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Extract from the Register of European Patents

EP About this file: EP1306464

EP1306464 - GRADED MATERIAL AND METHOD FOR SYNTHESIS THEREOF AND METHOD FOR PROCESSING THEREOF [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  12.06.2009
Database last updated on 19.10.2024
Most recent event   Tooltip12.06.2009Withdrawal of applicationpublished on 15.07.2009  [2009/29]
Applicant(s)For all designated states
National Institute of Advanced Industrial Science and Technology
3-1, Kasumigaseki 1-chome, Chiyoda-ku
Tokyo 100-0013 / JP
For all designated states
Nippon Sheet Glass Co., Ltd.
7-28, Kitahama 4-chome, Chuo-ku Osaka-shi
Osaka 541-0041 / JP
[N/P]
Former [2003/18]For all designated states
National Institute of Advanced Industrial Science and Technology
3-1, Kasumigaseki 1-chome, Chiyoda-ku
Tokyo 100-0013 / JP
For all designated states
Nippon Sheet Glass Co., Ltd.
7-28, Kitahama 4-chome, Chuo-ku
Osaka-shi, Osaka 541-0041 / JP
Inventor(s)01 / NISHII, Junji, Nat. Inst. of advanced Ind. science
and Technology Kansai Sentah, 1-8-31, Midorigaoka
Ikeda-shi, Osaka 563-0026 / JP
02 / KOYAMA, Tadashi
Nippon Sheet Glass Co. Ltd. 7-28, Kitahama Chuo-ku
Osaka-shi, Osaka 541-0041 / JP
03 / YAMAGUCHI, Jun
Nippon Sheet Glass Co. Ltd. 7-28, Kitahama Chuo-ku
Osaka-shi Osaka 541-0041 / JP
 [2003/18]
Representative(s)Hoffmann Eitle
Patent- und Rechtsanwälte PartmbB
Arabellastrasse 30
81925 München / DE
[N/P]
Former [2003/18]HOFFMANN - EITLE
Patent- und Rechtsanwälte Arabellastrasse 4
81925 München / DE
Application number, filing date01948029.216.07.2001
[2003/18]
WO2001JP06138
Priority number, dateJP2000021682418.07.2000         Original published format: JP 2000216824
[2003/18]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO0206560
Date:24.01.2002
Language:EN
[2002/04]
Type: A1 Application with search report 
No.:EP1306464
Date:02.05.2003
Language:EN
The application published by WIPO in one of the EPO official languages on 24.01.2002 takes the place of the publication of the European patent application.
[2003/18]
Search report(s)International search report - published on:JP24.01.2002
(Supplementary) European search report - dispatched on:EP19.12.2007
ClassificationIPC:H01L21/316, H01L21/308, H01L21/311, C23C16/40, C03C15/00
[2008/03]
CPC:
C23C16/56 (EP,US); C03C15/00 (EP,US); C03C17/245 (EP,US);
C03C17/3694 (EP,US); C23C16/401 (EP,US); H01L21/02131 (EP,US);
H01L21/02274 (EP,US); H01L21/31629 (US); C03C2217/213 (EP,US);
C03C2217/91 (EP,US); C03C2218/152 (EP,US); C03C2218/33 (EP,US);
H01L21/31111 (EP,US); H01L21/31612 (US); Y10T428/24355 (EP,US);
Y10T428/24942 (EP,US); Y10T428/265 (EP,US); Y10T428/31 (EP,US);
Y10T428/315 (EP,US) (-)
Former IPC [2003/18]C23C16/40, C03C15/00, H01L21/308
Designated contracting statesBE,   DE,   FI,   FR,   GB [2004/22]
Former [2003/18]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:GRADUIERTES MATERIAL UND VERFAHREN ZU SEINER SYNTHESE UND VERFAHREN ZU SEINER VERARBEITUNG[2003/18]
English:GRADED MATERIAL AND METHOD FOR SYNTHESIS THEREOF AND METHOD FOR PROCESSING THEREOF[2003/18]
French:MATERIAU CALIBRE ET SES PROCEDES DE SYNTHESE ET DE TRAITEMENT[2003/18]
Entry into regional phase17.01.2003Translation filed 
17.01.2003National basic fee paid 
17.01.2003Search fee paid 
17.01.2003Designation fee(s) paid 
17.01.2003Examination fee paid 
Examination procedure19.12.2001Request for preliminary examination filed
International Preliminary Examining Authority: JP
17.01.2003Examination requested  [2003/18]
03.06.2009Application withdrawn by applicant  [2009/29]
Fees paidRenewal fee
25.07.2003Renewal fee patent year 03
28.07.2004Renewal fee patent year 04
25.07.2005Renewal fee patent year 05
26.07.2006Renewal fee patent year 06
17.07.2007Renewal fee patent year 07
25.07.2008Renewal fee patent year 08
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Documents cited:Search[XY]EP0822585  (APPLIED MATERIALS INC [US]) [X] 1-5 * page 8, line 21 - page 9, line 15; figure 3; table 1 * * page 9, line 35 - page 10, line 9; figure 5 * * page 10, lines 17-21 * [Y] 6;
 [XY]GB2325938  (NEC CORP [JP]) [X] 1-4 * page 6, lines 5-13,24-28 * * page 13, line 13 - page 15, line 17; figure 1 * * page 20, line 11 - page 22, line 11 * [Y] 6;
 [Y]US5976973  (OHIRA KOICHIRO [JP], et al) [Y] 6 * column 1, lines 40-45 *;
 [A]  - ISHII K ET AL, "Effects of fluorine addition on the structure and optical properties of SiO2 films formed by plasma-enhanced chemical vapor deposition", JOURNAL OF APPLIED PHYSICS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, (19970201), vol. 81, no. 3, ISSN 0021-8979, page 1470, XP012041531 [A] 1-5 * the whole document *

DOI:   http://dx.doi.org/10.1063/1.363900
International search[X]JPS63131542  (KANSAI NIPPON ELECTRIC);
 [X]JPH01232744  (MATSUSHITA ELECTRONICS CORP);
 [X]JPH1187310  (KOREA ELECTRONICS TELECOMM);
 [Y]  - KEISUKE ISHII ET AL., "Fusso tenka ga ECVD-SiO2 hakumaku no kouzou oyobi kougaku tokusei ni oyobosu eikyou", DENKI GAKAI YUUDEN ZETSUEN ZAIRYOU KENKYUUKAI SHIRYOU, (1996), pages 109 - 117, DEI-96-144, XP002947544
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.