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Extract from the Register of European Patents

EP About this file: EP1540693

EP1540693 - CHARGED PARTICLE BEAM SYSTEM [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  02.12.2011
Database last updated on 13.07.2024
Most recent event   Tooltip02.12.2011Application deemed to be withdrawnpublished on 04.01.2012  [2012/01]
Applicant(s)For all designated states
FEI COMPANY
5350 NE Dawson Creek Drive
Hillsboro, Oregon 97124-5793 / US
[N/P]
Former [2005/24]For all designated states
FEI Company
5350 NE Dawson Creek Drive
Hillsboro, Oregon 97124-5793 / US
Inventor(s)01 / STEWART, Diane, K.
4 Adeline Drive
Ipswich, MA 01939 / US
02 / KNOWLES, Ralph, W.
8 Silver Ledge Road
Newbury, MA 01951 / US
03 / KIMBALL, Brian, T.
2 Philips Avenue
Georgetown, MA 01883 / US
 [2005/24]
Representative(s)Bakker, Hendrik, et al
FEI Company
Patent Department
P.O. Box 1745
5602 BS Eindhoven / NL
[N/P]
Former [2008/17]Bakker, Hendrik, et al
FEI Company Patent Department P.O. Box 1745
5602 BS Eindhoven / NL
Former [2006/42]Bakker, Hendrik, et al
FEI Company Patent Department P.O. Box 80066
5600 KA Eindhoven / NL
Former [2005/24]Bakker, Hendrik
FEI Company, Patent Department, Postbus 80066
5600 KA Eindhoven / NL
Application number, filing date03797915.018.09.2003
[2005/24]
WO2003US29447
Priority number, dateUS20020411699P18.09.2002         Original published format: US 411699 P
US2002033069127.12.2002         Original published format: US 330691
[2005/24]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2004027809
Date:01.04.2004
Language:EN
[2004/14]
Type: A2 Application without search report 
No.:EP1540693
Date:15.06.2005
Language:EN
The application published by WIPO in one of the EPO official languages on 01.04.2004 takes the place of the publication of the European patent application.
[2005/24]
Search report(s)International search report - published on:US29.07.2004
(Supplementary) European search report - dispatched on:EP07.05.2010
ClassificationIPC:H01J37/00, H01J37/244
[2005/24]
CPC:
H01J37/26 (EP,KR,US); H01J37/244 (EP,KR,US); H01J37/28 (KR);
H01J2237/0045 (EP,KR,US); H01J2237/2448 (EP,KR,US); H01J2237/2605 (EP,KR,US)
Designated contracting statesDE,   FR,   GB [2006/02]
Former [2005/24]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  RO,  SE,  SI,  SK,  TR 
Extension statesALNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
TitleGerman:SYSTEM FÜR GELADENE TEILCHENSTRAHLEN[2005/24]
English:CHARGED PARTICLE BEAM SYSTEM[2005/24]
French:SYSTEME DE FAISCEAU DE PARTICULES CHARGEES[2005/24]
Entry into regional phase11.03.2005National basic fee paid 
11.03.2005Search fee paid 
11.03.2005Designation fee(s) paid 
11.03.2005Examination fee paid 
Examination procedure11.03.2005Examination requested  [2005/24]
05.01.2011Despatch of a communication from the examining division (Time limit: M06)
16.07.2011Application deemed to be withdrawn, date of legal effect  [2012/01]
19.08.2011Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2012/01]
Divisional application(s)EP11172096.7  / EP2372743
The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  05.01.2011
Fees paidRenewal fee
21.09.2005Renewal fee patent year 03
27.09.2006Renewal fee patent year 04
26.09.2007Renewal fee patent year 05
25.09.2008Renewal fee patent year 06
25.09.2009Renewal fee patent year 07
27.09.2010Renewal fee patent year 08
Penalty fee
Additional fee for renewal fee
30.09.201109   M06   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]JPH04192246  (NIKON CORP) [X] 1,2,5 * abstract *;
 [A]US6184525  (VAN DER MAST KAREL D [NL]) [A] 1-5* abstract *;
 [X]WO0141180  (LEO ELEKTRONENMIKROSKOPIE GMBH [DE], et al) [X] 1-4 * abstract * * page 13, line 14 - page 23, line 11; figures 1-4 * * page 7, lines 26-37 *;
 [X]WO0205309  (LEO ELEKTRONENMIKROSKOPIE GMBH [DE], et al) [X] 1,2 * abstract * * page 5, line 17 - page 14, line 5; figures 1-4 * * page 9, line 25 - page 10, line 2 * * page 10, lines 26-32 * * page 14, lines 1-5 *
International search[Y]US4249077  (CRAWFORD CHARLES K);
 [Y]US6525317  (YANG BAORUI [US]);
 [Y]US6538254  (TOMIMATSU SATOSHI [JP], et al)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.