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Extract from the Register of European Patents

EP About this file: EP1540725

EP1540725 - METHOD OF MANUFACTURE OF A SEMI-CONDUCTOR COMPONENT WITH CONDENSATORS BURIED IN THE SUBSTRATE AND INSULATED COMPONENT LAYER THEREOF [Right-click to bookmark this link]
Former [2005/24]SEMI-CONDUCTOR COMPONENT WITH CONDENSATORS BURIED IN THE SUBSTRATE AND INSULATED COMPONENT LAYER THEREOF
[2008/06]
StatusNo opposition filed within time limit
Status updated on  24.04.2009
Database last updated on 16.09.2024
Most recent event   Tooltip24.04.2009No opposition filed within time limitpublished on 27.05.2009  [2009/22]
Applicant(s)For all designated states
Infineon Technologies AG
St.-Martin-Strasse 53
81669 München / DE
[2008/30]
Former [2005/24]For all designated states
Infineon Technologies AG
St. Martin-Strasse 53
81669 München / DE
Inventor(s)01 / HOFMANN, Franz
Herbergstrasse 25B
80995 München / DE
02 / LEHMANN, Volker
Geyerspergerstrasse 53
80689 München / DE
03 / RISCH, Lothar
Tizianstrasse 27
85579 Neubiberg / DE
04 / RÖSNER, Wolfgang
Sudetenstrasse 23
85521 Ottobrunn / DE
05 / SPECHT, Michael
Schraudolphstrasse 42
80799 München / DE
 [2005/24]
Representative(s)Kindermann, Peter, et al
Patentanwälte Kindermann
Postfach 10 02 34
85593 Baldham / DE
[N/P]
Former [2005/24]Kindermann, Peter, Dipl.-Ing., et al
Kindermann Patentanwälte Postfach 1330
85627 Grasbrunn / DE
Application number, filing date03747835.113.09.2003
[2005/24]
WO2003DE03044
Priority number, dateDE200214287716.09.2002         Original published format: DE 10242877
[2005/24]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO2004027861
Date:01.04.2004
Language:DE
[2004/14]
Type: A1 Application with search report 
No.:EP1540725
Date:15.06.2005
Language:DE
The application published by WIPO in one of the EPO official languages on 01.04.2004 takes the place of the publication of the European patent application.
[2005/24]
Type: B1 Patent specification 
No.:EP1540725
Date:18.06.2008
Language:DE
[2008/25]
Search report(s)International search report - published on:EP01.04.2004
ClassificationIPC:H01L21/8242, H01L27/108, H01L27/12
[2005/24]
CPC:
H01L21/84 (EP,US); H10B12/0387 (EP,US); H01L27/1203 (EP,US);
H01L29/66181 (EP,US); H01L29/945 (EP,US); H10B12/373 (EP,US);
H01L28/82 (EP,US); H10B12/0385 (EP,US) (-)
Designated contracting statesDE,   FR,   IT [2006/01]
Former [2005/24]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:VERFAHREN ZUR HERSTELLUNG EINES HALBLEITERBAUTEILS MIT IM SUBSTRAT VERGRABENEN KONDENSATOREN UND DAVON ISOLIERTER BAUELEMENTSCHICHT[2008/06]
English:METHOD OF MANUFACTURE OF A SEMI-CONDUCTOR COMPONENT WITH CONDENSATORS BURIED IN THE SUBSTRATE AND INSULATED COMPONENT LAYER THEREOF[2008/06]
French:PROCÉDÉ DE FABRICATION D'UN COMPOSANT SEMI-CONDUCTEUR POURVU DE CONDENSATEURS ENTERRES DANS LE SUBSTRAT ET D'UNE COUCHE DE COMPOSANT ISOLEE DE CES CONDENSATEURS[2008/06]
Former [2005/24]HALBLEITERBAUTEIL MIT IM SUBSTRAT VERGRABENEN KONDENSATOREN UND DAVON ISOLIERTER BAUELEMENTSCHICHT
Former [2005/24]SEMI-CONDUCTOR COMPONENT WITH CONDENSATORS BURIED IN THE SUBSTRATE AND INSULATED COMPONENT LAYER THEREOF
Former [2005/24]COMPOSANT SEMI-CONDUCTEUR POURVU DE CONDENSATEURS ENTERRES DANS LE SUBSTRAT ET D'UNE COUCHE DE COMPOSANT ISOLEE DE CES CONDENSATEURS
Entry into regional phase03.03.2005National basic fee paid 
03.03.2005Designation fee(s) paid 
03.03.2005Examination fee paid 
Examination procedure25.03.2004Request for preliminary examination filed
International Preliminary Examining Authority: EP
03.03.2005Examination requested  [2005/24]
01.02.2008Communication of intention to grant the patent
28.04.2008Fee for grant paid
28.04.2008Fee for publishing/printing paid
Opposition(s)19.03.2009No opposition filed within time limit [2009/22]
Fees paidRenewal fee
21.09.2005Renewal fee patent year 03
22.09.2006Renewal fee patent year 04
11.09.2007Renewal fee patent year 05
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Cited inInternational search[X]JPH0235770  ;
 [A]JPS63151071  ;
 [XY]US5055898  (BEILSTEIN JR KENNETH E [US], et al);
 [A]EP0553791  (NEC CORP [JP]);
 [A]US5739565  (NAKAMURA YOSHIO [JP], et al);
 [Y]WO9925026  (SIEMENS AG [DE], et al);
 [X]US6306719  (LEE KYU-PIL [KR]);
 [A]DE10055711  (INFINEON TECHNOLOGIES AG [DE]);
 [AD]US6441424  (KLOSE HELMUT [US], et al);
 [PX]DE10133688  (INFINEON TECHNOLOGIES AG [DE])
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.