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Extract from the Register of European Patents

EP About this file: EP1261036

EP1261036 - Power MOSFET semiconductor device and method of manufacturing the same [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  01.01.2010
Database last updated on 03.09.2024
Most recent event   Tooltip01.01.2010Application deemed to be withdrawnpublished on 03.02.2010  [2010/05]
Applicant(s)For all designated states
Kabushiki Kaisha Toshiba
1-1, Shibaura 1-chome, Minato-ku
Tokyo / JP
[N/P]
Former [2002/48]For all designated states
Kabushiki Kaisha Toshiba
1-1, Shibaura 1-chome, Minato-ku
Tokyo / JP
Inventor(s)01 / Izumisawa, Masaru, Intellectual Property Division
Kabushiki Kaisha Toshiba, 1-1, Shibaura 1-chome
Minato-ku, Tokyo 105-8001 / JP
02 / Kouzuki, Shigeo, Intellectual Property Division
Kabushiki Kaisha Toshiba, 1-1, Shibaura 1-chome
Minato-ku, Tokyo 105-8001 / JP
03 / Hodama, Shinichi, Intellectual Property Division
Kabushiki Kaisha Toshiba, 1-1, Shibaura 1-chome
Minato-ku, Tokyo 105-8001 / JP
 [2002/48]
Representative(s)Hoffmann Eitle
Patent- und Rechtsanwälte PartmbB
Arabellastrasse 30
81925 München / DE
[N/P]
Former [2002/48]HOFFMANN - EITLE
Patent- und Rechtsanwälte Arabellastrasse 4
81925 München / DE
Application number, filing date02011514.322.05.2002
[2002/48]
Priority number, dateJP2001015748525.05.2001         Original published format: JP 2001157485
[2002/48]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1261036
Date:27.11.2002
Language:EN
[2002/48]
Type: A3 Search report 
No.:EP1261036
Date:28.07.2004
[2004/31]
Search report(s)(Supplementary) European search report - dispatched on:EP15.06.2004
ClassificationIPC:H01L29/78, H01L21/336
[2004/31]
CPC:
H01L29/7802 (EP,US); H01L29/78 (KR); H01L29/0634 (EP,US);
H01L29/66712 (EP,US); H01L21/26586 (EP,US); H01L29/0653 (EP,US);
H01L29/0847 (EP,US) (-)
Former IPC [2002/48]H01L29/78, H01L29/08, H01L29/06, H01L21/336
Designated contracting statesDE,   FR,   GB,   IT [2005/16]
Former [2002/48]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  TR 
TitleGerman:Leistungs-MOSFET-Halbleiteranordnung und Verfahren zu deren Herstellung[2002/48]
English:Power MOSFET semiconductor device and method of manufacturing the same[2002/48]
French:Dispositif semi-conducteur MOSFET de puissance et sa méthode de fabrication[2002/48]
Examination procedure22.05.2002Examination requested  [2002/48]
23.06.2005Despatch of a communication from the examining division (Time limit: M06)
30.12.2005Reply to a communication from the examining division
02.03.2009Despatch of a communication from the examining division (Time limit: M04)
13.08.2009Application deemed to be withdrawn, date of legal effect  [2010/05]
18.09.2009Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2010/05]
Fees paidRenewal fee
13.05.2004Renewal fee patent year 03
12.05.2005Renewal fee patent year 04
23.03.2006Renewal fee patent year 05
14.05.2007Renewal fee patent year 06
28.03.2008Renewal fee patent year 07
12.05.2009Renewal fee patent year 08
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Documents cited:Search[X]GB2089118  (PHILIPS ELECTRONIC ASSOCIATED) [X] 1-3,6-13,16-21 * page 3, column 2, line 68 - page 4, column 1, line 14; figures 1,4 *;
 [X]DE19604043  (SIEMENS AG [DE]) [X] 1,4,5,7-11,14,15,17-21 * abstract * * column 3, line 44 - column 4, line 40; figures 1,2,6 *;
 [XA]DE19748523  (SIEMENS AG [DE]) [X] 1,4-7,9-11,14-18,20,21 * abstract * * column 4, line 33 - column 6, line 18; figures 3-5 * [A] 22-28;
 [XA]  - NITTA T ET AL, "EXPERIMENTAL RESULTS AND SIMULATION ANALYSIS OF 250V SUPER TRENCH POWER MOSFET (STM)", 12TH. INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND IC S.ISPSD 2000. PROCEEDINGS. TOULOUSE, FRANCE, MAY 22 - 25, 2000, INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & IC'S, NEW YORK, NY: IEEE, US, (20000522), ISBN 0-7803-6269-1, pages 77 - 80, XP000987837 [X] 1,2,7-10 * the whole document * [A] 22-28

DOI:   http://dx.doi.org/10.1109/ISPSD.2000.856777
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.