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Extract from the Register of European Patents

EP About this file: EP1285222

EP1285222 - INTERFEROMETRIC APPARATUS AND METHOD [Right-click to bookmark this link]
StatusThe application has been refused
Status updated on  23.05.2008
Database last updated on 20.12.2024
Most recent event   Tooltip23.05.2008Refusal of applicationpublished on 25.06.2008  [2008/26]
Applicant(s)For all designated states
ZYGO CORPORATION
Laurel Brook Road
Middlefield, CT 06544 / US
[2003/09]
Inventor(s)01 / HILL, Henry, Allen
340 South Avenida de Palmas
Tucson, AZ 85716 / US
 [2003/09]
Representative(s)Cole, David John, et al
46 Kirkhill Gardens
West Greenlees Estate
Cambuslang
Glasgow G72 8EZ / GB
[N/P]
Former [2004/20]Cole, David John, et al
46 Kirkhill Gardens, West Greenlees Estate
Cambuslang, Glasgow G72 8EZ / GB
Former [2003/09]Cole, David John, et al
Executive Liaison Services 43 Mount Felix
Walton-on-Thames Surrey KT12 2PJ / GB
Application number, filing date01933413.509.05.2001
[2003/09]
WO2001US40702
Priority number, dateUS20000204860P17.05.2000         Original published format: US 204860 P
US20000223523P07.08.2000         Original published format: US 223523 P
[2003/09]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO0188469
Date:22.11.2001
Language:EN
[2001/47]
Type: A1 Application with search report 
No.:EP1285222
Date:26.02.2003
Language:EN
The application published by WIPO in one of the EPO official languages on 22.11.2001 takes the place of the publication of the European patent application.
[2003/09]
Search report(s)International search report - published on:US22.11.2001
(Supplementary) European search report - dispatched on:EP18.10.2006
ClassificationIPC:G01B9/02, G03F7/20
[2006/46]
CPC:
G03F7/70775 (EP,US); G03F9/7015 (EP,US); G03F9/7049 (EP,US)
Former IPC [2003/09]G01B9/02
Designated contracting statesDE,   NL [2004/21]
Former [2003/09]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:INTERFEROMETRISCHE VORRICHTUNG UND INTERFEROMETRISCHES VERFAHREN[2003/09]
English:INTERFEROMETRIC APPARATUS AND METHOD[2003/09]
French:APPAREIL ET PROCEDE INTERFEROMETRIQUE[2003/09]
Entry into regional phase18.10.2002National basic fee paid 
18.10.2002Search fee paid 
18.10.2002Designation fee(s) paid 
18.10.2002Examination fee paid 
Examination procedure20.11.2001Request for preliminary examination filed
International Preliminary Examining Authority: US
18.10.2002Examination requested  [2003/09]
13.03.2007Despatch of a communication from the examining division (Time limit: M04)
23.07.2007Reply to a communication from the examining division
31.01.2008Despatch of communication that the application is refused, reason: substantive examination [2008/26]
10.02.2008Application refused, date of legal effect [2008/26]
Fees paidRenewal fee
18.10.2002Renewal fee patent year 03
22.04.2004Renewal fee patent year 04
23.05.2005Renewal fee patent year 05
23.05.2006Renewal fee patent year 06
30.05.2007Renewal fee patent year 07
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[XAY]US6020964  (LOOPSTRA ERIK R [NL], et al) [X] 1-4,10-13 * the whole document * [A] 9 [Y] 5,15,16;
 [Y]US5757160  (KREUZER JUSTIN [US]) [Y] 5-7 * the whole document *;
 [Y]US6046792  (VAN DER WERF JAN E [NL], et al) [Y] 5 * columns 15,16 *;
 [Y]WO0012959  (ZYGO CORP [US]) [Y] 6,7,10-13 * pages 3-8; figure 1 *;
 [Y]JPH04179115  (KYUSHU NIPPON ELECTRIC) [Y] 10-13 * the whole document *;
 [Y]EP0974868  (CANON KK [JP]) [Y] 15,16 * the whole document *;
 [A]JPH1022219  (NIKON CORP) [A] 1,5,9,15,16 * figures 5,6 *
International search[X]US6020964
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.