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Extract from the Register of European Patents

EP About this file: EP1292834

EP1292834 - SYSTEMS FOR TESTING INTEGRATED CIRCUITS [Right-click to bookmark this link]
Former [2003/12]SYSTEMS FOR TESTING INTEGRATED CIRCUITS DURING BURN-IN
[2005/28]
StatusNo opposition filed within time limit
Status updated on  06.10.2006
Database last updated on 31.08.2024
Most recent event   Tooltip05.12.2008Lapse of the patent in a contracting state
New state(s): CY, FR		published on 07.01.2009  [2009/02]
Applicant(s)For all designated states
Nanonexus, Inc.
400 Kato Terrace
Fremont, CA 94539 / US
[2003/12]
Inventor(s)01 / MOK, Sammy
106360 E. Estates Drive
Cupertino, CA 95014 / US
02 / CHONG, Fu, Chiung
19743 Glen Brae Drive
Saratoga, CA 95070 / US
 [2003/12]
Representative(s)Price, Nigel John King, et al
J A Kemp
14 South Square
Gray's Inn
London WC1R 5JJ / GB
[N/P]
Former [2003/12]Price, Nigel John King, et al
J.A. KEMP & CO. 14 South Square Gray's Inn
London WC1R 5JJ / GB
Application number, filing date01946604.420.06.2001
[2003/12]
WO2001US19792
Priority number, dateUS20000212923P20.06.2000         Original published format: US 212923 P
US20000213729P22.06.2000         Original published format: US 213729 P
[2003/12]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO0198793
Date:27.12.2001
Language:EN
[2001/52]
Type: A2 Application without search report 
No.:EP1292834
Date:19.03.2003
Language:EN
The application published by WIPO in one of the EPO official languages on 27.12.2001 takes the place of the publication of the European patent application.
[2003/12]
Type: B1 Patent specification 
No.:EP1292834
Date:30.11.2005
Language:EN
[2005/48]
Search report(s)International search report - published on:EP25.07.2002
ClassificationIPC:G01R1/073
[2003/12]
CPC:
H01L23/3114 (EP,US); H01L22/00 (KR); G01R1/06711 (EP,US);
G01R1/07307 (EP,US); H01L24/10 (EP,US); H01L24/13 (EP,US);
H01L24/72 (EP,US); G01R1/06727 (EP,US); H01L2224/13 (EP,US);
H01L2224/13099 (EP,US); H01L2224/274 (EP,US); H01L2224/75251 (EP,US);
H01L2924/01005 (EP,US); H01L2924/01006 (EP,US); H01L2924/01013 (EP,US);
H01L2924/01015 (EP,US); H01L2924/01019 (EP,US); H01L2924/0102 (EP,US);
H01L2924/01022 (EP,US); H01L2924/01023 (EP,US); H01L2924/01027 (EP,US);
H01L2924/01029 (EP,US); H01L2924/01033 (EP,US); H01L2924/01039 (EP,US);
H01L2924/01045 (EP,US); H01L2924/01046 (EP,US); H01L2924/01047 (EP,US);
H01L2924/01074 (EP,US); H01L2924/01075 (EP,US); H01L2924/01078 (EP,US);
H01L2924/01079 (EP,US); H01L2924/01082 (EP,US); H01L2924/014 (EP,US);
H01L2924/10253 (EP,US); H01L2924/14 (EP,US); H01L2924/19041 (EP,US);
H01L2924/19042 (EP,US); H01L2924/19043 (EP,US); H01L2924/30105 (EP,US);
H01L2924/30107 (EP,US); H01L2924/3011 (EP,US); H01L2924/3025 (EP,US);
H01L2924/351 (EP,US) (-)
C-Set:
H01L2224/13, H01L2924/00 (US,EP);
H01L2924/10253, H01L2924/00 (EP,US);
H01L2924/351, H01L2924/00 (US,EP)
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   TR [2003/12]
Extension statesALNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
RONot yet paid
SINot yet paid
TitleGerman:TESTSYSTEM VON INTEGRIERTEN SCHALTUNGEN[2005/28]
English:SYSTEMS FOR TESTING INTEGRATED CIRCUITS[2005/28]
French:SYSTEMES POUR TESTER DES CIRCUITS INTEGRES[2005/28]
Former [2003/12]TEST- UND VERPACKUNGSSYSTEME VON INTEGRIERTEN SCHALTUNGEN
Former [2003/12]SYSTEMS FOR TESTING INTEGRATED CIRCUITS DURING BURN-IN
Former [2003/12]SYSTEMES POUR TESTER ET METTRE SOUS BOITIER DES CIRCUITS INTEGRES
Entry into regional phase01.03.2002National basic fee paid 
01.03.2002Designation fee(s) paid 
01.03.2002Examination fee paid 
Examination procedure01.03.2002Amendment by applicant (claims and/or description)
01.03.2002Examination requested  [2003/12]
24.05.2004Despatch of a communication from the examining division (Time limit: M06)
25.10.2004Reply to a communication from the examining division
19.01.2005Despatch of a communication from the examining division (Time limit: M04)
29.04.2005Reply to a communication from the examining division
07.06.2005Communication of intention to grant the patent
04.10.2005Fee for grant paid
04.10.2005Fee for publishing/printing paid
Opposition(s)31.08.2006No opposition filed within time limit [2006/45]
Fees paidRenewal fee
04.06.2003Renewal fee patent year 03
04.06.2004Renewal fee patent year 04
06.06.2005Renewal fee patent year 05
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT30.11.2005
BE30.11.2005
CH30.11.2005
CY30.11.2005
FI30.11.2005
FR30.11.2005
IT30.11.2005
LI30.11.2005
NL30.11.2005
TR30.11.2005
DK28.02.2006
GR28.02.2006
SE28.02.2006
ES13.03.2006
PT02.05.2006
GB20.06.2006
IE20.06.2006
LU20.06.2006
MC30.06.2006
[2009/01]
Former [2008/37]AT30.11.2005
BE30.11.2005
CH30.11.2005
FI30.11.2005
IT30.11.2005
LI30.11.2005
NL30.11.2005
TR30.11.2005
DK28.02.2006
GR28.02.2006
SE28.02.2006
ES13.03.2006
PT02.05.2006
GB20.06.2006
IE20.06.2006
LU20.06.2006
MC30.06.2006
Former [2007/36]AT30.11.2005
BE30.11.2005
CH30.11.2005
FI30.11.2005
IT30.11.2005
LI30.11.2005
NL30.11.2005
DK28.02.2006
GR28.02.2006
SE28.02.2006
ES13.03.2006
PT02.05.2006
GB20.06.2006
IE20.06.2006
MC30.06.2006
Former [2007/28]AT30.11.2005
BE30.11.2005
CH30.11.2005
FI30.11.2005
LI30.11.2005
NL30.11.2005
DK28.02.2006
GR28.02.2006
SE28.02.2006
ES13.03.2006
PT02.05.2006
GB20.06.2006
IE20.06.2006
MC30.06.2006
Former [2007/25]AT30.11.2005
BE30.11.2005
CH30.11.2005
FI30.11.2005
LI30.11.2005
NL30.11.2005
DK28.02.2006
GR28.02.2006
SE28.02.2006
ES13.03.2006
PT02.05.2006
IE20.06.2006
MC30.06.2006
Former [2007/07]AT30.11.2005
BE30.11.2005
CH30.11.2005
FI30.11.2005
LI30.11.2005
NL30.11.2005
DK28.02.2006
GR28.02.2006
SE28.02.2006
ES13.03.2006
PT02.05.2006
MC30.06.2006
Former [2006/48]AT30.11.2005
BE30.11.2005
CH30.11.2005
FI30.11.2005
LI30.11.2005
NL30.11.2005
DK28.02.2006
GR28.02.2006
SE28.02.2006
ES13.03.2006
PT02.05.2006
Former [2006/38]AT30.11.2005
BE30.11.2005
CH30.11.2005
FI30.11.2005
LI30.11.2005
NL30.11.2005
DK28.02.2006
GR28.02.2006
SE28.02.2006
ES13.03.2006
Former [2006/36]AT30.11.2005
BE30.11.2005
CH30.11.2005
FI30.11.2005
LI30.11.2005
NL30.11.2005
DK28.02.2006
SE28.02.2006
ES13.03.2006
Former [2006/34]AT30.11.2005
CH30.11.2005
FI30.11.2005
LI30.11.2005
NL30.11.2005
DK28.02.2006
SE28.02.2006
ES13.03.2006
Former [2006/33]CH30.11.2005
FI30.11.2005
LI30.11.2005
NL30.11.2005
SE28.02.2006
ES13.03.2006
Former [2006/27]FI30.11.2005
NL30.11.2005
SE28.02.2006
Former [2006/23]FI30.11.2005
NL30.11.2005
Cited inInternational search[A]US3842189  (SOUTHGATE P) [A] 23 * claims 1-5 *;
 [A]US4035046  (KLOTH JAMES ALBERT) [A] 1* column 5, line 1 - column 5, line 14; figure 9 *;
 [Y]US5385477  (VAYNKOF YAKOV F [US], et al) [Y] 23,25 * abstract *;
 [XAY]US5613861  (SMITH DONALD L [US], et al) [X] 21,46-48 * figures 10-13 * [A] 1,4-6,22,52 [Y] 53,55,64,65,67,69;
 [Y]US5756021  (HEDRICK JAMES LUPTON [US], et al) [Y] 23,24 * figure 5 *;
 [Y]US5801441  (DISTEFANO THOMAS H [US], et al) [Y] 67,69 * figure 22 *;
 [YA]WO9918445  (NEW JERSEY TECH INST [US]) [Y] 23-25 * abstract * [A] 86,106;
 [Y]US5917707  (KHANDROS IGOR Y [US], et al) [Y] 53,55,64,65 * figures 12,13 * * figure 5 *;
 [X]US5944537  (SMITH DONALD L [US], et al) [X] 23,24 * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.