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EP1342259

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Extract from the Register of European Patents

EP About this file: EP1342259

EP1342259 - SEMICONDUCTOR WAFER PROCESSING TO INCREASE THE USABLE PLANAR SURFACE AREA [Right-click to bookmark this link]
Status	The application is deemed to be withdrawn Status updated on 27.06.2014 Database last updated on 01.02.2025
Most recent event Tooltip	27.06.2014	Application deemed to be withdrawn	published on 30.07.2014 [2014/31]
Applicant(s)	For all designated states Transform Solar Pty Ltd. Level 45 Australia Square 264-278 George Street Sydney, NSW 2000 / AU
	[2010/33]
Former [2004/12]	For all designated states Origin Energy Solar Pty.Ltd 50 Bridge Street Sydney, NSW 2000 / AU
Former [2003/37]	For all designated states Origin Energy Retail Limited Level 6, 1 King William Street Adelaide, S.A. 5000 / AU
Inventor(s)	01 / WEBER, Klaus, Johannes 2 Wolgal Place Aranda, ACT 2614 / AU
	02 / BLAKERS, Andrew, William 3 Marawa Place Aranda, ACT 2614 / AU
	[2003/37]
Representative(s)	Bates, Philip Ian Reddie & Grose LLP The White Chapel Building 10 Whitechapel High Street London E1 8QS / GB
	[N/P]
Former [2003/37]	Bates, Philip Ian Reddie & Grose 16 Theobalds Road London WC1X 8PL / GB
Application number, filing date	01998992.0	29.11.2001
	[2003/37]
	WO2001AU01546
Priority number, date	AU2000PR01748	29.11.2000 Original published format: AU PR174800
	[2010/50]
Former [2003/37]	AU2000PP01748	29.11.2000
Filing language	EN
Procedural language	EN
Publication	Type:	A1 Application with search report
	No.:	WO0245143
	Date:	06.06.2002
	Language:	EN
	[2002/23]
	Type:	A1 Application with search report
	No.:	EP1342259
	Date:	10.09.2003
	Language:	EN
	The application published by WIPO in one of the EPO official languages on 06.06.2002 takes the place of the publication of the European patent application.
	[2003/37]
Search report(s)	International search report - published on:	AU	06.06.2002
	(Supplementary) European search report - dispatched on:	EP	22.02.2006
Classification	IPC:	H01L31/18, H01L31/0352, H01L31/0216, H01L31/048	[2006/14]
	CPC:	H10F71/121 (EP,US); H01L21/302 (KR); H10F10/14 (EP,US); H10F19/902 (EP,US); H10F71/00 (EP,US); H10F71/137 (EP,US); (+) H10F77/147 (EP,US); H10F77/488 (EP,US); Y02E10/52 (EP,US); Y02E10/547 (EP,US); Y02P70/50 (EP,US) (-)
	Former IPC [2005/46]	H01L31/18, H01L31/0352
	Former IPC [2005/23]	H01L21/78, H01L21/301, B23K101/40
	Former IPC [2003/37]	H01L21/301, B23K101/40
Designated contracting states	AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR [2003/37]
Extension states	AL	Not yet paid
	LT	Not yet paid
	LV	Not yet paid
	MK	Not yet paid
	RO	Not yet paid
	SI	Not yet paid
Title	German:	HALBLEITER-WAFER-VERARBEITUNG ZUR VERGRÖSSERUNG DES BENUTZBAREN PLANAREN OBERFLÄCHENINHALTS	[2003/37]
	English:	SEMICONDUCTOR WAFER PROCESSING TO INCREASE THE USABLE PLANAR SURFACE AREA	[2003/37]
	French:	TRAITEMENT D'UNE TRANCHE A SEMI-CONDUCTEURS PERMETTANT D'AUGMENTER L'ETENDUE DE LA SURFACE PLANE UTILE	[2003/37]
Entry into regional phase	27.05.2003	National basic fee paid
	27.05.2003	Search fee paid
	27.05.2003	Designation fee(s) paid
	27.05.2003	Examination fee paid
Examination procedure	17.06.2002	Request for preliminary examination filed International Preliminary Examining Authority: AU
	27.05.2003	Examination requested [2003/37]
	29.06.2006	Despatch of a communication from the examining division (Time limit: M06)
	19.12.2006	Reply to a communication from the examining division
	04.11.2008	Despatch of a communication from the examining division (Time limit: M06)
	13.05.2009	Reply to a communication from the examining division
	14.03.2011	Despatch of a communication from the examining division (Time limit: M06)
	26.09.2011	Reply to a communication from the examining division
	10.10.2011	Despatch of a communication from the examining division (Time limit: M06)
	02.08.2012	Reply to a communication from the examining division
	20.08.2012	Despatch of a communication from the examining division (Time limit: M06)
	04.06.2013	Reply to a communication from the examining division
	29.07.2013	Despatch of a communication from the examining division (Time limit: M06)
	11.02.2014	Application deemed to be withdrawn, date of legal effect [2014/31]
	07.03.2014	Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2014/31]
Divisional application(s)	EP05076099.0 / EP1575087
	EP10184614.5 / EP2273556
	EP10184727.5 / EP2267789
	EP10184828.1 / EP2267790
	The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 29.06.2006
Request for further processing for:	The application is deemed to be withdrawn due to failure to reply to the examination report
	04.06.2013	Request for further processing filed
	04.06.2013	Full payment received (date of receipt of payment) Request granted
	19.06.2013	Decision despatched
	The application is deemed to be withdrawn due to failure to reply to the examination report
	27.07.2012	Request for further processing filed
	27.07.2012	Full payment received (date of receipt of payment) Request granted
	13.08.2012	Decision despatched
Fees paid	Renewal fee
	12.11.2003	Renewal fee patent year 03
	12.11.2004	Renewal fee patent year 04
	14.11.2005	Renewal fee patent year 05
	14.11.2006	Renewal fee patent year 06
	15.11.2007	Renewal fee patent year 07
	31.03.2008	Renewal fee patent year 08
	10.11.2009	Renewal fee patent year 09
	12.11.2010	Renewal fee patent year 10
	14.11.2011	Renewal fee patent year 11
	13.11.2012	Renewal fee patent year 12
	18.11.2013	Renewal fee patent year 13
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[X]JPS5810873 ;
		[Y]GB1383165 (MITSUBISHI ELECTRIC CORP);
		[A]US4409423 (HOLT JAMES F [US]);
		[X]US4444992 (COX III CHARLES H [US]);
		[A]US4633031 (TODOROF WILLIAM J [US]);
		[XY]US5266125 (RAND JAMES A [US], et al);
		[X]DE19907506 (HITACHI LTD [JP]);
		[X]EP0991129 (KANEKA CORP [JP]);
		[X]US6066516 (MIYASAKA MITSUTOSHI [JP]);
		[X]WO0062348 (BRIDGESTONE CORP [JP], et al);
		[E]EP1182710 (BRIDGESTONE CORP [JP]);
	International search	[X]JPH1190923 ;
		[X]JPS63295500 ;
		[A]JPH08274371 ;
		[A]JPH10193338 ;
		[X]JPH1174234 ;
		[Y]US5139974 (SANDHU GURTEJ S [US], et al);
		[Y]WO9809318 (ADVANCED MICRO DEVICES INC [US]);

The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.

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