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Extract from the Register of European Patents

EP About this file: EP1378797

EP1378797 - Wavefront aberration correction system [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  10.11.2006
Database last updated on 06.07.2024
Most recent event   Tooltip06.06.2008Change - representativepublished on 09.07.2008  [2008/28]
Applicant(s)For all designated states
NIKON CORPORATION
Fuji Building
2-3 Marunouchi 3-chome
Chiyoda-ku
Tokyo 100-8331 / JP
[N/P]
Former [2004/02]For all designated states
Nikon Corporation
Fuji Building, 2-3 Marunouchi 3-chome, Chiyoda-ku
Tokyo 100-8331 / JP
Inventor(s)01 / Margeson, Christopher S.
250 West El Camino Real No. 5110
Sunnyvale, CA 94087 / US
 [2004/14]
Former [2004/02]01 / Margeson, Christopher S.
250 West El Camino Real
Sunnyvale, CA 94087 / US
Representative(s)Viering, Jentschura & Partner mbB Patent- und Rechtsanwälte
Grillparzerstrasse 14
81675 München / DE
[N/P]
Former [2008/28]Viering, Jentschura & Partner
Postfach 22 14 43
80504 München / DE
Former [2004/02]Viering, Jentschura & Partner
Patent- und Rechtsanwälte, Steinsdorfstr. 6
80538 München / DE
Application number, filing date03013975.220.06.2003
[2004/02]
Priority number, dateUS20020391114P21.06.2002         Original published format: US 391114 P
[2004/02]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1378797
Date:07.01.2004
Language:EN
[2004/02]
Type: A3 Search report 
No.:EP1378797
Date:07.09.2005
[2005/36]
Search report(s)(Supplementary) European search report - dispatched on:EP27.07.2005
ClassificationIPC:G03F7/20, G02B26/06
[2005/36]
CPC:
G03F7/70233 (EP,US); G02B26/06 (EP,US); G03F7/70266 (EP,US)
Former IPC [2004/02]G03F7/20, G02B7/185
Designated contracting states(deleted) [2006/21]
Former [2004/02]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:System zur Korrektur von Wellenfrontaberrationen[2004/02]
English:Wavefront aberration correction system[2004/02]
French:Système de correction d' abérrations du front d' onde[2004/02]
Examination procedure08.03.2006Application deemed to be withdrawn, date of legal effect  [2006/50]
10.07.2006Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [2006/50]
Fees paidRenewal fee
30.06.2005Renewal fee patent year 03
Penalty fee
Penalty fee Rule 85a EPC 1973
20.04.2006AT   M01   Not yet paid
20.04.2006BE   M01   Not yet paid
20.04.2006BG   M01   Not yet paid
20.04.2006CH   M01   Not yet paid
20.04.2006CY   M01   Not yet paid
20.04.2006CZ   M01   Not yet paid
20.04.2006DE   M01   Not yet paid
20.04.2006DK   M01   Not yet paid
20.04.2006EE   M01   Not yet paid
20.04.2006ES   M01   Not yet paid
20.04.2006FI   M01   Not yet paid
20.04.2006FR   M01   Not yet paid
20.04.2006GB   M01   Not yet paid
20.04.2006GR   M01   Not yet paid
20.04.2006HU   M01   Not yet paid
20.04.2006IE   M01   Not yet paid
20.04.2006IT   M01   Not yet paid
20.04.2006LU   M01   Not yet paid
20.04.2006MC   M01   Not yet paid
20.04.2006NL   M01   Not yet paid
20.04.2006PT   M01   Not yet paid
20.04.2006RO   M01   Not yet paid
20.04.2006SE   M01   Not yet paid
20.04.2006SI   M01   Not yet paid
20.04.2006SK   M01   Not yet paid
20.04.2006TR   M01   Not yet paid
Penalty fee Rule 85b EPC 1973
20.04.2006M01   Not yet paid
Additional fee for renewal fee
30.06.200604   M06   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]US5774274  (SCHACHAR RONALD A [US]) [X] 1,2,6,7,11 * column 2, lines 47-61 * * column 7, line 51 - column 8, line 21 * * column 8, lines 61-67 * * figures 1,9 *;
 [A]US6084332  (LAFIANDRA CARLO [US]) [A] 1-15* column 1, lines 19-47 *;
 [X]US6307688  (MERZ ERICH [DE], et al) [X] 1-15 * column 1, line 45 - column 2, line 21 * * column 3, lines 30-39 * * claim 1 * * figures 1-4 *;
 [XA]US2002011573  (VAN DIJSSELDONK ANTONIUS JOHAN [NL], et al) [X] 1-3,6-8,11-15 * paragraphs [0002] , [0015] , [0019] * * figures 6,7 * [A] 4,5,9,10;
 [XA]  - HARDY J W, "ACTIVE OPTICS: A NEW TECHNOLOGY FOR THE CONTROL OF LIGHT", PROCEEDINGS OF THE IEEE, IEEE. NEW YORK, US, (197806), vol. 66, no. 6, ISSN 0018-9219, pages 651 - 697, XP009016126 [X] 1-10 * page 675, column 2, lines 20-24 * * page 676, column 1, lines 7-11 * * figure 21 * [A] 11-15
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.