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Extract from the Register of European Patents

EP About this file: EP1601995

EP1601995 - HIGH DYNAMIC RANGE OPTICAL INSPECTION SYSTEM AND METHOD [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  05.10.2007
Database last updated on 02.11.2024
Most recent event   Tooltip06.06.2008Change - representativepublished on 09.07.2008  [2008/28]
Applicant(s)For all designated states
Twinstar Systems, Inc.
48635 Northport Loop East
Fremont, CA 94538 / US
[2005/49]
Inventor(s)01 / CHHIBBER, Rajeshwar
4929 Cruden Bay Court
San Jose, CA 95138 / US
02 / WILLENBORG, David
2500 Finley Road
Pleasanton, CA 94588 / US
 [2005/49]
Representative(s)Viering, Hans-Martin
Viering, Jentschura & Partner
ATTENTION : ADDRESS INACTIVE - USE ASS-NR - CDR / DE
[N/P]
Former [2008/28]Viering, Hans-Martin
Viering, Jentschura & Partner Postfach 22 14 43
80504 München / DE
Former [2005/49]Viering, Hans-Martin
Patentanwälte Viering & Jentschura, Postfach 22 14 43
80504 München / DE
Application number, filing date03759632.726.09.2003
[2005/49]
WO2003US31071
Priority number, dateUS20020414511P27.09.2002         Original published format: US 414511 P
US2003067205625.09.2003         Original published format: US 672056
[2005/49]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2004029674
Date:08.04.2004
Language:EN
[2004/15]
Type: A2 Application without search report 
No.:EP1601995
Date:07.12.2005
Language:EN
The application published by WIPO in one of the EPO official languages on 08.04.2004 takes the place of the publication of the European patent application.
[2005/49]
Search report(s)International search report - published on:US29.12.2005
ClassificationIPC:G01N21/00
[2006/08]
CPC:
G01N21/4738 (EP,US); G01N21/8806 (EP,US); G01N21/9501 (EP,US);
G01N21/9503 (EP,US); G01N21/956 (EP,US)
Former IPC [2005/49]G02B1/00
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   RO,   SE,   SI,   SK,   TR [2005/49]
Extension statesALNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
TitleGerman:OPTISCHES UNTERSUCHUNGSSYSTEM UND VERFAHREN MIT GROSSEM DYNAMIKUMFANG[2005/49]
English:HIGH DYNAMIC RANGE OPTICAL INSPECTION SYSTEM AND METHOD[2005/49]
French:SYSTEME ET PROCEDE D'INSPECTION OPTIQUE A GAMME DYNAMIQUE ELEVEE[2005/49]
Entry into regional phase26.04.2005National basic fee paid 
26.04.2005Search fee paid 
26.04.2005Designation fee(s) paid 
26.04.2005Examination fee paid 
Examination procedure27.04.2004Request for preliminary examination filed
International Preliminary Examining Authority: US
26.04.2005Amendment by applicant (claims and/or description)
26.04.2005Examination requested  [2005/49]
31.03.2007Application deemed to be withdrawn, date of legal effect  [2007/45]
16.05.2007Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time  [2007/45]
Fees paidRenewal fee
26.04.2005Renewal fee patent year 03
Penalty fee
Additional fee for renewal fee
30.09.200604   M06   Not yet paid
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Cited inInternational search[X]US5963316  (MIURA SEIYA [JP], et al)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.