01L2224/45144 (EP,US); H01L2224/73267 (EP,US); H01L2224/92244 (EP,US);
H01L2224/94 (EP,US); H01L2224/97 (EP,US); H01L23/49811 (EP,US);
H01L2924/01004 (EP,US); H01L2924/01005 (EP,US); H01L2924/01006 (EP,US);
H01L2924/01011 (EP,US); H01L2924/01012 (EP,US); H01L2924/01013 (EP,US);
H01L2924/01015 (EP,US); H01L2924/01018 (EP,US); H01L2924/01019 (EP,US);
H01L2924/0102 (EP,US); H01L2924/01024 (EP,US); H01L2924/01027 (EP,US);
H01L2924/01029 (EP,US); H01L2924/0103 (EP,US); H01L2924/01033 (EP,US);
H01L2924/01039 (EP,US); H01L2924/01046 (EP,US); H01L2924/01047 (EP,US);
H01L2924/01051 (EP,US); H01L2924/01074 (EP,US); H01L2924/01078 (EP,US);
H01L2924/01079 (EP,US); H01L2924/01082 (EP,US); H01L2924/12042 (EP,US);
H01L2924/14 (EP,US); H01L2924/15153 (EP,US); H01L2924/1517 (EP,US);
H01L2924/15174 (EP,US); H01L2924/15311 (EP,US); H01L2924/15312 (EP,US);
H01L2924/1532 (EP,US); H01L2924/15787 (EP,US); H01L2924/30107 (EP,US);
H01L2924/3511 (EP,US); H05K2201/09036 (EP,US); H05K2201/09563 (EP,US);
H05K2201/096 (EP,US); H05K3/4602 (EP,US); Y10T29/49124 (EP,US);
Y10T29/49126 (EP,US); Y10T29/49128 (EP,US); Y10T29/4913 (EP,US);
Y10T29/49133 (EP,US); Y10T29/49139 (EP,US); Y10T29/49144 (EP,US);
Y10T29/49146 (EP,US); Y10T29/49155 (EP,US); Y10T29/49165 (EP,US) (-)
C-Set:
H01L2224/24227, H01L2924/1517 (US,EP);
H01L2224/45144, H01L2924/00 (EP,US);
H01L2224/94, H01L2224/03 (EP,US);
H01L2224/97, H01L2224/82 (US,EP);
H01L2224/97, H01L2924/15311 (US,EP);
H01L2924/12042, H01L2924/00 (EP,US);
H01L2924/1517, H01L2924/15153 (US,EP);
H01L2924/15787, H01L2924/00 (EP,US);
H01L2924/3512, H01L2924/00 (EP,US)
(-)
Designated contracting statesDE,   FI,   GB,   NL [2004/21]
Former [2003/26]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:HALBLEITERELEMENT, VERFAHREN ZUR HERSTELLUNG DES HALBLEITERELEMENTS, MEHRSCHICHTIGE LEITERPLATTE UND VERFAHREN ZUR HERSTELLUNG DER MEHRSCHICHTIGEN LEITERPLATTE[2003/26]
English:SEMICONDUCTOR ELEMENT, METHOD OF MANUFACTURING SEMICONDUCTOR ELEMENT, MULTI-LAYER PRINTED CIRCUIT BOARD, AND METHOD OF MANUFACTURING MULTI-LAYER PRINTED CIRCUIT BOARD[2003/26]
French:ELEMENT SEMI-CONDUCTEUR, PROCEDE DE FABRICATION D'UN ELEMENT SEMI-CONDUCTEUR, CARTE A CIRCUIT IMPRIME MULTICOUCHE, ET PROCEDE DE FABRICATION D'UNE CARTE A CIRCUIT IMPRIME MULTICOUCHE[2003/26]
Entry into regional phase13.03.2003Translation filed 
11.04.2003National basic fee paid 
11.04.2003Search fee paid 
11.04.2003Designation fee(s) paid 
11.04.2003Examination fee paid 
Examination procedure15.04.2002Request for preliminary examination filed
International Preliminary Examining Authority: JP
11.04.2003Examination requested  [2003/26]
13.09.2007Despatch of a communication from the examining division (Time limit: M06)
25.03.2008Reply to a communication from the examining division
07.10.2008Despatch of a communication from the examining division (Time limit: M06)
17.04.2009Reply to a communication from the examining division
18.01.2010Despatch of a communication from the examining division (Time limit: M06)
28.06.2010Reply to a communication from the examining division
24.08.2010Despatch of a communication from the examining division (Time limit: M06)
03.03.2011Reply to a communication from the examining division
24.05.2012Despatch of a communication from the examining division (Time limit: M06)
04.12.2012Application deemed to be withdrawn, date of legal effect  [2013/21]
07.01.2013Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2013/21]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  13.09.2007
Fees paidRenewal fee
11.04.2003Renewal fee patent year 03
30.04.2004Renewal fee patent year 04
02.05.2005Renewal fee patent year 05
30.03.2006Renewal fee patent year 06
27.04.2007Renewal fee patent year 07
31.03.2008Renewal fee patent year 08
24.04.2009Renewal fee patent year 09
25.02.2010Renewal fee patent year 10
21.04.2011Renewal fee patent year 11
25.04.2012Renewal fee patent year 12
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Documents cited:Search[A]US3775844  (PARKS H) [A] 27-40 * the whole document *;
 [A]EP0471938  (IBM [US]) [A] 1 * the whole document *;
 [X]US5111278  (EICHELBERGER CHARLES W [US]) [X] 1,24 * the whole document *;
 [X]US5455459  (FILLION RAYMOND A [US], et al) [X] 6-13,16-23 *see Figure 1 and accompanying description*;
 [A]US5521122  (KURAMOCHI TOSHIYUKI [JP]) [A] 35,36 * the whole document *;
 [X]US5629564  (NYE III HENRY A [US], et al) [X] 16-23 * column 6, line 39 - column 8, line 10; figure 3 *;
 [XY]EP0777274  (LOCKHEED CORP [US]) [X] 1-3,24,25 * column 5, line 47 - column 10, line 57; figures 1,3,4 * [Y] 4,5,26,41-43;
 [Y]JPH1098081  (HITACHI CABLE) [Y] 41-43* abstract *;
 [XA]US5841193  (EICHELBERGER CHARLES WILLIAM [US]) [X] 14,15 * column 10, lines 64,65 * [A] 35;
 [A]US6025995  (MARCINKIEWICZ WALTER M [US]) [A] 1 * the whole document *;
 [X]EP1003209  (SHINKO ELECTRIC IND CO [JP]) [X] 14,15 * paragraphs [0009] , [0022] - [0033]; figures 1-5 *;
 [Y]EP1024531  (SHINKO ELECTRIC IND CO [JP]) [Y] 4,5,26 * paragraphs [0025] - [0027]; figures 1,2 *;
 [A]EP1032030  (LUCENT TECHNOLOGIES INC [US]) [A] 14-17 * paragraphs [0013] , [0031] *
International search[A]JPH03101234  (NEC CORP);
 [A]JPH0465832  (FUJITSU LTD);
 [X]JPH10284632  (FUJITSU LTD);
 [X]JP2000260902  (NGK SPARK PLUG CO)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.