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EP1260822
European procedure
Extract from the Register of European Patents
EP About this file: EP1260822
| EP1260822 - Automatic test equipment for semiconductor device [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 14.04.2006 Database last updated on 14.03.2026 | Most recent event Tooltip | 14.04.2006 | No opposition filed within time limit | published on 31.05.2006 [2006/22] | Applicant(s) | For all designated states Teradyne, Inc. 321 Harrison Avenue Boston Massachusetts 02118-2238 / US | [N/P] |
| Former [2002/48] | For all designated states TERADYNE, INC. 321 Harrison Avenue Boston, Massachusetts 02118-2238 / US | Inventor(s) | 01 /
Sartschev, Ronald A. 81 Park Hurst Road Dunstable, Massachusetts 01827 / US | 02 /
Muething, Gerald F., Jr. 6143 Anchor Lane Rockledge, Florida 32955 / US | [2005/22] |
| Former [2002/48] | 01 /
Sartschev, Ronald A. 81 Park Hurst Road Dunstable, Massachusetts 01827 / US | ||
| 02 /
Meuthing, Gerald F., Jr. 6143 Anchor Lane Rockledge, Florida 32955 / US | Representative(s) | Luckhurst, Anthony Henry William Marks & Clerk LLP 90 Long Acre London WC2E 9RA / GB | [N/P] |
| Former [2002/48] | Luckhurst, Anthony Henry William MARKS & CLERK, 57-60 Lincoln's Inn Fields London WC2A 3LS / GB | Application number, filing date | 02013298.1 | 22.07.1998 | [2002/48] | Priority number, date | US19970906532 | 05.08.1997 Original published format: US 906532 | [2002/48] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1260822 | Date: | 27.11.2002 | Language: | EN | [2002/48] | Type: | A3 Search report | No.: | EP1260822 | Date: | 25.06.2003 | [2003/26] | Type: | B1 Patent specification | No.: | EP1260822 | Date: | 08.06.2005 | Language: | EN | [2005/23] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 09.05.2003 | Classification | IPC: | G01R31/319, H03K5/13 | [2003/26] | CPC: |
H03L7/0805 (EP,US);
G01R31/3191 (EP,US);
G01R31/31922 (EP,US);
H03K5/131 (EP,US);
H03K5/133 (EP,US);
H03L7/0816 (EP,US);
H03K2005/00026 (EP,US);
H03K2005/00065 (EP,US);
H03K2005/00071 (EP,US);
|
| Former IPC [2002/48] | G01R31/319 | Designated contracting states | DE, FR, GB, IE, IT, SE [2002/48] | Title | German: | Automatisches Schaltkreisprüfgerät für Halbleitervorrichtungen | [2002/48] | English: | Automatic test equipment for semiconductor device | [2002/48] | French: | Appareil de test automatique de circuits à semi-conducteurs | [2002/48] | Examination procedure | 24.06.2002 | Examination requested [2002/48] | 28.11.2003 | Despatch of a communication from the examining division (Time limit: M06) | 15.07.2004 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time | 15.09.2004 | Reply to a communication from the examining division | 05.11.2004 | Communication of intention to grant the patent | 15.03.2005 | Fee for grant paid | 15.03.2005 | Fee for publishing/printing paid | Parent application(s) Tooltip | EP98935953.4 / EP1000364 | Opposition(s) | 09.03.2006 | No opposition filed within time limit [2006/22] | Request for further processing for: | 15.09.2004 | Request for further processing filed | 16.09.2004 | Full payment received (date of receipt of payment) Request granted | 01.10.2004 | Decision despatched | Fees paid | Renewal fee | 24.06.2002 | Renewal fee patent year 03 | 24.06.2002 | Renewal fee patent year 04 | 24.06.2002 | Renewal fee patent year 05 | 23.07.2003 | Renewal fee patent year 06 | 22.07.2004 | Renewal fee patent year 07 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | SE | 08.09.2005 | [2005/50] | Documents cited: | Search | [Y] WO9705498 (TERADYNE INC et al.) [Y] 1 * page 14, line 12 - page 14, line 33; figure 2A * | [Y] US5146121 (SEARLES SHAWN et al.) [Y] 1 * column 2, line 13 - column 2, line 22; figure 1 * | [A] DE19625225 (ADVANTEST CORP et al.) [A] 1 * column 4, line 39 - column 4, line 55; figure 1 * | [A] US5179303 (SEARLES SHAWN et al.) [A] 1 * figure 1 * |