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Extract from the Register of European Patents

EP About this file: EP1265188

EP1265188 - Pattern extraction apparatus and method [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  19.08.2005
Database last updated on 12.07.2024
Most recent event   Tooltip07.07.2006Lapse of the patent in a contracting state
New state(s): FR
published on 09.08.2006  [2006/32]
Applicant(s)For all designated states
FUJITSU LIMITED
1-1, Kamikodanaka 4-chome, Nakahara-ku Kawasaki-shi
Kanagawa 211-8588 / JP
[N/P]
Former [2002/50]For all designated states
FUJITSU LIMITED
1-1, Kamikodanaka 4-chome, Nakahara-ku
Kawasaki-shi, Kanagawa 211-8588 / JP
Inventor(s)01 / Takebe, Hiroaki, Fujitsu Ltd.
4-1-1, Kamikodanaka, Nakahara-ku
Kawasaki-shi, Kanagawa 211-8588 / JP
 [2002/50]
Representative(s)Stebbing, Timothy Charles, et al
Haseltine Lake LLP
Lincoln House, 5th Floor
300 High Holborn
London WC1V 7JH / GB
[N/P]
Former [2002/50]Stebbing, Timothy Charles, et al
Haseltine Lake & Co., Imperial House, 15-19 Kingsway
London WC2B 6UD / GB
Application number, filing date02019040.126.11.1998
[2002/50]
Priority number, dateJP1998014619927.05.1998         Original published format: JP 14619998
JP1997035135319.12.1997         Original published format: JP 35135397
[2002/50]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1265188
Date:11.12.2002
Language:EN
[2002/50]
Type: B1 Patent specification 
No.:EP1265188
Date:13.10.2004
Language:EN
[2004/42]
Search report(s)(Supplementary) European search report - dispatched on:EP17.10.2002
ClassificationIPC:G06K9/20, G06K9/34
[2002/50]
CPC:
G06V30/414 (EP,US); G06V10/10 (KR); G06V30/416 (EP,US)
Designated contracting statesDE,   FR,   GB [2003/36]
Former [2002/50]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Gerät und Verfahren zur Musterextraktion[2002/50]
English:Pattern extraction apparatus and method[2002/50]
French:Appareil et méthode d'extraction de formes[2002/50]
Examination procedure07.01.2003Examination requested  [2003/11]
06.06.2003Despatch of a communication from the examining division (Time limit: M06)
15.10.2003Reply to a communication from the examining division
23.04.2004Communication of intention to grant the patent
16.08.2004Fee for grant paid
16.08.2004Fee for publishing/printing paid
Parent application(s)   TooltipEP98309724.7  / EP0924639
Opposition(s)14.07.2005No opposition filed within time limit [2005/40]
Fees paidRenewal fee
09.09.2002Renewal fee patent year 03
09.09.2002Renewal fee patent year 04
27.11.2002Renewal fee patent year 05
27.11.2003Renewal fee patent year 06
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Lapses during opposition  TooltipFR13.10.2004
DE01.06.2005
[2006/32]
Former [2006/13]DE01.06.2005
Documents cited:SearchJPH05233873  [ ];
 [XA]US5757957  (TACHIKAWA MICHIYOSHI [JP]) [X] 1,4 * column 7, line 34 - line 42 * * abstract * * column 6, line 43 - line 51 * [A] 2,3,5-7
    [ ] - PATENT ABSTRACTS OF JAPAN, (19931220), vol. 17, no. 696, Database accession no. (P - 1664), & JP05233873 A 19930910 (RICOH CO LTD) [ ] * abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.