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Extract from the Register of European Patents

EP About this file: EP1391940

EP1391940 - SEMICONDUCTOR RADIATION DETECTING ELEMENT [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  12.09.2008
Database last updated on 14.09.2024
Most recent event   Tooltip13.08.2010Lapse of the patent in a contracting state
New state(s): TR		published on 15.09.2010  [2010/37]
Applicant(s)For all designated states
Acrorad Co., Ltd.
13-23, Aza-Suzaki Gushikawa-shi
Okinawa 904-2234 / JP
[2007/45]
Former [2004/09]For all designated states
Acrorad Co., Ltd.
13-23, Aza-Suzaki
Gushikawa-shi, Okinawa 904-2234 / JP
Inventor(s)01 / MORIYAMA, Miki, Kyoto University
Yoshida-honmachi, Sakyo-Ku
Kyoto-shi, Kyoto 606-8501 / JP
02 / MURAKAMI, Masaki, Kyoto University
Yoshida-honmachi, Sakyo-Ku
Kyoto-shi, Kyoto 606-8501 / JP
03 / KYAN, Atsushi, ACRORAD CO., LTD.
13-23, Aza-Suzaki
Gushikawa-Shi, Okinawa 904-2234 / JP
04 / OHNO, Ryoichi, ACRORAD CO., LTD.
13-23, Aza-Suzaki
Gushikawa-Shi, Okinawa 904-2234 / JP
 [2004/09]
Representative(s)Müller-Boré & Partner Patentanwälte PartG mbB
Friedenheimer Brücke 21
80639 München / DE
[N/P]
Former [2004/09]Müller-Boré & Partner Patentanwälte
Grafinger Strasse 2
81671 München / DE
Application number, filing date02718533.911.04.2002
[2004/09]
WO2002JP03615
Priority number, dateJP2001014431315.05.2001         Original published format: JP 2001144313
[2004/09]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO02093654
Date:21.11.2002
Language:EN
[2002/47]
Type: A1 Application with search report 
No.:EP1391940
Date:25.02.2004
Language:EN
The application published by WIPO in one of the EPO official languages on 21.11.2002 takes the place of the publication of the European patent application.
[2004/09]
Type: B1 Patent specification 
No.:EP1391940
Date:07.11.2007
Language:EN
[2007/45]
Search report(s)International search report - published on:JP21.11.2002
(Supplementary) European search report - dispatched on:EP12.07.2006
ClassificationIPC:H01L31/118, H01L31/032, H01L31/0224
[2007/19]
CPC:
H01L31/022408 (EP,US); H01L31/0296 (EP,US); H01L31/032 (EP,US);
H01L31/118 (EP,US)
Former IPC [2004/09]H01L31/0296, G01T1/24
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   TR [2004/09]
TitleGerman:HALBLEITER-STRAHLUNGSDETEKTIONSELEMENT[2007/19]
English:SEMICONDUCTOR RADIATION DETECTING ELEMENT[2004/09]
French:ELEMENT DE DETECTION DE RADIATIONS A SEMICONDUCTEURS[2004/09]
Former [2004/09]HALBLEITERSTRAHLUNGSDETEKTIONSELEMENT
Entry into regional phase06.11.2003Translation filed 
06.11.2003National basic fee paid 
06.11.2003Search fee paid 
06.11.2003Designation fee(s) paid 
06.11.2003Examination fee paid 
Examination procedure04.07.2002Request for preliminary examination filed
International Preliminary Examining Authority: JP
06.11.2003Examination requested  [2004/09]
24.11.2006Despatch of a communication from the examining division (Time limit: M04)
22.03.2007Reply to a communication from the examining division
07.05.2007Communication of intention to grant the patent
17.09.2007Fee for grant paid
17.09.2007Fee for publishing/printing paid
Opposition(s)08.08.2008No opposition filed within time limit [2008/42]
Fees paidRenewal fee
28.04.2004Renewal fee patent year 03
27.04.2005Renewal fee patent year 04
30.03.2006Renewal fee patent year 05
26.04.2007Renewal fee patent year 06
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT07.11.2007
BE07.11.2007
CH07.11.2007
CY07.11.2007
DK07.11.2007
LI07.11.2007
NL07.11.2007
TR07.11.2007
SE07.02.2008
GR08.02.2008
ES18.02.2008
PT07.04.2008
IE11.04.2008
LU11.04.2008
MC30.04.2008
[2010/37]
Former [2010/32]AT07.11.2007
BE07.11.2007
CH07.11.2007
CY07.11.2007
DK07.11.2007
LI07.11.2007
NL07.11.2007
SE07.02.2008
GR08.02.2008
ES18.02.2008
PT07.04.2008
IE11.04.2008
LU11.04.2008
MC30.04.2008
Former [2009/33]AT07.11.2007
BE07.11.2007
CH07.11.2007
CY07.11.2007
DK07.11.2007
LI07.11.2007
NL07.11.2007
SE07.02.2008
GR08.02.2008
ES18.02.2008
PT07.04.2008
IE11.04.2008
MC30.04.2008
Former [2009/23]AT07.11.2007
BE07.11.2007
CH07.11.2007
DK07.11.2007
LI07.11.2007
NL07.11.2007
SE07.02.2008
GR08.02.2008
ES18.02.2008
PT07.04.2008
IE11.04.2008
MC30.04.2008
Former [2009/13]AT07.11.2007
BE07.11.2007
CH07.11.2007
DK07.11.2007
LI07.11.2007
NL07.11.2007
SE07.02.2008
GR08.02.2008
ES18.02.2008
PT07.04.2008
MC30.04.2008
Former [2008/51]AT07.11.2007
BE07.11.2007
CH07.11.2007
DK07.11.2007
LI07.11.2007
NL07.11.2007
SE07.02.2008
ES18.02.2008
PT07.04.2008
MC30.04.2008
Former [2008/42]AT07.11.2007
BE07.11.2007
CH07.11.2007
DK07.11.2007
LI07.11.2007
NL07.11.2007
SE07.02.2008
ES18.02.2008
PT07.04.2008
Former [2008/40]AT07.11.2007
BE07.11.2007
CH07.11.2007
DK07.11.2007
LI07.11.2007
NL07.11.2007
SE07.02.2008
ES18.02.2008
Former [2008/35]AT07.11.2007
CH07.11.2007
DK07.11.2007
LI07.11.2007
NL07.11.2007
SE07.02.2008
ES18.02.2008
Former [2008/29]AT07.11.2007
CH07.11.2007
LI07.11.2007
NL07.11.2007
SE07.02.2008
ES18.02.2008
Former [2008/23]CH07.11.2007
LI07.11.2007
NL07.11.2007
SE07.02.2008
ES18.02.2008
Documents cited:Search[X]US6011264  (LACHISH URI [IL], et al) [X] 1 * column 6, line 57 - column 7, line 39 * * column 3, line 48 - column 4, line 47; figures 1,2 *;
 [A]  - TAKAHASHI T ET AL, "High-resolution Schottky CdTe diode for hard X-ray and gamma-ray astronomy", NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, SECTION - A: ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT, ELSEVIER, AMSTERDAM, NL, (19991021), vol. 436, no. 1-2, ISSN 0168-9002, pages 111 - 119, XP004182082 [A] 1 * page 112 - page 113 *

DOI:   http://dx.doi.org/10.1016/S0168-9002(99)00606-3
International search[A]JPS5630771  (MATSUSHITA ELECTRIC IND CO LTD);
 [A]WO8600940  (HUGHES AIRCRAFT CO [US]);
 [A]JPS62115391  (NIPPON MINING CO);
 [A]JPH03248578  (NIPPON MINING CO);
 [A]JPH07221340  (HITACHI CHEMICAL CO LTD);
 [A]  - MATSUMOTO ET AL., "Performance of a new Schottky CdTe detector for hard X-ray spectroscopy", NUCLEAR SCIENCE SYMPOSIUM, IEEE, (1997), vol. 1, pages 569 - 573, XP002951843
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.