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EP1335402
European procedure
Extract from the Register of European Patents
EP About this file: EP1335402
| EP1335402 - Wien filter and electron microscope using same [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 12.05.2017 Database last updated on 02.11.2024 | Most recent event Tooltip | 08.12.2017 | Lapse of the patent in a contracting state | published on 10.01.2018 [2018/02] | Applicant(s) | For all designated states JEOL LTD. 1-2, Musashino 3-chome Akishima Tokyo 196-8558 / JP | [N/P] |
| Former [2016/27] | For all designated states JEOL Ltd. 1-2, Musashino 3-chome Akishima Tokyo 196-8558 / JP | ||
| Former [2003/33] | For all designated states Jeol Ltd. 1-2, Musashino 3-chome Akishima, Tokyo 196-8558 / JP | Inventor(s) | 01 /
Lopez, Martinez G. c/o Complutense University 28040 Madrid / ES | 02 /
Tsuno, Katsushige 10-11, Mihoricho 2-chome Akishima, Tokyo 196-0001 / JP | [2003/33] | Representative(s) | Boult Wade Tennant LLP Salisbury Square House 8 Salisbury Square London EC4Y 8AP / GB | [N/P] |
| Former [2014/02] | Boult Wade Tennant Verulam Gardens 70 Gray's Inn Road London WC1X 8BT / GB | ||
| Former [2003/33] | Cross, Rupert Edward Blount, et al BOULT WADE TENNANT, Verulam Gardens 70 Gray's Inn Road London WC1X 8BT / GB | Application number, filing date | 03250799.8 | 07.02.2003 | [2003/33] | Priority number, date | JP20020031993 | 08.02.2002 Original published format: JP 2002031993 | [2003/33] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1335402 | Date: | 13.08.2003 | Language: | EN | [2003/33] | Type: | A3 Search report | No.: | EP1335402 | Date: | 16.11.2005 | [2005/46] | Type: | B1 Patent specification | No.: | EP1335402 | Date: | 06.07.2016 | Language: | EN | [2016/27] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 06.10.2005 | Classification | IPC: | H01J37/05, H01J37/26 | [2005/45] | CPC: |
H01J37/261 (EP,US);
H01J2237/057 (EP,US);
H01J2237/262 (EP,US)
|
| Former IPC [2003/33] | H01J37/05 | Designated contracting states | DE, NL [2016/27] |
| Former [2006/30] | DE, NL | ||
| Former [2006/29] | AT, BE | ||
| Former [2003/33] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LI, LU, MC, NL, PT, SE, SI, SK, TR | Title | German: | Wienfilter und damit ausgerüstetem Elektronenmikroskop | [2003/33] | English: | Wien filter and electron microscope using same | [2003/33] | French: | Filtre de Wien et microscope eléctronique muni d'un tel filtre | [2003/33] | Examination procedure | 13.04.2006 | Examination requested [2006/23] | 17.05.2006 | Loss of particular rights, legal effect: designated state(s) | 29.06.2006 | Despatch of a communication from the examining division (Time limit: M06) | 13.09.2006 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LU, MC, PT, SE, SI, SK, TR | 09.01.2007 | Reply to a communication from the examining division | 11.09.2008 | Despatch of a communication from the examining division (Time limit: M06) | 23.03.2009 | Reply to a communication from the examining division | 20.01.2016 | Communication of intention to grant the patent | 26.05.2016 | Fee for grant paid | 26.05.2016 | Fee for publishing/printing paid | 26.05.2016 | Receipt of the translation of the claim(s) | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 29.06.2006 | Opposition(s) | 07.04.2017 | No opposition filed within time limit [2017/24] | Fees paid | Renewal fee | 13.04.2005 | Renewal fee patent year 03 | 25.01.2006 | Renewal fee patent year 04 | 25.01.2007 | Renewal fee patent year 05 | 22.02.2008 | Renewal fee patent year 06 | 23.02.2009 | Renewal fee patent year 07 | 22.02.2010 | Renewal fee patent year 08 | 21.02.2011 | Renewal fee patent year 09 | 22.02.2012 | Renewal fee patent year 10 | 21.02.2013 | Renewal fee patent year 11 | 21.02.2014 | Renewal fee patent year 12 | 20.02.2015 | Renewal fee patent year 13 | 22.02.2016 | Renewal fee patent year 14 | Penalty fee | Penalty fee Rule 85a EPC 1973 | 27.06.2006 | AT M01 Not yet paid | 27.06.2006 | BE M01 Not yet paid | 27.06.2006 | BG M01 Not yet paid | 27.06.2006 | CH M01 Not yet paid | 27.06.2006 | CY M01 Not yet paid | 27.06.2006 | CZ M01 Not yet paid | 27.06.2006 | DK M01 Not yet paid | 27.06.2006 | EE M01 Not yet paid | 27.06.2006 | ES M01 Not yet paid | 27.06.2006 | FI M01 Not yet paid | 27.06.2006 | FR M01 Not yet paid | 27.06.2006 | GB M01 Not yet paid | 27.06.2006 | GR M01 Not yet paid | 27.06.2006 | HU M01 Not yet paid | 27.06.2006 | IE M01 Not yet paid | 27.06.2006 | IT M01 Not yet paid | 27.06.2006 | LU M01 Not yet paid | 27.06.2006 | MC M01 Not yet paid | 27.06.2006 | PT M01 Not yet paid | 27.06.2006 | SE M01 Not yet paid | 27.06.2006 | SI M01 Not yet paid | 27.06.2006 | SK M01 Not yet paid | 27.06.2006 | TR M01 Not yet paid | Additional fee for renewal fee | 28.02.2005 | 03 M06 Fee paid on 13.04.2005 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | NL | 01.03.2017 | [2018/02] | Documents cited: | Search | [A]EP1045425 (INTEGRATED CIRCUIT TESTING [DE]) [A] 1-13 * abstract * * paragraphs [0010] - [0013] - [0020] , [0028] , [0047] , [0049] , [0051] - [0055] ** figures 5a,6a,7,8 *; | [Y]US6246058 (TIEMEIJER PETER C [NL]) [Y] 1-13 * abstract * * column 1, line 5 - line 24 * * column 2, line 36 - line 62 * * column 3, line 9 - line 30 * * column 5, line 2 - line 11 * * claims 1,9 * * figure 4b *; | [XY] - M. HAIDER, W. BERNHARDT, H. ROSE, "Design and test of an electric and magnetic dodecapole lens", OPTIK, Stuttgart, (1982), vol. 63, no. 1, pages 9 - 23, XP008051532 [X] 1,8 * the whole document * [Y] 2-7,9-13 | [Y] - MUI P H ET AL, "IMPROVED FOCUSING-AND-DEFLECTION COLUMNS", JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY: PART B, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, (19950701), vol. 13, no. 4, ISSN 1071-1023, pages 1496 - 1507, XP000542852 [Y] 1-13 * the whole document * DOI: http://dx.doi.org/10.1116/1.588177 | by applicant | - M. HAIDER; W. BERNHARDT; H. ROSE, "Design and test of an electric and magnetic dodecapole lens", OPTIK, (1982), vol. 63, no. 1, pages 9 - 23 |