Deutsch English Français

Contact

EP1398836

European procedure

Quick help

Maintenance news

Scheduled maintenance

Regular maintenance outages:
between 05.00 and 05.15 hrs CET (Monday to Sunday).

Other outages
Availability

2022.02.11

More...

News flashes

News Flashes

New version of the European Patent Register – SPC proceedings information in the Unitary Patent Register.

2024-07-24

More...

Extract from the Register of European Patents

EP About this file: EP1398836

EP1398836 - Differential amplifier comprising thin film transistors with different threshold voltages [Right-click to bookmark this link]
Former [2004/12]	Thin film semiconductor device and manufacturing method
	[2021/12]
Status	No opposition filed within time limit Status updated on 27.05.2022 Database last updated on 05.10.2024
Former	The patent has been granted Status updated on 18.06.2021
Former	Grant of patent is intended Status updated on 07.04.2021
Former	Examination is in progress Status updated on 28.12.2017
Most recent event Tooltip	27.05.2022	No opposition filed within time limit	published on 29.06.2022 [2022/26]
Applicant(s)	For all designated states Gold Charm Limited Offshore Chambers P.O.Box 217 Apia / WS
	[2021/29]
Former [2013/08]	For all designated states Gold Charm Limited Offshore Chambers P.O.Box 217 Apia / WS
Former [2004/12]	For all designated states NEC CORPORATION 7-1, Shiba 5-chome, Minato-ku Tokyo / JP
Inventor(s)	01 / Tsuchi, Hiroshi NEC Corporation 7-1, Shiba 5-chome Minato-ku, Tokyo / JP
	02 / Sera, Kenji NEC Corporation 7-1, Shiba 5-chome Minato-ku, Tokyo / JP
	[2021/29]
Former [2004/12]	01 / Tsuchi, Hiroshi NEC Corporation, 7-1, Shiba 5-chome Minato-ku, Tokyo / JP
	02 / Sera, Kenji NEC Corporation, 7-1, Shiba 5-chome Minato-ku, Tokyo / JP
Representative(s)	CMS Cameron McKenna Nabarro Olswang LLP Cannon Place 78 Cannon Street London EC4N 6AF / GB
	[2021/29]
Former [2013/08]	Gray, John James, et al Murgitroyd & Company Scotland House 165-169 Scotland Street Glasgow G5 8PL / GB
Former [2004/12]	Glawe, Delfs, Moll & Partner Patentanwälte Postfach 26 01 62 80058 München / DE
Application number, filing date	03020276.6	08.09.2003
	[2004/12]
Priority number, date	JP20020263606	10.09.2002 Original published format: JP 2002263606
	JP20030285780	04.08.2003 Original published format: JP 2003285780
	[2004/12]
Filing language	EN
Procedural language	EN
Publication	Type:	A2 Application without search report
	No.:	EP1398836
	Date:	17.03.2004
	Language:	EN
	[2004/12]
	Type:	A3 Search report
	No.:	EP1398836
	Date:	27.09.2006
	[2006/39]
	Type:	B1 Patent specification
	No.:	EP1398836
	Date:	21.07.2021
	Language:	EN
	[2021/29]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	25.08.2006
Classification	IPC:	H01L27/12, G11C7/06	[2021/12]
	CPC:	H01L27/127 (EP,US); G11C7/062 (EP,US); H01L27/1218 (EP,US); H03F3/45192 (EP,US); H03F3/45219 (EP,US); H03K19/0016 (EP,US); (+) H03K5/2481 (EP,US) (-)
	Former IPC [2006/39]	H01L27/12, H01L21/84, G11C7/06, H03K5/24, H03F3/45
	Former IPC [2004/12]	H01L27/12, H01L21/84
Designated contracting states	DE, GB [2021/29]
Former [2007/22]	DE, GB
Former [2004/12]	AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LI, LU, MC, NL, PT, RO, SE, SI, SK, TR
Title	German:	Differentialverstärker mit Dünnfilmtransistoren mit unterschiedlichen Schwellspannungen	[2021/18]
	English:	Differential amplifier comprising thin film transistors with different threshold voltages	[2021/18]
	French:	Amplificateur différentiel comprenant des transistors à couche mince avec différentes tensions de seuil	[2021/12]
	Former [2004/12]	Dünnfilm-Halbleiterbauelement und Herstellungsverfahren
	Former [2004/12]	Thin film semiconductor device and manufacturing method
	Former [2004/12]	Dispositif semiconducteur à couche mince et son procédé de fabrication
Examination procedure	31.08.2006	Examination requested [2006/42]
	06.11.2006	Despatch of a communication from the examining division (Time limit: M06)
	14.05.2007	Reply to a communication from the examining division
	16.06.2010	Despatch of a communication from the examining division (Time limit: M06)
	27.10.2010	Reply to a communication from the examining division
	15.01.2015	Despatch of a communication from the examining division (Time limit: M04)
	29.04.2015	Reply to a communication from the examining division
	14.12.2017	Despatch of a communication from the examining division (Time limit: M04)
	13.04.2018	Reply to a communication from the examining division
	30.10.2018	Despatch of a communication from the examining division (Time limit: M04)
	21.02.2019	Reply to a communication from the examining division
	05.08.2019	Despatch of a communication from the examining division (Time limit: M04)
	04.12.2019	Reply to a communication from the examining division
	02.01.2020	Despatch of a communication from the examining division (Time limit: M04)
	08.04.2020	Reply to a communication from the examining division
	29.05.2020	Despatch of a communication from the examining division (Time limit: M04)
	24.09.2020	Reply to a communication from the examining division
	08.04.2021	Communication of intention to grant the patent
	10.06.2021	Fee for grant paid
	10.06.2021	Fee for publishing/printing paid
	10.06.2021	Receipt of the translation of the claim(s)
Divisional application(s)	EP07020221.3 / EP1873786
	The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 06.11.2006
Opposition(s)	22.04.2022	No opposition filed within time limit [2022/26]
Fees paid	Renewal fee
	20.09.2005	Renewal fee patent year 03
	21.09.2006	Renewal fee patent year 04
	24.09.2007	Renewal fee patent year 05
	28.03.2008	Renewal fee patent year 06
	22.09.2009	Renewal fee patent year 07
	21.09.2010	Renewal fee patent year 08
	22.09.2011	Renewal fee patent year 09
	21.09.2012	Renewal fee patent year 10
	09.09.2013	Renewal fee patent year 11
	29.09.2014	Renewal fee patent year 12
	25.09.2015	Renewal fee patent year 13
	26.09.2016	Renewal fee patent year 14
	11.09.2017	Renewal fee patent year 15
	25.09.2018	Renewal fee patent year 16
	13.09.2019	Renewal fee patent year 17
	14.09.2020	Renewal fee patent year 18
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[DA]JPH08264798 ;
		[XA]JPS61100010 ;
		[A]JPH0729381 ;
		[XA]US4446390 (ALASPA ALLAN A [US]) [X] 18,19 * the whole document * [A] 12-14;
		[X]US4872010 (LARSON LAWRENCE E [US], et al) [X] 1-4 * column 4, line 31 - column 5, line 27; table 1 *;
		[A]US5162681 (LEE JEONG-RYEOL [KR]) [A] 20-52 * column 1, line 56 - line 61; figures 1,2 *;
		[A]EP0614226 (TEXAS INSTRUMENTS INC [US]) [A] 1-11,15-17 * the whole document *;
		[A]US5461713 (PASCUCCI LUIGI [IT]) [A] 18,19 * column 6, line 65 - column 7, line 22 *;
		[A]EP0690510 (NIPPON TELEGRAPH & TELEPHONE [JP]) [A] 12-14 * the whole document *;
		[A]EP0809362 (NIPPON TELEGRAPH & TELEPHONE [JP]) [A] 12-14 * the whole document *;
		[X]US5808934 (KUBO KAZUAKI [JP], et al) [X] 21-52 * column 7, line 13 - line 27; figure 14 *;
		[XY]US5889291 (KOYAMA JUN [JP], et al) [X] 18,19 * column 6, line 50 - column 7, line 61; figures 2A-2E * [Y] 12-14;
		[Y]US6034563 (MASHIKO KOICHIRO [JP]) [Y] 12-14 * column 10, line 44 - line 47 *;
		[A]US6191435 (INOUE SHUNSUKE [JP]) [A] 1-11,15-17 * column 9, paragraph 17 - paragraph 41 *;
		[A]US6190952 (XIANG QI [US], et al) [A] 1-11,15-17 * the whole document *;
		[A]US6215159 (FUJITA TETSUYA [JP], et al) [A] 12-14 * abstract *;
		[A]EP1091491 (INFINEON TECHNOLOGIES AG [DE]) [A] 20-52 * column 1, paragraph 4 - paragraph 5 *;
		[A]US6246221 (XI XIAOYU [US]) [A] 24-34 * column 3, line 35 - line 45 *;
		[XA]US6306709 (MIYAGI MASANORI [JP], et al) [X] 15,16 * column 21, line 53 - column 23, line 5 * [A] 1-11,17;
		[X]US2001035774 (KOTANI NAOKI [JP]) [X] 1-11,15-17,20 * page 1, paragraph 12 - page 2, paragraph 20 *;
		[A]US6353244 (YAMAZAKI SHUNPEI [JP], et al) [A] 1-11,15-17* the whole document *;
		[A]EP1217662 (UNIV LOUVAIN [BE]) [A] 12-14 * page 2, paragraph 4 *;
		[A]US2002088971 (TEZUKA TSUTOMU [JP], et al) [A] 1-11,15-17 * the whole document *;
		[A]US2002096723 (AWAKA KAORU [JP]) [A] 12-14 * page 1, paragraph 8 - paragraph 9 *;
		[X]US2002098635 (ZHANG HONGYONG [JP], et al) [X] 18,19 * page 7, paragraph 98 - page 8, paragraph 113 *
		[DA] - PATENT ABSTRACTS OF JAPAN, (19970228), vol. 1997, no. 02, & JP08264798 A 19961011 (SEMICONDUCTOR ENERGY LAB CO LTD) [DA] 1-11,15-17 * abstract *
		[XA] - PATENT ABSTRACTS OF JAPAN, (19860920), vol. 010, no. 279, Database accession no. (E - 439), & JP61100010 A 19860519 (SONY CORP) [X] 21-23,35-52 * abstract * [A] 24-34
		[A] - PATENT ABSTRACTS OF JAPAN, (19950531), vol. 1995, no. 04, & JP07029381 A 19950131 (OKI MICRO DESIGN MIYAZAKI:KK; others: 01) [A] 20-52 * abstract *

The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.

Legal notice
Terms of use
24.2.25; 34p