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Extract from the Register of European Patents

EP About this file: EP1504414

EP1504414 - METHOD FOR BRANCH SELECTION FOR PROBE ALIGNMENT [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  22.07.2011
Database last updated on 09.09.2024
Most recent event   Tooltip13.09.2013Lapse of the patent in a contracting state
Updated state(s): BG
published on 16.10.2013  [2013/42]
Applicant(s)For all designated states
Koninklijke Philips Electronics N.V.
Groenewoudseweg 1
5621 BA Eindhoven / NL
[2010/37]
Former [2005/06]For all designated states
Koninklijke Philips Electronics N.V.
Groenewoudseweg 1
5621 BA Eindhoven / NL
Inventor(s)01 / BRUIJNS, Johannes
Prof. Holstlaan 6
NL-5656 AA Eindhoven / NL
 [2005/06]
Representative(s)Cohen, Julius Simon
Philips Intellectual Property & Standards
High Tech Campus 5
5656 AE Eindhoven / NL
[N/P]
Former [2005/06]Cohen, Julius Simon
Philips Intellectual Property & Standards, P.O. Box 220
5600 AE Eindhoven / NL
Application number, filing date02775089.214.10.2002
[2005/06]
WO2002IB04270
Priority number, dateEP2001020393916.10.2001         Original published format: EP 01203939
[2005/06]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO03034337
Date:24.04.2003
Language:EN
[2003/17]
Type: A2 Application without search report 
No.:EP1504414
Date:09.02.2005
Language:EN
The application published by WIPO in one of the EPO official languages on 24.04.2003 takes the place of the publication of the European patent application.
[2005/06]
Type: B1 Patent specification 
No.:EP1504414
Date:15.09.2010
Language:EN
[2010/37]
Search report(s)International search report - published on:EP11.11.2004
ClassificationIPC:G06T7/00
[2010/13]
CPC:
G06T7/00 (EP,US)
Former IPC [2005/06]G06T1/00
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   SK,   TR [2005/06]
TitleGerman:VERFAHREN ZUR AUSWAHL VON ÄSTEN FÜR DAS AUSRICHTEN VON SONDEN[2005/06]
English:METHOD FOR BRANCH SELECTION FOR PROBE ALIGNMENT[2005/06]
French:PROCEDE DE SELECTION DE BRANCHES PERMETTANT D'ORIENTER UNE SONDE[2005/06]
Entry into regional phase17.05.2004National basic fee paid 
11.05.2005Designation fee(s) paid 
11.05.2005Examination fee paid 
Examination procedure11.05.2005Examination requested  [2005/28]
07.04.2010Communication of intention to grant the patent
09.08.2010Fee for grant paid
09.08.2010Fee for publishing/printing paid
Opposition(s)16.06.2011No opposition filed within time limit [2011/34]
Fees paidRenewal fee
02.11.2004Renewal fee patent year 03
31.10.2005Renewal fee patent year 04
31.10.2006Renewal fee patent year 05
31.10.2007Renewal fee patent year 06
28.03.2008Renewal fee patent year 07
02.11.2009Renewal fee patent year 08
Opt-out from the exclusive  Tooltip
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Patent Court
See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT15.09.2010
BE15.09.2010
CY15.09.2010
CZ15.09.2010
DK15.09.2010
EE15.09.2010
FI15.09.2010
IT15.09.2010
NL15.09.2010
SE15.09.2010
SK15.09.2010
TR15.09.2010
IE14.10.2010
LU14.10.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
BG15.12.2010
GB15.12.2010
GR16.12.2010
ES26.12.2010
PT17.01.2011
[2013/42]
Former [2012/47]AT15.09.2010
BE15.09.2010
BG15.09.2010
CY15.09.2010
CZ15.09.2010
DK15.09.2010
EE15.09.2010
FI15.09.2010
IT15.09.2010
NL15.09.2010
SE15.09.2010
SK15.09.2010
TR15.09.2010
IE14.10.2010
LU14.10.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
GB15.12.2010
GR16.12.2010
ES26.12.2010
PT17.01.2011
Former [2012/44]AT15.09.2010
BE15.09.2010
BG15.09.2010
CY15.09.2010
CZ15.09.2010
DK15.09.2010
EE15.09.2010
FI15.09.2010
IT15.09.2010
NL15.09.2010
SE15.09.2010
SK15.09.2010
IE14.10.2010
LU14.10.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
GB15.12.2010
GR16.12.2010
ES26.12.2010
PT17.01.2011
Former [2012/41]AT15.09.2010
BE15.09.2010
BG15.09.2010
CY15.09.2010
CZ15.09.2010
DK15.09.2010
EE15.09.2010
FI15.09.2010
IT15.09.2010
NL15.09.2010
SE15.09.2010
SK15.09.2010
IE14.10.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
GB15.12.2010
GR16.12.2010
ES26.12.2010
PT17.01.2011
Former [2012/01]AT15.09.2010
BE15.09.2010
CY15.09.2010
CZ15.09.2010
DK15.09.2010
EE15.09.2010
FI15.09.2010
IT15.09.2010
NL15.09.2010
SE15.09.2010
SK15.09.2010
IE14.10.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
GB15.12.2010
GR16.12.2010
ES26.12.2010
PT17.01.2011
Former [2011/47]AT15.09.2010
BE15.09.2010
CY15.09.2010
CZ15.09.2010
DK15.09.2010
EE15.09.2010
FI15.09.2010
IT15.09.2010
NL15.09.2010
SE15.09.2010
SK15.09.2010
IE14.10.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
GR16.12.2010
ES26.12.2010
PT17.01.2011
Former [2011/38]AT15.09.2010
BE15.09.2010
CY15.09.2010
CZ15.09.2010
DK15.09.2010
EE15.09.2010
FI15.09.2010
IT15.09.2010
NL15.09.2010
SE15.09.2010
SK15.09.2010
CH31.10.2010
LI31.10.2010
MC31.10.2010
GR16.12.2010
ES26.12.2010
PT17.01.2011
Former [2011/31]AT15.09.2010
BE15.09.2010
CY15.09.2010
CZ15.09.2010
EE15.09.2010
FI15.09.2010
IT15.09.2010
NL15.09.2010
SE15.09.2010
SK15.09.2010
MC31.10.2010
GR16.12.2010
ES26.12.2010
PT17.01.2011
Former [2011/24]AT15.09.2010
CY15.09.2010
CZ15.09.2010
EE15.09.2010
FI15.09.2010
NL15.09.2010
SE15.09.2010
SK15.09.2010
MC31.10.2010
GR16.12.2010
PT17.01.2011
Former [2011/23]AT15.09.2010
CY15.09.2010
CZ15.09.2010
EE15.09.2010
FI15.09.2010
SE15.09.2010
SK15.09.2010
GR16.12.2010
Former [2011/15]AT15.09.2010
CY15.09.2010
FI15.09.2010
SE15.09.2010
GR16.12.2010
Former [2011/13]AT15.09.2010
CY15.09.2010
FI15.09.2010
Former [2011/10]AT15.09.2010
FI15.09.2010
Former [2011/08]AT15.09.2010
Cited inInternational search[A]US6048314  (NIKOM JACOB [US]) [A] 1-7 * abstract * * column 1, line 21 - column 3, line 25 *;
 [A]WO0079481  (MASSACHUSETTS INST TECHNOLOGY [US], et al) [A] 1-7* abstract *;
 [A]WO0126055  (KONINKL PHILIPS ELECTRONICS NV [NL], et al) [A] 1-7 * the whole document *;
 [PA]WO0250768  (KONINKL PHILIPS ELECTRONICS NV [NL]) [PA] 1-7 * the whole document *;
 [PX]  - BRUIJNS J, "Fully-automatic branch labelling of voxel vessel structures", PROCEEDINGS OF VMV 2001, STUTTGART, GERMANY, NOVEMBER 21-23, 2001, ISBN 3-89838-028-9, (20011121), pages 341 - 350, URL: http://www.vis.uni-stuttgart.de/vmv01/dl/papers/25.pdf, (20040713), XP002288273 [PX] 1-7 * the whole document *
 [DA]  - BRUIJNS J, "SEMI-AUTOMATIC SHAPE EXTRACTION FROM TUBE-LIKE GEOMETRY", INTERNATIONAL WORKSHOP ON VISION, MODELING AND VISUALIZATION. PROCEEDINGS, XX, XX, (20001122), pages 347 - 355, XP008016087 [DA] 1-7 * the whole document *
 [A]  - WINK O ET AL, "FAST QUANTIFICATION OF ABDOMINAL AORTIC ANEURYSMS FROM CTA VOLUMES", MEDICAL IMAGE COMPUTING AND COMPUTER-ASSISTED INTERVENTION. MICCAI. INTERNATIONAL CONFERENCE. PROCEEDINGS, XX, XX, (1998), pages 138 - 145, XP000974692 [A] 1-7 * the whole document *
 [A]  - WINDYGA P ET AL, "THREE-DIEMENSIONAL RECONSTRUCTION OF THE CORONARY ARTERIES USING A PRIORI KNOWLEDGE", MEDICAL AND BIOLOGICAL ENGINEERING AND COMPUTING, PETER PEREGRINUS LTD. STEVENAGE, GB, (19980301), vol. 36, no. 2, ISSN 0140-0118, pages 158 - 164, XP000739381 [A] 1-7 * the whole document *

DOI:   http://dx.doi.org/10.1007/BF02510737
 [A]  - SONKA M ET AL, "ADAPTIVE APPROACH TO ACCURATE ANALYSIS OF SMALL-DIAMETER VESSELS INCINEANGIOGRAMS", IEEE TRANSACTIONS ON MEDICAL IMAGING, IEEE INC. NEW YORK, US, (19970201), vol. 16, no. 1, ISSN 0278-0062, pages 87 - 95, XP000685493 [A] 1-7 * the whole document *

DOI:   http://dx.doi.org/10.1109/42.552058
 [A]  - CHUN KEE JEON ET AL, "A new approach to the estimation of diameters in coronary arteriograms", REAL-TIME IMAGING, ACADEMIC PRESS LIMITED, GB, (199812), vol. 4, no. 6, ISSN 1077-2014, pages 443 - 454, XP002157151 [A] 1-7 * the whole document *

DOI:   http://dx.doi.org/10.1006/rtim.1997.0112
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