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Extract from the Register of European Patents

EP About this file: EP1295559

EP1295559 - Method and apparatus for measuring optical aberrations of an eye [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  28.09.2007
Database last updated on 29.10.2024
Most recent event   Tooltip28.09.2007Application deemed to be withdrawnpublished on 31.10.2007  [2007/44]
Applicant(s)For all designated states
Carl Zeiss Ophthalmic Systems, Inc.
5160 Hacienda Drive Dublin
California / US
[N/P]
Former [2003/13]For all designated states
Carl Zeiss Ophthalmic Systems, Inc.
5160 Hacienda Drive
Dublin, California / US
Inventor(s)01 / Lai, Ming
P.O. Box 10846
Pleasanton, CA, 94588 / US
02 / Wei, Jay
397 Indian Hill Place
Fremont, CA, 94539 / US
03 / Meyer, Scott A.
994 Verona Avenue
Livermore, CA, 94550 / US
04 / Foley, James P.
457 Maar Avenue
Fremont, CA, 94536 / US
05 / Horn, Jochen M.
4852 Bernal Avenue, Apt. 1
Pleasanton, CA, 94566 / US
 [2003/13]
Representative(s)Gnatzig, Klaus
Carl Zeiss
Patentabteilung
73446 Oberkochen / DE
[N/P]
Former [2003/13]Gnatzig, Klaus
Carl Zeiss Patentabteilung
73446 Oberkochen / DE
Application number, filing date02020272.711.09.2002
[2003/13]
Priority number, dateUS2001096011321.09.2001         Original published format: US 960113
[2003/13]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1295559
Date:26.03.2003
Language:EN
[2003/13]
Type: A3 Search report 
No.:EP1295559
Date:12.05.2004
[2004/20]
Search report(s)(Supplementary) European search report - dispatched on:EP19.03.2004
ClassificationIPC:A61B3/103
[2003/13]
CPC:
A61B3/1015 (EP,US); A61B3/156 (EP,US)
Designated contracting statesDE,   ES,   FR,   GB,   IT [2005/05]
Former [2003/13]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  SK,  TR 
TitleGerman:Verfahren und Vorrichtung zur Messung optischer Aberrationen eines Auges[2003/13]
English:Method and apparatus for measuring optical aberrations of an eye[2003/13]
French:Méthode et dispositif pour mesurer des aberrations optiques d'oeil[2003/13]
Examination procedure05.11.2004Amendment by applicant (claims and/or description)
05.11.2004Examination requested  [2005/01]
13.11.2004Loss of particular rights, legal effect: designated state(s)
16.03.2005Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, FI, GR, IE, LU, MC, NL, PT, SE, SK, TR
27.10.2006Despatch of a communication from the examining division (Time limit: M06)
08.05.2007Application deemed to be withdrawn, date of legal effect  [2007/44]
13.06.2007Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2007/44]
Fees paidRenewal fee
07.09.2004Renewal fee patent year 03
15.09.2005Renewal fee patent year 04
14.09.2006Renewal fee patent year 05
Penalty fee
Penalty fee Rule 85a EPC 1973
20.12.2004AT   M01   Not yet paid
20.12.2004BE   M01   Not yet paid
20.12.2004BG   M01   Not yet paid
20.12.2004CH   M01   Not yet paid
20.12.2004CY   M01   Not yet paid
20.12.2004CZ   M01   Not yet paid
20.12.2004DK   M01   Not yet paid
20.12.2004EE   M01   Not yet paid
20.12.2004FI   M01   Not yet paid
20.12.2004GR   M01   Not yet paid
20.12.2004IE   M01   Not yet paid
20.12.2004LU   M01   Not yet paid
20.12.2004MC   M01   Not yet paid
20.12.2004NL   M01   Not yet paid
20.12.2004PT   M01   Not yet paid
20.12.2004SE   M01   Not yet paid
20.12.2004SK   M01   Not yet paid
20.12.2004TR   M01   Not yet paid
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[Y]US4011403  (EPSTEIN MAX, et al) [Y] 1-5,20,21 * column 3, line 17 - line 30 *;
 [Y]US5929970  (MIHASHI TOSHIFUMI [JP]) [Y] 1-5,20,21,23,24 * column 2, line 54 - line 64 * * column 11, line 52 - column 12, line 35 * * column 13, line 26 - line 43; figure 8 *;
 [A]FR2775779  (MICRO MODULE [FR]) [A] 21* page 5, line 1 - line 26 *;
 [XY]EP0962184  (WELCH ALLYN INC [US]) [X] 9-15 * column 8, line 9 - line 47 * * column 13, line 21 - line 37 * [Y] 23,24;
 [XA]WO0010448  (AUTONOMOUS TECHNOLOGIES CORP [US]) [X] 6-8,17,18,22 * page 6, line 27 - page 7, line 32 * * page 8, line 22 - page 9, line 25 * [A] 1-5,20,21;
 [X]WO0158339  (WAVEFRONT SCIENCES INC [US], et al) [X] 6-8,16-19,22,25 * page 9, line 3 - page 10, line 19 * * page 12, line 4 - page 13, line 12 *;
 [A]WO0160241  (MARSHALL IAN [GB]) [A] 6,9,13,16,17,19 * page 6, line 19 - page 8, line 2 *;
 [LPX]WO0189372  (ZEISS CARL [DE], et al) [LPX] 16,19 * application originating from the same inventor *; page 5, line 7 - line 24 *;
 [X]  - HAMAM H, "A direct technique for calculating the profile of aberration of the eye measured by a modified Hartmann-Shack apparatus", OPTICS COMMUNICATIONS, NORTH-HOLLAND PUBLISHING CO. AMSTERDAM, NL, (200001), vol. 173, no. 1-6, ISSN 0030-4018, pages 23 - 36, XP004191510 [X] 16,19,25 * 5 Setup; 6 Detection System *; page 27 - page 31; figures 3,4 *

DOI:   http://dx.doi.org/10.1016/S0030-4018(99)00623-9
 [X]  - SALMON T O ET AL, "COMPARISON OF THE EYE'S WAVE-FRONT ABERRATION MEASURED PSYCHOPHYSICALLY AND WITH THE SHACK-HARTMANN WAVE-FRONT SENSOR", JOURNAL OF THE OPTICAL SOCIETY OF AMERICA - A, OPTICAL SOCIETY OF AMERICA, WASHINGTON, US, (199809), vol. 15, no. 9, ISSN 1084-7529, pages 2457 - 2465, XP001041250 [X] 16,19 * 2A Shack-Hartmann Wave-Front Sensor *; page 2459 - page 2460 *
 [A]  - IWAI T ET AL, "SPECKLE REDUCTION IN COHERENT INFORMATION PROCESSING", PROCEEDINGS OF THE IEEE, IEEE. NEW YORK, US, (19960501), vol. 84, no. 5, ISSN 0018-9219, pages 765 - 781, XP000591804 [A] 1-3 * page 770, column R, line 4 - line 13 *

DOI:   http://dx.doi.org/10.1109/5.488745
 [A]  - TAKEUCHI N ET AL, "Wavefront distortion measurement of a SR extraction mirror for the beam profile monitor using Shack-Hartmann method", PARTICLE ACCELERATOR CONFERENCE, 1997. PROCEEDINGS OF THE 1997 VANCOUVER, BC, CANADA 12-16 MAY 1997, PISCATAWAY, NJ, USA,IEEE, US, (19970512), ISBN 0-7803-4376-X, pages 859 - 861, XP002181680 [A] 1,6,9,13,16,17,19-25 * page 859, column R, line 13 - page 860, column L, line 25; figure 2 *

DOI:   http://dx.doi.org/10.1109/PAC.1997.749861
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