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EP1420257
European procedure
Extract from the Register of European Patents
EP About this file: EP1420257
| EP1420257 - Apparatus for detecting defects [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 07.08.2009 Database last updated on 03.09.2024 | Most recent event Tooltip | 07.08.2009 | No opposition filed within time limit | published on 09.09.2009 [2009/37] | Applicant(s) | For all designated states NISSIN KOGYO CO., LTD. No. 840, Ohaza Kokubo Ueda-shi Nagano-ken / JP | [2008/40] |
| Former [2004/21] | For all designated states NISSIN KOGYO CO., LTD. No. 840, Ohaza Kokubu Ueda-shi, Nagano-ken / JP | Inventor(s) | 01 /
Amada, Junichi, Nissin Kogyo Co., Ltd. Development Center 801 Kazawa, Toubu-machi Chisagata-gun Nagano 389-0514 / JP | 02 /
Tuchiya, Tomoharu, Nissin Kogyo Co., Ltd. Development Center 801 Kazawa, Toubu-machi Chisagata-gun Nagano 389-0514 / JP | [2004/21] | Representative(s) | Hoffmann Eitle Patent- und Rechtsanwälte PartmbB Arabellastrasse 30 81925 München / DE | [N/P] |
| Former [2004/21] | HOFFMANN - EITLE Patent- und Rechtsanwälte Arabellastrasse 4 81925 München / DE | Application number, filing date | 03026032.7 | 12.11.2003 | [2004/21] | Priority number, date | JP20020328711 | 12.11.2002 Original published format: JP 2002328711 | [2004/21] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1420257 | Date: | 19.05.2004 | Language: | EN | [2004/21] | Type: | A3 Search report | No.: | EP1420257 | Date: | 01.12.2004 | [2004/49] | Type: | B1 Patent specification | No.: | EP1420257 | Date: | 01.10.2008 | Language: | EN | [2008/40] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 19.10.2004 | Classification | IPC: | G01R31/00, G01R31/28 | [2004/49] | CPC: |
G01R31/282 (EP,US)
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| Former IPC [2004/21] | G01R31/00 | Designated contracting states | DE, GB [2005/34] |
| Former [2004/21] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LI, LU, MC, NL, PT, RO, SE, SI, SK, TR | Title | German: | Vorrichtung zur Fehlererkennung | [2004/21] | English: | Apparatus for detecting defects | [2004/21] | French: | Dispositif pour détecter des défauts | [2004/21] | Examination procedure | 23.03.2005 | Examination requested [2005/21] | 31.08.2006 | Despatch of a communication from the examining division (Time limit: M04) | 10.01.2007 | Reply to a communication from the examining division | 10.04.2008 | Communication of intention to grant the patent | 25.07.2008 | Fee for grant paid | 25.07.2008 | Fee for publishing/printing paid | Opposition(s) | 02.07.2009 | No opposition filed within time limit [2009/37] | Fees paid | Renewal fee | 21.11.2005 | Renewal fee patent year 03 | 23.11.2006 | Renewal fee patent year 04 | 26.11.2007 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]WO0103987 (KELSEY HAYES CO [US]) [A] 1* claim 1 * |