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Extract from the Register of European Patents

EP About this file: EP1447233

EP1447233 - Offset and screen combination printing method [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  17.02.2012
Database last updated on 11.09.2024
Most recent event   Tooltip17.02.2012No opposition filed within time limitpublished on 21.03.2012  [2012/12]
Applicant(s)For all designated states
TAIYI Precision Tech Corp.
59, Wu-Chung 7 Road, Wu Ku Industry Park
Taipei County / TW
[2011/15]
Former [2004/34]For all designated states
Taiyi Precision Tech Corp.
59, Wu-Chun 7 Road, Wu Ku Industry Park
Taipei County / TW
Inventor(s)01 / Huang, Jui Peng TAIYI Precision Tech Corporation
59, Wu-Chung 7 Road, Wu Ku Industry Park
Taipei County / TW
 [2004/34]
Representative(s)Viering, Jentschura & Partner mbB Patent- und Rechtsanwälte
Grillparzerstrasse 14
81675 München / DE
[N/P]
Former [2008/28]Viering, Jentschura & Partner
Postfach 22 14 43
80504 München / DE
Former [2004/34]Viering, Jentschura & Partner
Steinsdorfstrasse 6
80538 München / DE
Application number, filing date03002996.111.02.2003
[2004/34]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1447233
Date:18.08.2004
Language:EN
[2004/34]
Type: B1 Patent specification 
No.:EP1447233
Date:13.04.2011
Language:EN
[2011/15]
Search report(s)(Supplementary) European search report - dispatched on:EP04.08.2003
ClassificationIPC:B41M1/30, B29C45/14, B41M3/00
[2004/34]
CPC:
B41M1/06 (EP,US); B41M1/12 (EP,US); B41M1/40 (EP,US);
B41M3/008 (EP,US); B29C45/14688 (EP,US)
Designated contracting statesDE,   FI,   FR,   GB,   IT [2005/19]
Former [2004/34]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE,  SI,  SK,  TR 
TitleGerman:Kombination von Offsetdruckverfahren und Siebdruckverfahren[2004/34]
English:Offset and screen combination printing method[2004/34]
French:Méthode d'impression avec une combinaison d'impression offset et impression sérigraphique[2004/34]
Examination procedure30.12.2004Examination requested  [2005/10]
19.02.2005Loss of particular rights, legal effect: designated state(s)
21.06.2005Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, GR, HU, IE, LU, MC, NL, PT, SE, SI, SK, TR
17.02.2009Despatch of a communication from the examining division (Time limit: M06)
03.08.2009Reply to a communication from the examining division
13.11.2009Despatch of a communication from the examining division (Time limit: M04)
12.03.2010Reply to a communication from the examining division
07.09.2010Communication of intention to grant the patent
29.12.2010Fee for grant paid
29.12.2010Fee for publishing/printing paid
Opposition(s)16.01.2012No opposition filed within time limit [2012/12]
Fees paidRenewal fee
28.02.2005Renewal fee patent year 03
28.02.2006Renewal fee patent year 04
28.02.2007Renewal fee patent year 05
29.02.2008Renewal fee patent year 06
02.03.2009Renewal fee patent year 07
01.03.2010Renewal fee patent year 08
28.02.2011Renewal fee patent year 09
Penalty fee
Penalty fee Rule 85a EPC 1973
30.03.2005AT   M01   Not yet paid
30.03.2005BE   M01   Not yet paid
30.03.2005BG   M01   Not yet paid
30.03.2005CH   M01   Not yet paid
30.03.2005CY   M01   Not yet paid
30.03.2005CZ   M01   Not yet paid
30.03.2005DK   M01   Not yet paid
30.03.2005EE   M01   Not yet paid
30.03.2005ES   M01   Not yet paid
30.03.2005GR   M01   Not yet paid
30.03.2005HU   M01   Not yet paid
30.03.2005IE   M01   Not yet paid
30.03.2005LU   M01   Not yet paid
30.03.2005MC   M01   Not yet paid
30.03.2005NL   M01   Not yet paid
30.03.2005PT   M01   Not yet paid
30.03.2005SE   M01   Not yet paid
30.03.2005SI   M01   Not yet paid
30.03.2005SK   M01   Not yet paid
30.03.2005TR   M01   Not yet paid
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Documents cited:Search[A]JPH06305296  ;
 [A]JPH08207499  ;
 [A]US4037008  (TUGWELL DENNIS H) [A] 1-12 * column 2, line 53 - column 7, line 51; figure 6 *;
 [A]DE4139253  (GIEHL OTMAR [DE]) [A] 1-12 * column 2, line 43 - line 65; figures 1,2 *;
 [A]WO0218149  (PEKONEN JUKKA [FI], et al) [A] 1-12 * page 2, line 31 - page 3, line 18; figures 1-4 *;
 [A]EP1188534  (NOKIA CORP [FI]) [A] 1-12 * paragraph [0027] - paragraph [0030]; figure 6 *;
 [A]US6396444  (GOWARD JASON [GB], et al) [A] * column 1, line 34 - column 2, line 26 *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19950331), vol. 1995, no. 02, & JP06305296 A 19941101 (ASAHI CHEM IND CO LTD) [A] 1-12 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19961226), vol. 1996, no. 12, & JP08207499 A 19960813 (TAKAMIZAWA YUKIO;TSUZUKI YAKUMO) [A] 1,7 * abstract *
by applicantUS4037008
 EP1188534
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.