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EP1540360
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EP About this file: EP1540360
| EP1540360 - A SYSTEM FOR BURN-IN TESTING OF ELECTRONIC DEVICES [Right-click to bookmark this link] | Status | The application has been refused Status updated on 02.03.2012 Database last updated on 24.08.2024 | Most recent event Tooltip | 02.03.2012 | Refusal of application | published on 04.04.2012 [2012/14] | Applicant(s) | For all designated states AEHR Test Systems 400 Kato Terrace Fremont, CA 94539 / US | [2005/24] | Inventor(s) | 01 /
GUNN, Bradley, R. 400 Kato Terrace Fremont, CA 94539 / US | 02 /
CALDERON, Alberto, J. P.O. Box 720853 San Jose, CA 95172 / US | 03 /
JOVANOVIC, Jovan 1867 Clifford Street Santa Clara, CA 95050 / US | 04 /
HENDRICKSON, David 17111 Summit Way Los Gatos, CA 95030 / US | [2005/24] | Representative(s) | Jorio, Paolo, et al Studio Torta S.p.A. Via Viotti, 9 10121 Torino / IT | [N/P] |
| Former [2008/45] | Jorio, Paolo, et al STUDIO TORTA Via Viotti 9 10121 Torino / IT | ||
| Former [2005/24] | Jorio, Paolo, et al Studio Torta Via Viotti 9 10121 Torino / IT | Application number, filing date | 03762138.0 | 26.06.2003 | [2005/24] | WO2003US20332 | Priority number, date | US20020184525 | 27.06.2002 Original published format: US 184525 | [2005/24] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2004003581 | Date: | 08.01.2004 | Language: | EN | [2004/02] | Type: | A1 Application with search report | No.: | EP1540360 | Date: | 15.06.2005 | Language: | EN | The application published by WIPO in one of the EPO official languages on 08.01.2004 takes the place of the publication of the European patent application. | [2005/24] | Search report(s) | International search report - published on: | EP | 08.01.2004 | Classification | IPC: | G01R31/316, G01R31/28 | [2005/24] | CPC: |
G06F11/24 (EP,US);
G01R31/2863 (EP,US);
G01R31/31905 (EP,US)
| Designated contracting states | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LI, LU, MC, NL, PT, RO, SE, SI, SK, TR [2005/24] | Extension states | AL | Not yet paid | LT | Not yet paid | LV | Not yet paid | MK | Not yet paid | Title | German: | SYSTEM ZUR BURN-IN-PR FUNG ELEKTRONISCHER EINRICHTUNGEN | [2005/24] | English: | A SYSTEM FOR BURN-IN TESTING OF ELECTRONIC DEVICES | [2005/24] | French: | SYSTEME D'ESSAI DE VIEILLISSEMENT D'APPAREILS ELECTRONIQUES | [2005/24] | Entry into regional phase | 26.01.2005 | National basic fee paid | 26.01.2005 | Designation fee(s) paid | 26.01.2005 | Examination fee paid | Examination procedure | 22.01.2004 | Request for preliminary examination filed International Preliminary Examining Authority: US | 26.01.2005 | Examination requested [2005/24] | 10.02.2006 | Despatch of a communication from the examining division (Time limit: M04) | 24.05.2006 | Reply to a communication from the examining division | 03.11.2011 | Date of oral proceedings | 17.11.2011 | Despatch of communication that the application is refused, reason: substantive examination [2012/14] | 17.11.2011 | Minutes of oral proceedings despatched | 27.11.2011 | Application refused, date of legal effect [2012/14] | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 10.02.2006 | Fees paid | Renewal fee | 21.06.2005 | Renewal fee patent year 03 | 28.06.2006 | Renewal fee patent year 04 | 27.06.2007 | Renewal fee patent year 05 | 25.06.2008 | Renewal fee patent year 06 | 16.06.2009 | Renewal fee patent year 07 | 28.06.2010 | Renewal fee patent year 08 | 26.08.2011 | Renewal fee patent year 09 | Penalty fee | Additional fee for renewal fee | 30.06.2011 | 09 M06 Fee paid on 26.08.2011 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [A]US4145620 (DICE CHARLES A) [A] 1,22,25,39 * column 1, lines 6-10 ** column 2, line 61 - column 6, line 42; figures 1,2 *; | [A]DE19962868 (ANDO ELECTRIC [JP]) [A] 1,9-13,20,22-25,30-33 * column 1, lines 3-8,26-31,65-68 * * column 2, lines 7,8 * * column 3, line 29 - column 4, line 61; figures 1,2; claim 1 *; | [X]WO0104641 (AEHR TEST SYSTEMS INC [US], et al) [X] 1-42 * page 1, lines 11-25 * * page 2, lines 24-30 * * page 5, line 27 - page 10, line 13 * * page 11, lines 7-20; figures 1-6,10,11 * | Examination | US5429510 |