EP1292834 - SYSTEMS FOR TESTING INTEGRATED CIRCUITS [Right-click to bookmark this link] | |||
Former [2003/12] | SYSTEMS FOR TESTING INTEGRATED CIRCUITS DURING BURN-IN | ||
[2005/28] | Status | No opposition filed within time limit Status updated on 06.10.2006 Database last updated on 31.08.2024 | Most recent event Tooltip | 05.12.2008 | Lapse of the patent in a contracting state New state(s): CY, FR | published on 07.01.2009 [2009/02] | Applicant(s) | For all designated states Nanonexus, Inc. 400 Kato Terrace Fremont, CA 94539 / US | [2003/12] | Inventor(s) | 01 /
MOK, Sammy 106360 E. Estates Drive Cupertino, CA 95014 / US | 02 /
CHONG, Fu, Chiung 19743 Glen Brae Drive Saratoga, CA 95070 / US | [2003/12] | Representative(s) | Price, Nigel John King, et al J A Kemp 14 South Square Gray's Inn London WC1R 5JJ / GB | [N/P] |
Former [2003/12] | Price, Nigel John King, et al J.A. KEMP & CO. 14 South Square Gray's Inn London WC1R 5JJ / GB | Application number, filing date | 01946604.4 | 20.06.2001 | [2003/12] | WO2001US19792 | Priority number, date | US20000212923P | 20.06.2000 Original published format: US 212923 P | US20000213729P | 22.06.2000 Original published format: US 213729 P | [2003/12] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | WO0198793 | Date: | 27.12.2001 | Language: | EN | [2001/52] | Type: | A2 Application without search report | No.: | EP1292834 | Date: | 19.03.2003 | Language: | EN | The application published by WIPO in one of the EPO official languages on 27.12.2001 takes the place of the publication of the European patent application. | [2003/12] | Type: | B1 Patent specification | No.: | EP1292834 | Date: | 30.11.2005 | Language: | EN | [2005/48] | Search report(s) | International search report - published on: | EP | 25.07.2002 | Classification | IPC: | G01R1/073 | [2003/12] | CPC: |
H01L23/3114 (EP,US);
H01L22/00 (KR);
G01R1/06711 (EP,US);
G01R1/07307 (EP,US);
H01L24/10 (EP,US);
H01L24/13 (EP,US);
H01L24/72 (EP,US);
G01R1/06727 (EP,US);
H01L2224/13 (EP,US);
H01L2224/13099 (EP,US);
H01L2224/274 (EP,US);
H01L2224/75251 (EP,US);
H01L2924/01005 (EP,US);
H01L2924/01006 (EP,US);
H01L2924/01013 (EP,US);
H01L2924/01015 (EP,US);
H01L2924/01019 (EP,US);
H01L2924/0102 (EP,US);
H01L2924/01022 (EP,US);
H01L2924/01023 (EP,US);
H01L2924/01027 (EP,US);
H01L2924/01029 (EP,US);
H01L2924/01033 (EP,US);
H01L2924/01039 (EP,US);
H01L2924/01045 (EP,US);
H01L2924/01046 (EP,US);
H01L2924/01047 (EP,US);
H01L2924/01074 (EP,US);
H01L2924/01075 (EP,US);
H01L2924/01078 (EP,US);
H01L2924/01079 (EP,US);
H01L2924/01082 (EP,US);
H01L2924/014 (EP,US);
H01L2924/10253 (EP,US);
H01L2924/14 (EP,US);
H01L2924/19041 (EP,US);
H01L2924/19042 (EP,US);
H01L2924/19043 (EP,US);
H01L2924/30105 (EP,US);
H01L2924/30107 (EP,US);
H01L2924/3011 (EP,US);
H01L2924/3025 (EP,US);
H01L2924/351 (EP,US)
(-)
| C-Set: |
H01L2224/13, H01L2924/00 (US,EP);
H01L2924/10253, H01L2924/00 (EP,US);
H01L2924/351, H01L2924/00 (US,EP)
| Designated contracting states | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR [2003/12] | Extension states | AL | Not yet paid | LT | Not yet paid | LV | Not yet paid | MK | Not yet paid | RO | Not yet paid | SI | Not yet paid | Title | German: | TESTSYSTEM VON INTEGRIERTEN SCHALTUNGEN | [2005/28] | English: | SYSTEMS FOR TESTING INTEGRATED CIRCUITS | [2005/28] | French: | SYSTEMES POUR TESTER DES CIRCUITS INTEGRES | [2005/28] |
Former [2003/12] | TEST- UND VERPACKUNGSSYSTEME VON INTEGRIERTEN SCHALTUNGEN | ||
Former [2003/12] | SYSTEMS FOR TESTING INTEGRATED CIRCUITS DURING BURN-IN | ||
Former [2003/12] | SYSTEMES POUR TESTER ET METTRE SOUS BOITIER DES CIRCUITS INTEGRES | Entry into regional phase | 01.03.2002 | National basic fee paid | 01.03.2002 | Designation fee(s) paid | 01.03.2002 | Examination fee paid | Examination procedure | 01.03.2002 | Amendment by applicant (claims and/or description) | 01.03.2002 | Examination requested [2003/12] | 24.05.2004 | Despatch of a communication from the examining division (Time limit: M06) | 25.10.2004 | Reply to a communication from the examining division | 19.01.2005 | Despatch of a communication from the examining division (Time limit: M04) | 29.04.2005 | Reply to a communication from the examining division | 07.06.2005 | Communication of intention to grant the patent | 04.10.2005 | Fee for grant paid | 04.10.2005 | Fee for publishing/printing paid | Opposition(s) | 31.08.2006 | No opposition filed within time limit [2006/45] | Fees paid | Renewal fee | 04.06.2003 | Renewal fee patent year 03 | 04.06.2004 | Renewal fee patent year 04 | 06.06.2005 | Renewal fee patent year 05 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | AT | 30.11.2005 | BE | 30.11.2005 | CH | 30.11.2005 | CY | 30.11.2005 | FI | 30.11.2005 | FR | 30.11.2005 | IT | 30.11.2005 | LI | 30.11.2005 | NL | 30.11.2005 | TR | 30.11.2005 | DK | 28.02.2006 | GR | 28.02.2006 | SE | 28.02.2006 | ES | 13.03.2006 | PT | 02.05.2006 | GB | 20.06.2006 | IE | 20.06.2006 | LU | 20.06.2006 | MC | 30.06.2006 | [2009/01] |
Former [2008/37] | AT | 30.11.2005 | |
BE | 30.11.2005 | ||
CH | 30.11.2005 | ||
FI | 30.11.2005 | ||
IT | 30.11.2005 | ||
LI | 30.11.2005 | ||
NL | 30.11.2005 | ||
TR | 30.11.2005 | ||
DK | 28.02.2006 | ||
GR | 28.02.2006 | ||
SE | 28.02.2006 | ||
ES | 13.03.2006 | ||
PT | 02.05.2006 | ||
GB | 20.06.2006 | ||
IE | 20.06.2006 | ||
LU | 20.06.2006 | ||
MC | 30.06.2006 | ||
Former [2007/36] | AT | 30.11.2005 | |
BE | 30.11.2005 | ||
CH | 30.11.2005 | ||
FI | 30.11.2005 | ||
IT | 30.11.2005 | ||
LI | 30.11.2005 | ||
NL | 30.11.2005 | ||
DK | 28.02.2006 | ||
GR | 28.02.2006 | ||
SE | 28.02.2006 | ||
ES | 13.03.2006 | ||
PT | 02.05.2006 | ||
GB | 20.06.2006 | ||
IE | 20.06.2006 | ||
MC | 30.06.2006 | ||
Former [2007/28] | AT | 30.11.2005 | |
BE | 30.11.2005 | ||
CH | 30.11.2005 | ||
FI | 30.11.2005 | ||
LI | 30.11.2005 | ||
NL | 30.11.2005 | ||
DK | 28.02.2006 | ||
GR | 28.02.2006 | ||
SE | 28.02.2006 | ||
ES | 13.03.2006 | ||
PT | 02.05.2006 | ||
GB | 20.06.2006 | ||
IE | 20.06.2006 | ||
MC | 30.06.2006 | ||
Former [2007/25] | AT | 30.11.2005 | |
BE | 30.11.2005 | ||
CH | 30.11.2005 | ||
FI | 30.11.2005 | ||
LI | 30.11.2005 | ||
NL | 30.11.2005 | ||
DK | 28.02.2006 | ||
GR | 28.02.2006 | ||
SE | 28.02.2006 | ||
ES | 13.03.2006 | ||
PT | 02.05.2006 | ||
IE | 20.06.2006 | ||
MC | 30.06.2006 | ||
Former [2007/07] | AT | 30.11.2005 | |
BE | 30.11.2005 | ||
CH | 30.11.2005 | ||
FI | 30.11.2005 | ||
LI | 30.11.2005 | ||
NL | 30.11.2005 | ||
DK | 28.02.2006 | ||
GR | 28.02.2006 | ||
SE | 28.02.2006 | ||
ES | 13.03.2006 | ||
PT | 02.05.2006 | ||
MC | 30.06.2006 | ||
Former [2006/48] | AT | 30.11.2005 | |
BE | 30.11.2005 | ||
CH | 30.11.2005 | ||
FI | 30.11.2005 | ||
LI | 30.11.2005 | ||
NL | 30.11.2005 | ||
DK | 28.02.2006 | ||
GR | 28.02.2006 | ||
SE | 28.02.2006 | ||
ES | 13.03.2006 | ||
PT | 02.05.2006 | ||
Former [2006/38] | AT | 30.11.2005 | |
BE | 30.11.2005 | ||
CH | 30.11.2005 | ||
FI | 30.11.2005 | ||
LI | 30.11.2005 | ||
NL | 30.11.2005 | ||
DK | 28.02.2006 | ||
GR | 28.02.2006 | ||
SE | 28.02.2006 | ||
ES | 13.03.2006 | ||
Former [2006/36] | AT | 30.11.2005 | |
BE | 30.11.2005 | ||
CH | 30.11.2005 | ||
FI | 30.11.2005 | ||
LI | 30.11.2005 | ||
NL | 30.11.2005 | ||
DK | 28.02.2006 | ||
SE | 28.02.2006 | ||
ES | 13.03.2006 | ||
Former [2006/34] | AT | 30.11.2005 | |
CH | 30.11.2005 | ||
FI | 30.11.2005 | ||
LI | 30.11.2005 | ||
NL | 30.11.2005 | ||
DK | 28.02.2006 | ||
SE | 28.02.2006 | ||
ES | 13.03.2006 | ||
Former [2006/33] | CH | 30.11.2005 | |
FI | 30.11.2005 | ||
LI | 30.11.2005 | ||
NL | 30.11.2005 | ||
SE | 28.02.2006 | ||
ES | 13.03.2006 | ||
Former [2006/27] | FI | 30.11.2005 | |
NL | 30.11.2005 | ||
SE | 28.02.2006 | ||
Former [2006/23] | FI | 30.11.2005 | |
NL | 30.11.2005 | Cited in | International search | [A]US3842189 (SOUTHGATE P) [A] 23 * claims 1-5 *; | [A]US4035046 (KLOTH JAMES ALBERT) [A] 1* column 5, line 1 - column 5, line 14; figure 9 *; | [Y]US5385477 (VAYNKOF YAKOV F [US], et al) [Y] 23,25 * abstract *; | [XAY]US5613861 (SMITH DONALD L [US], et al) [X] 21,46-48 * figures 10-13 * [A] 1,4-6,22,52 [Y] 53,55,64,65,67,69; | [Y]US5756021 (HEDRICK JAMES LUPTON [US], et al) [Y] 23,24 * figure 5 *; | [Y]US5801441 (DISTEFANO THOMAS H [US], et al) [Y] 67,69 * figure 22 *; | [YA]WO9918445 (NEW JERSEY TECH INST [US]) [Y] 23-25 * abstract * [A] 86,106; | [Y]US5917707 (KHANDROS IGOR Y [US], et al) [Y] 53,55,64,65 * figures 12,13 * * figure 5 *; | [X]US5944537 (SMITH DONALD L [US], et al) [X] 23,24 * abstract * |