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Extract from the Register of European Patents

EP About this file: EP1275946

EP1275946 - Arrangement for measuring the temperature of an electronic circuit [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  05.08.2005
Database last updated on 02.11.2024
Most recent event   Tooltip16.10.2009Change - applicantpublished on 18.11.2009  [2009/47]
Applicant(s)For all designated states
Philips Intellectual Property & Standards GmbH
Steindamm 94
20099 Hamburg / DE
For all designated states
Koninklijke Philips Electronics N.V.
Groenewoudseweg 1
5621 BA Eindhoven / NL
[N/P]
Former [2009/47]For all designated states
Philips Intellectual Property & Standards GmbH
Steindamm 94
20099 Hamburg / DE
For all designated states
Koninklijke Philips Electronics N.V.
Groenewoudseweg 1
5621 BA Eindhoven / NL
Former [2003/20]For all designated states
Philips Intellectual Property & Standards GmbH
Steindamm 94
20099 Hamburg / DE
For all designated states
Koninklijke Philips Electronics N.V.
Groenewoudseweg 1
5621 BA Eindhoven / NL
Former [2003/03]For all designated states
Philips Corporate Intellectual Property GmbH
20099 Hamburg / DE
For all designated states
Koninklijke Philips Electronics N.V.
Groenewoudseweg 1
5621 BA Eindhoven / NL
Inventor(s)01 / Bisping, Michael, c/o Philips Corp.Int.Prop.GmbH
Weisshausstrasse 2
52066, Aachen / DE
02 / Jabs, Hermann, c/o Philips Corp.Int.Prop.GmbH
Weisshausstrasse 2
52066, Aachen / DE
03 / Marschner, Jürgen, c/o Philips Corp.Int.Prop.GmbH
Weisshausstrasse 2
52066, Aachen / DE
 [2003/03]
Representative(s)Volmer, Georg, et al
Philips Intellectual Property & Standards GmbH
Postfach 50 04 42
52088 Aachen / DE
[N/P]
Former [2009/31]Volmer, Georg, et al
Philips Intellectual Property & Standards GmbH Postfach 50 04 42
52088 Aachen / DE
Former [2003/03]Volmer, Georg, Dipl.-Ing., et al
Philips Corporate Intellectual Property GmbH, Postfach 50 04 42
52088 Aachen / DE
Application number, filing date02100791.909.07.2002
[2003/03]
Priority number, dateDE200113373611.07.2001         Original published format: DE 10133736
[2003/03]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP1275946
Date:15.01.2003
Language:DE
[2003/03]
Search report(s)(Supplementary) European search report - dispatched on:EP11.10.2002
ClassificationIPC:G01K7/01
[2003/03]
CPC:
G01K7/01 (EP,US)
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   SK,   TR [2003/03]
TitleGerman:Anordnung zum Messen der Temperatur einer elektronischen Schaltung[2003/03]
English:Arrangement for measuring the temperature of an electronic circuit[2003/03]
French:Agencement pour mesurer la température d'un circuit électronique[2003/03]
Examination procedure15.07.2003Examination requested  [2003/38]
29.07.2005Application withdrawn by applicant  [2005/38]
Fees paidRenewal fee
02.08.2004Renewal fee patent year 03
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Documents cited:Search[A]US5961215  (LEE THOMAS H [US], et al) [A] 1-8,12* abstract *;
 [X]  - HOLDAWAY M, "FACTORS AFFECTING ACCURACY IN SILICON DIGITAL TEMPERATURE SENSORS", ELECTRONIC ENGINEERING, MORGAN-GRAMPIAN LTD. LONDON, GB, (200001), vol. 72, no. 876, ISSN 0013-4902, pages 26 - 27,29-30, XP000945903 [X] 1-7 * the whole document *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.