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EP About this file: EP1505385

EP1505385 - METHOD FOR DIAGNOSING DETERIORATION OF GAS SENSOR AND EQUIPMENT FOR DIAGNOSING DETERIORATION OF GAS SENSOR [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  28.10.2011
Database last updated on 24.08.2024
Most recent event   Tooltip28.10.2011No opposition filed within time limitpublished on 30.11.2011  [2011/48]
Applicant(s)For all designated states
HONDA GIKEN KOGYO KABUSHIKI KAISHA
1-1, Minami-Aoyama 2-chome Minato-ku
Tokyo 107-8556 / JP
[2010/51]
Former [2005/06]For all designated states
Honda Giken Kogyo Kabushiki Kaisha
1-1, Minami Aoyama 2-chome
Minato-ku, Tokyo 107-8556 / JP
Inventor(s)01 / SASAKI, Takashi, c/o K.K. Honda Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama-ken 351-0193 / JP
02 / ABE, Hiroyuki, c/o K.K. Honda Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama-ken 351-0193 / JP
03 / EGUCHI, Tsuyoshi, c/o K.K. Honda Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama-ken 351-0193 / JP
04 / KOJIMA, Yasushi, c/o K.K. Honda Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama-ken 351-0193 / JP
05 / SAITO, Takashi, c/o K.K. Honda Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama-ken 351-0193 / JP
06 / SUZUKI, Akihiro, c/o K.K. Honda Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama-ken 351-0193 / JP
 [2011/02]
Former [2010/50]01 / SASAKI, Takashi, c/o K.K. Honda Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama 351-0193 / JP
02 / ABE, Hiroyuki, c/o K.K. Honda Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama 351-0193 / JP
03 / EGUCHI, Tsuyoshi, c/o K.K. Honda Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama 351-0193 / JP
04 / KOJIMA, Yasushi, c/o K.K. Honda Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama 351-0193 / JP
05 / SAITO, Takashi, c/o K.K. Honda Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama 351-0193 / JP
06 / SUZUKI, Akihiro, c/o K.K. Honda Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama 351-0193 / JP
Former [2005/06]01 / SASAKI, Takashi, K.K. Hon-da Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama 351-0193 / JP
02 / ABE, Hiroyuki, K.K. Hon-da Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama 351-0193 / JP
03 / EGUCHI, Tsuyoshi, K.K. Hon-da Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama 351-0193 / JP
04 / KOJIMA, Yasushi, K.K. Hon-da Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama 351-0193 / JP
05 / SAITO, Takashi, K.K. Hon-da Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama 351-0193 / JP
06 / SUZUKI, Akihiro, K.K. Hon-da Gijutsu Kenkyusho
4-1, Chuo 1-chome
Wako-shi, Saitama 351-0193 / JP
Representative(s)Taylor, Adam David, et al
Dehns
St Bride's House
10 Salisbury Square
London EC4Y 8JD / GB
[N/P]
Former [2010/33]Taylor, Adam David, et al
Dehns St. Bride's House 10 Salisbury Square
London EC4Y 8JD / GB
Former [2008/33]Piésold, Alexander James
Frank B. Dehn & Co. St Bride's House 10 Salisbury Square
London EC4Y 8JD / GB
Former [2005/06]Piésold, Alexander J.
Frank B. Dehn & Co., 179 Queen Victoria Street
London EC4V 4EL / GB
Application number, filing date03728054.212.05.2003
[2005/06]
WO2003JP05897
Priority number, dateJP2002013764913.05.2002         Original published format: JP 2002137649
JP2002037408625.12.2002         Original published format: JP 2002374086
JP2003007022714.03.2003         Original published format: JP 2003070227
[2005/06]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO03096000
Date:20.11.2003
Language:EN
[2003/47]
Type: A1 Application with search report 
No.:EP1505385
Date:09.02.2005
Language:EN
The application published by WIPO in one of the EPO official languages on 20.11.2003 takes the place of the publication of the European patent application.
[2005/06]
Type: B1 Patent specification 
No.:EP1505385
Date:22.12.2010
Language:EN
[2010/51]
Search report(s)International search report - published on:JP20.11.2003
(Supplementary) European search report - dispatched on:EP26.10.2007
ClassificationIPC:G01N27/16, H01M8/04, G01N33/00
[2007/48]
CPC:
G01N33/007 (EP,US); G01N27/16 (EP,US); H01M8/04089 (EP,US);
G01N33/0031 (EP,US); G01N33/005 (EP,US); H01M2250/20 (EP,US);
H01M8/04097 (EP,US); H01M8/0662 (EP,US); Y02E60/50 (EP);
Y02T90/40 (EP,US) (-)
Former IPC [2005/06]G01N27/16, H01M8/04
Designated contracting statesDE,   FR,   GB [2005/35]
Former [2005/06]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:VERFAHREN ZUR DIAGNOSE DER VERSCHLECHTERUNG EINES GASSENSORS UND GERÄT ZUR DIAGNOSE EINER VERSCHLECHTERUNG EINES GASSENSORS[2010/26]
English:METHOD FOR DIAGNOSING DETERIORATION OF GAS SENSOR AND EQUIPMENT FOR DIAGNOSING DETERIORATION OF GAS SENSOR[2005/06]
French:METHODE DE DIAGNOSTIC DE LA DETERIORATION D'UN CAPTEUR DE GAZ ET EQUIPEMENT POUR LE DIAGNOSTIC DE LA DETERIORATION D'UN CAPTEUR DE GAZ[2010/26]
Former [2005/06]VERFAHREN ZUR DIAGNOSE DER VERSCHLECHTERUNG EINES GASSENSORS UND GERÄTE ZUR DIAGNOSE EINER VERSCHLECHTERUNG EINES GASSENSORS
Former [2005/06]METHODE DE DIAGNOSTIC DE LA DETERIORATION D'UN CAPTEUR DE GAZ ET EQUIPEMENT POUR LE DIAGNOSTIC DE LA DETERIORATION DE GAZ
Entry into regional phase15.11.2004Translation filed 
15.11.2004National basic fee paid 
15.11.2004Search fee paid 
15.11.2004Designation fee(s) paid 
15.11.2004Examination fee paid 
Examination procedure12.12.2003Request for preliminary examination filed
International Preliminary Examining Authority: JP
15.11.2004Examination requested  [2005/06]
14.04.2008Despatch of a communication from the examining division (Time limit: M04)
20.08.2008Reply to a communication from the examining division
28.06.2010Communication of intention to grant the patent
02.11.2010Fee for grant paid
02.11.2010Fee for publishing/printing paid
Opposition(s)23.09.2011No opposition filed within time limit [2011/48]
Fees paidRenewal fee
27.05.2005Renewal fee patent year 03
23.05.2006Renewal fee patent year 04
24.05.2007Renewal fee patent year 05
20.03.2008Renewal fee patent year 06
28.05.2009Renewal fee patent year 07
24.03.2010Renewal fee patent year 08
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Documents cited:Search[Y]JPS61239153  (NAKAO KAZUTOSHI) [Y] 8-12,19-21 * abstract *;
 [A]US5052361  (ONO HIROSHI [JP], et al) [A] 1-9,16-19 * abstract *;
 [A]US5243954  (MOSS DENNIS W [US]) [A] 1-9,16-19 * abstract *;
 [Y]JPH0611472  (RICOH KK) [Y] 1-24 * abstract *;
 [Y]JPH06223850  (MITSUBISHI HEAVY IND LTD) [Y] 10,14,15,20,23,24 * abstract *;
 [A]US5388454  (KURODA SHIGETAKA [JP], et al) [A] 1-9,13,16-19,21,22 * abstract *;
 [Y]JPH1048171  (YAZAKI CORP) [Y] 1-24 * abstract *;
 [E]WO03056325  (WAGNER ALARM SICHERUNG [DE], et al) [E] 1-9,19-21* the whole document *
International search[Y]JPH0611472  (RICOH KK);
 [Y]JPH1048171  (YAZAKI CORP);
 [Y]JPS61239153  (NAKAO KAZUTOSHI);
 [Y]JPH06223850  (MITSUBISHI HEAVY IND LTD);
 [A]EP0751390  (NGK INSULATORS LTD [JP]);
 [A]JPH1010069  (HITACHI LTD);
 [A]JPH10170463  (TOKYO GAS CO LTD, et al)
ExaminationUS4419888
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.