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EP1532458
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EP About this file: EP1532458
| EP1532458 - DIRECT, LOW FREQUENCY CAPACITANCE MEASUREMENT FOR SCANNING CAPACITANCE MICROSCOPY [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 18.03.2011 Database last updated on 02.11.2024 | Most recent event Tooltip | 18.03.2011 | Application deemed to be withdrawn | published on 20.04.2011 [2011/16] | Applicant(s) | For all designated states THE OHIO STATE UNIVERSITY 1960 Kenny Road Columbus OH 43210-1063 / US | [N/P] |
| Former [2005/21] | For all designated states THE OHIO STATE UNIVERSITY 1960 Kenny Road Columbus, OH 43210-1063 / US | Inventor(s) | 01 /
PELZ, Jonathan, P. 2516 Brentwood Road Columbus, OH 43209 / US | 02 /
LEE, David, T. 263 Clover Court Dublin, OH 43017 / US | 03 /
BHUSHAN, Bharat 10235 Widdington Close Powell, OH 43065 / US | [2005/21] | Representative(s) | Boyce, Conor, et al FRKelly 27 Clyde Road Ballsbridge Dublin 4 / IE | [N/P] |
| Former [2005/21] | Boyce, Conor, et al F. R. Kelly & Co., 27 Clyde Road, Ballsbridge Dublin 4 / IE | Application number, filing date | 03756333.5 | 02.06.2003 | [2005/21] | WO2003US17234 | Priority number, date | US20020386010P | 04.06.2002 Original published format: US 386010 P | US20020313431 | 06.12.2002 Original published format: US 313431 | [2005/21] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO03102609 | Date: | 11.12.2003 | Language: | EN | [2003/50] | Type: | A1 Application with search report | No.: | EP1532458 | Date: | 25.05.2005 | Language: | EN | The application published by WIPO in one of the EPO official languages on 11.12.2003 takes the place of the publication of the European patent application. | [2005/21] | Search report(s) | International search report - published on: | US | 11.12.2003 | (Supplementary) European search report - dispatched on: | EP | 26.07.2010 | Classification | IPC: | G01R27/26 | [2005/21] | CPC: |
G01Q60/46 (EP,US);
B82Y35/00 (US);
G01R27/2605 (EP,US);
Y10S977/866 (EP,US)
| Designated contracting states | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LI, LU, MC, NL, PT, RO, SE, SI, SK, TR [2005/21] | Extension states | AL | Not yet paid | LT | Not yet paid | LV | Not yet paid | MK | Not yet paid | Title | German: | DIREKTE NIEDERFREQUENZ-KAPAZITÄTSMESSUNG FÜR DIE RASTERKAPAZITÄTSMIKROSKOPIE | [2005/21] | English: | DIRECT, LOW FREQUENCY CAPACITANCE MEASUREMENT FOR SCANNING CAPACITANCE MICROSCOPY | [2005/21] | French: | MESURE DE CAPACITE DIRECTE BASSE FREQUENCE POUR MICROSCOPIE CAPACITIVE A BALAYAGE | [2005/21] | Entry into regional phase | 04.01.2005 | National basic fee paid | 04.01.2005 | Search fee paid | 04.01.2005 | Designation fee(s) paid | 04.01.2005 | Examination fee paid | Examination procedure | 04.01.2005 | Examination requested [2005/21] | 01.12.2010 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2011/16] | 12.01.2011 | Application deemed to be withdrawn, date of legal effect [2011/16] | Fees paid | Renewal fee | 30.06.2005 | Renewal fee patent year 03 | 30.06.2006 | Renewal fee patent year 04 | 02.07.2007 | Renewal fee patent year 05 | 26.03.2008 | Renewal fee patent year 06 | 30.06.2009 | Renewal fee patent year 07 | Penalty fee | Additional fee for renewal fee | 30.06.2010 | 08 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US5196802 (BURGENER MARK L [US], et al) [A] 1-19* column 9, line 17 - column 10, line 27; figure 10 *; | [XA]US5880360 (HU JUN [US], et al) [X] 20,21 * column 1, line 59 - line 67 * * column 2, line 12 - line 22 * * column 2, line 33 - line 37 * * column 3, line 27 - line 46 * * column 8, line 35 - line 61 * * column 20, line 25 - line 41; figures 1,2 * [A] 1-19; | [XA]US6185991 (HONG JAEWAN [KR], et al) [X] 20,21 * column 1, line 66 - column 2, line 5 * * column 2, line 28 - line 38 * * column 3, line 46 - column 54 * * column 5, line 14 - line 65; figure 1a * [A] 1-19 | International search | [A]US6211686 (MATSUZAWA KAZUYA [JP], et al); | [A]US5742172 (YASUTAKE MASATOSHI [JP]); | [AP]US6404207 (BHUSHAN BHARAT [US]) |