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Extract from the Register of European Patents

EP About this file: EP1480751

EP1480751 - METHOD AND SAMPLING DEVICE FOR DETECTION OF LOW LEVELS OF A PROPERTY/QUALITY TRAIT PRESENT IN AN INHOMOGENEOUSLY DISTRIBUTED SAMPLE SUBSTRATE [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  04.03.2011
Database last updated on 13.11.2024
Most recent event   Tooltip04.10.2013Lapse of the patent in a contracting state
New state(s): HU		published on 06.11.2013  [2013/45]
Applicant(s)For all designated states
Cognis IP Management GmbH
Henkelstrasse 67
40589 Düsseldorf / DE
[N/P]
Former [2005/25]For all designated states
Cognis IP Management GmbH
Henkelstrasse 67
40589 Düsseldorf / DE
Former [2004/49]For all designated states
Cognis Corporation
2500 Renaissance Boulevard, Suite 200
Gulph Mills, PA 19406 / US
Inventor(s)01 / TSENG, Ching-Hui
6169 Hillsdale Lane
West Chester, OH 45069 / US
02 / MA, Kangming
4380 N. Mallard Cv.
Mason, OH 45040 / US
03 / WANG, Nan
6464 Tylers Crossing
West Chester, OH 45069 / US
04 / MCFADDEN, Daniel
354 St. Andrews Drive, Apt. D
Cincinnati, OH 45245 / US
 [2004/49]
Representative(s)(deleted)
[2005/25]
Former [2004/49]Gittinger, Andreas, et al
Cognis Deutschland GmbH & Co. KG R - Intellectual Property Postfach 13 01 64
D-40551 Düsseldorf / DE
Application number, filing date03743695.325.02.2003
[2004/49]
WO2003US05710
Priority number, dateUS20020361245P01.03.2002         Original published format: US 361245 P
US2003036616613.02.2003         Original published format: US 366166
[2004/49]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO03074991
Date:12.09.2003
Language:EN
[2003/37]
Type: A2 Application without search report 
No.:EP1480751
Date:01.12.2004
Language:EN
The application published by WIPO in one of the EPO official languages on 12.09.2003 takes the place of the publication of the European patent application.
[2004/49]
Type: B1 Patent specification 
No.:EP1480751
Date:28.04.2010
Language:EN
[2010/17]
Search report(s)International search report - published on:US13.11.2003
(Supplementary) European search report - dispatched on:EP12.11.2008
ClassificationIPC:G01N21/53, G01N21/85
[2008/50]
CPC:
G01N21/3563 (EP,US); G01N21/85 (EP,US); G01N33/10 (EP,US);
G01N2021/0339 (EP,US); G01N2021/8592 (EP,US)
Former IPC [2004/49]B01L3/00
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   SI,   SK,   TR [2004/49]
Extension statesALNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
RONot yet paid
TitleGerman:VERFAHREN UND PROBEENTNAHMEVORRICHTUNG ZUR ERFASSUNG GERINGER NIVEAUS EINES EIGENSCHAFTS-/QUALITÄTSMERKMALS, DAS IN EINEM INHOMOGEN VERTEILTEN PROBENSUBSTRAT VORLIEGT[2004/49]
English:METHOD AND SAMPLING DEVICE FOR DETECTION OF LOW LEVELS OF A PROPERTY/QUALITY TRAIT PRESENT IN AN INHOMOGENEOUSLY DISTRIBUTED SAMPLE SUBSTRATE[2004/49]
French:PROCEDE ET DISPOSITIF D'ECHANTILLONNAGE PERMETTANT DE DETECTER DE FAIBLES NIVEAUX D'UNE PROPRIETE/QUALITE PRESENTE DANS UN SUBSTRAT D'ECHANTILLON DISTRIBUE DE MANIERE NON HOMOGENE[2004/49]
Entry into regional phase21.08.2004National basic fee paid 
21.08.2004Search fee paid 
21.08.2004Designation fee(s) paid 
21.08.2004Examination fee paid 
Examination procedure08.09.2003Request for preliminary examination filed
International Preliminary Examining Authority: US
21.08.2004Amendment by applicant (claims and/or description)
21.08.2004Examination requested  [2004/49]
03.04.2009Despatch of a communication from the examining division (Time limit: M06)
07.10.2009Reply to a communication from the examining division
01.12.2009Communication of intention to grant the patent
13.03.2010Fee for grant paid
13.03.2010Fee for publishing/printing paid
Opposition(s)31.01.2011No opposition filed within time limit [2011/14]
Fees paidRenewal fee
14.02.2005Renewal fee patent year 03
14.02.2006Renewal fee patent year 04
14.02.2007Renewal fee patent year 05
13.02.2008Renewal fee patent year 06
13.02.2009Renewal fee patent year 07
16.02.2010Renewal fee patent year 08
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT28.04.2010
BE28.04.2010
CY28.04.2010
CZ28.04.2010
DK28.04.2010
EE28.04.2010
FI28.04.2010
HU28.04.2010
IT28.04.2010
NL28.04.2010
SE28.04.2010
SI28.04.2010
SK28.04.2010
TR28.04.2010
BG28.07.2010
GR29.07.2010
ES08.08.2010
PT30.08.2010
[2013/45]
Former [2013/44]AT28.04.2010
BE28.04.2010
CY28.04.2010
CZ28.04.2010
DK28.04.2010
EE28.04.2010
FI28.04.2010
IT28.04.2010
NL28.04.2010
SE28.04.2010
SI28.04.2010
SK28.04.2010
TR28.04.2010
BG28.07.2010
GR29.07.2010
ES08.08.2010
PT30.08.2010
Former [2013/42]AT28.04.2010
BE28.04.2010
CY28.04.2010
CZ28.04.2010
DK28.04.2010
EE28.04.2010
FI28.04.2010
IT28.04.2010
NL28.04.2010
SE28.04.2010
SI28.04.2010
SK28.04.2010
BG28.07.2010
GR29.07.2010
ES08.08.2010
PT30.08.2010
Former [2011/15]AT28.04.2010
BE28.04.2010
CY28.04.2010
CZ28.04.2010
DK28.04.2010
EE28.04.2010
FI28.04.2010
IT28.04.2010
NL28.04.2010
SE28.04.2010
SI28.04.2010
SK28.04.2010
GR29.07.2010
ES08.08.2010
PT30.08.2010
Former [2011/13]AT28.04.2010
BE28.04.2010
CY28.04.2010
CZ28.04.2010
DK28.04.2010
EE28.04.2010
FI28.04.2010
NL28.04.2010
SE28.04.2010
SI28.04.2010
SK28.04.2010
GR29.07.2010
ES08.08.2010
PT30.08.2010
Former [2011/10]AT28.04.2010
CY28.04.2010
CZ28.04.2010
DK28.04.2010
EE28.04.2010
FI28.04.2010
NL28.04.2010
SE28.04.2010
SI28.04.2010
SK28.04.2010
GR29.07.2010
ES08.08.2010
PT30.08.2010
Former [2011/08]AT28.04.2010
CY28.04.2010
DK28.04.2010
EE28.04.2010
FI28.04.2010
NL28.04.2010
SE28.04.2010
SI28.04.2010
GR29.07.2010
ES08.08.2010
PT30.08.2010
Former [2011/07]AT28.04.2010
CY28.04.2010
DK28.04.2010
FI28.04.2010
NL28.04.2010
SE28.04.2010
SI28.04.2010
GR29.07.2010
ES08.08.2010
Former [2011/05]AT28.04.2010
CY28.04.2010
FI28.04.2010
NL28.04.2010
SE28.04.2010
SI28.04.2010
GR29.07.2010
ES08.08.2010
Former [2011/01]AT28.04.2010
FI28.04.2010
NL28.04.2010
SE28.04.2010
SI28.04.2010
GR29.07.2010
ES08.08.2010
Former [2010/52]AT28.04.2010
FI28.04.2010
NL28.04.2010
SE28.04.2010
SI28.04.2010
ES08.08.2010
Former [2010/50]AT28.04.2010
FI28.04.2010
NL28.04.2010
SE28.04.2010
ES08.08.2010
Former [2010/49]AT28.04.2010
NL28.04.2010
SE28.04.2010
ES08.08.2010
Former [2010/46]NL28.04.2010
ES08.08.2010
Former [2010/45]NL28.04.2010
Documents cited:Search[X]US3882716  (BEIMAN ELLIOTT) [X] 1-10 * figures 1-3 *;
 [A]JPS59217123  (HITACHI LTD) [A] 1-10* figure 1 *;
 [A]US4692620  (ROSENTHAL ROBERT D [US]) [A] 1-10 * figure 1 *;
 [A]JPS6391540  (TDK CORP) [A] 1-10 * figure 1 *;
 [A]JPH0579974  (SHIMADZU CORP) [A] 1-10 * figure 1 *;
 [A]JPH11304699  (KETT ELECTRIC LAB) [A] 1-10 * figures 1,4 *;
 [A]WO0135720  (TEXTRON SYSTEMS CORP [US], et al) [A] 1-10 * figure 2 *;
 [A]WO0160507  (ASTRAZENECA UK LTD [GB], et al) [A] 1-10 * figures 1,3 *;
 [A]WO0160503  (ASTRAZENECA AB [SE], et al) [A] 1-10 * figures 1,2 *
International search[A]US4968938  (PINES ALEXANDER [US], et al);
 [A]US5184191  (KRISHNAN KRISHNASWAMY [US]);
 [A]US5408512  (KUWABARA SHOJI [JP], et al);
 [A]US5886525  (YESINOWSKI JAMES PAUL [US], et al);
 [A]US5936244  (YAJIMA YUSUKE [JP], et al)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.