Extract from the Register of European Patents

EP About this file: EP1548836

EP1548836 - PHOTODIODE ARRAY AND RADIATION DETECTOR [Right-click to bookmark this link]
Former [2005/26]PHOTODIODE ARRAY, PRODUCTION METHOD THEREFOR, AND RADIATION DETECTOR
[2007/46]
StatusNo opposition filed within time limit
Status updated on  24.04.2009
Database last updated on 21.03.2026
Most recent event   Tooltip24.04.2009No opposition filed within time limitpublished on 27.05.2009  [2009/22]
Applicant(s)For all designated states
HAMAMATSU PHOTONICS K. K.
1126-1, Ichino-cho
Hamamatsu-shi, Shizuoka 435-8558 / JP
[2008/25]
Former [2005/26]For all designated states
HAMAMATSU PHOTONICS K. K.
1126-1, Ichino-cho
Hamamatsu-shi, Shizuoka 435-8558 / JP
Inventor(s)01 / Shibayama, Katsumi
Hamamatsu Photonics K.K., 1126-1, Ichino-cho
Hamamatsu-shi, Shizuoka 435-8558 / JP
 [2005/26]
Representative(s)Frost, Alex John, et al
Boult Wade Tennant
Verulam Gardens
70 Gray's Inn Road
London WC1X 8BT / GB
[N/P]
Former [2005/26]Frost, Alex John, et al
Boult Wade Tennant, Verulam Gardens 70 Gray's Inn Road
London WC1X 8BT / GB
Application number, filing date03792659.907.08.2003
[2005/26]
WO2003JP10093
Priority number, dateJP2002023356209.08.2002         Original published format: JP 2002233562
JP2003001531823.01.2003         Original published format: JP 2003015318
[2005/26]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2004019411
Date:04.03.2004
Language:EN
[2004/10]
Type: A1 Application with search report 
No.:EP1548836
Date:29.06.2005
Language:EN
The application published by WIPO in one of the EPO official languages on 04.03.2004 takes the place of the publication of the European patent application.
[2005/26]
Type: B1 Patent specification 
No.:EP1548836
Date:18.06.2008
Language:EN
[2008/25]
Search report(s)International search report - published on:JP04.03.2004
(Supplementary) European search report - dispatched on:EP15.09.2006
ClassificationIPC:H01L27/14, G01T1/20, H04N5/32
[2005/26]
CPC:
H10F30/221 (EP,US); H10F30/20 (KR); H10F39/107 (EP,US);
H10F39/199 (EP,US); H10F77/147 (EP); H10F77/703 (EP,US);
H10F39/18 (EP,US); H10F39/809 (EP,US); H10W72/012 (EP,US);
Y02E10/50 (US) (-)
Designated contracting statesDE,   FR,   GB,   NL [2005/48]
Former [2005/26]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  RO,  SE,  SI,  SK,  TR 
Extension statesALNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
TitleGerman:FOTODIODENARRAY UND STRAHLUNGSDETEKTOR[2007/46]
English:PHOTODIODE ARRAY AND RADIATION DETECTOR[2007/46]
French:RESEAU DE PHOTODIODES ET DETECTEUR DE RAYONNEMENT[2007/46]
Former [2005/26]FOTODIODENARRAY, HERSTELLUNGSVERFAHREN DAFÜR UND STRAHLUNGSDETEKTOR
Former [2005/26]PHOTODIODE ARRAY, PRODUCTION METHOD THEREFOR, AND RADIATION DETECTOR
Former [2005/26]RESEAU DE PHOTODIODES, PROCEDE DE PRODUCTION DE CELUI-CI ET DETECTEUR DE RAYONNEMENT
Entry into regional phase18.02.2005Translation filed 
18.02.2005National basic fee paid 
18.02.2005Search fee paid 
18.02.2005Designation fee(s) paid 
18.02.2005Examination fee paid 
Examination procedure18.02.2005Amendment by applicant (claims and/or description)
18.02.2005Examination requested  [2005/26]
27.12.2006Despatch of a communication from the examining division (Time limit: M06)
04.07.2007Reply to a communication from the examining division
24.10.2007Communication of intention to grant the patent
27.03.2008Fee for grant paid
27.03.2008Fee for publishing/printing paid
08.04.2008Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time
Divisional application(s)EP07013166.9  / EP1835539
Opposition(s)19.03.2009No opposition filed within time limit [2009/22]
Request for further processing for:The application is deemed to be withdrawn due to failure to fulfill actions required for granting the patent
27.03.2008Request for further processing filed
27.03.2008Full payment received (date of receipt of payment)
Request granted
08.05.2008Decision despatched
Fees paidRenewal fee
26.07.2005Renewal fee patent year 03
25.07.2006Renewal fee patent year 04
28.08.2007Renewal fee patent year 05
25.03.2008Renewal fee patent year 06
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Documents cited:Search[XY] JPH10223873   [Y] 3,5-8
 [XY] EP0444370  (TELEMECANIQUE et al.) [X] 9-16,18-20 * figures 2,5,7,8 * * column 4, lines 16-22 * * column 2, lines 53,54 * * column 3, lines 1,2,36-44 *[Y] 17,21,22
 [X] DE4102285  (MESSERSCHMITT BOELKOW BLOHM et al.) [X] 9-11 * the whole document *
 [X] US5852322  (SPECKBACHER PETER et al.) [X] 9-13,15-17,19,20 * the whole document *
 [X] EP0279492  (PHILIPS NV et al.) [X] 9,10 * column 5, lines 15,16 * * column 6, lines 18-24 * * figures 1,3 *
 [XY] EP0768720  (SPECTROLAB INC et al.) [X] 9-11,15,16 * figures 2,5 * * column 5, lines 20,21 * * column 4, lines 6-50 * * column 2, lines 30-34 *[Y] 17
 [Y] JP2001291892  
 [Y] US4814847  (TABATABAIE NADER et al.) [Y] 3,5-7 * column 2, line 47 - column 3, line 53 * * figure 1 *
 [A] US2002011640  (BAUER ANDREAS et al.) [A] 1-7 * paragraphs [0013] - [0019]; sequence ABSTRACT * * figures 1,3 *
 [XY]   PATENT ABSTRACTS OF JAPAN vol. 1998, no. 13 30 November 1998 (1998-11-30) [X] 1,2,4 * abstract *[Y] 3,5-8
 [Y]   PATENT ABSTRACTS OF JAPAN vol. 2002, no. 02 2 April 2002 (2002-04-02) [Y] 8,21,22 * abstract *
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