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Extract from the Register of European Patents

EP About this file: EP1457550

EP1457550 - Composition for removing residues from the microstructure of an object [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  11.05.2007
Database last updated on 13.11.2024
Most recent event   Tooltip25.09.2009Lapse of the patent in a contracting state
New state(s): TR		published on 28.10.2009  [2009/44]
Applicant(s)For all designated states
AIR PRODUCTS AND CHEMICALS, INC.
7201 Hamilton Boulevard
Allentown, PA 18195-1501 / US
[2004/42]
Former [2004/38]For all designated states
KABUSHIKI KAISHA KOBE SEIKO SHO
10-26, Wakinohama-cho 2-chome, Chuo-ku
Kobe-shi, Hyogo 651-8585 / JP
Inventor(s)01 / Peters, Darryl W.
111 Kennedy Mill Road
Stewartsville, New Jersey 08886 / US
02 / Egbe, Matthew I.
122 Flannery Drive
West Norriton, Pennsylvania 19403 / US
 [2004/38]
Representative(s)Müller-Boré & Partner Patentanwälte PartG mbB
Friedenheimer Brücke 21
80639 München / DE
[N/P]
Former [2004/38]Müller-Boré & Partner Patentanwälte
Grafinger Strasse 2
81671 München / DE
Application number, filing date04011792.108.02.2002
[2004/38]
Priority number, dateJP2001003433709.02.2001         Original published format: JP 2001034337
[2004/38]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1457550
Date:15.09.2004
Language:EN
[2004/38]
Type: A3 Search report 
No.:EP1457550
Date:03.11.2004
[2004/45]
Type: B1 Patent specification 
No.:EP1457550
Date:05.07.2006
Language:EN
[2006/27]
Search report(s)(Supplementary) European search report - dispatched on:EP21.09.2004
ClassificationIPC:C11D3/37, C11D1/00, B08B3/00, C11D11/00, C11D7/32, G03F7/42, H01L21/00
[2004/45]
CPC:
C11D7/02 (EP,US); H01L21/3065 (KR); B08B7/0021 (EP,US);
C11D7/04 (EP,US); C11D7/10 (EP,US); C11D7/3209 (EP,US);
C11D7/3218 (EP,US); C11D7/5004 (EP,US); G03F7/422 (EP,US);
G03F7/425 (EP,US); H01L21/31116 (EP,US); H01L21/31133 (EP,US);
C11D2111/22 (EP,US); H01L21/02052 (EP,US); H01L21/67086 (EP,US) (-)
Former IPC [2004/38]C11D3/37, C11D1/00, B08B3/00
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE,   TR [2004/38]
TitleGerman:Zusammensetzung für Rückstandentfernung von der Mikrostruktur eines Objekts[2004/38]
English:Composition for removing residues from the microstructure of an object[2004/38]
French:Composition pour l'enlèvement des résidus de la microstructure d'un objet[2004/38]
Examination procedure16.12.2004Examination requested  [2005/06]
03.05.2005Despatch of a communication from the examining division (Time limit: M04)
01.08.2005Reply to a communication from the examining division
14.09.2005Despatch of a communication from the examining division (Time limit: M04)
18.10.2005Reply to a communication from the examining division
10.01.2006Cancellation of oral proceeding that was planned for 03.02.2006
10.01.2006Minutes of oral proceedings despatched
03.02.2006Date of oral proceedings (cancelled)
06.02.2006Communication of intention to grant the patent
30.03.2006Fee for grant paid
30.03.2006Fee for publishing/printing paid
Parent application(s)   TooltipEP02736487.6  / EP1358670
Opposition(s)10.04.2007No opposition filed within time limit [2007/24]
Fees paidRenewal fee
27.05.2004Renewal fee patent year 03
04.02.2005Renewal fee patent year 04
06.02.2006Renewal fee patent year 05
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT05.07.2006
BE05.07.2006
CH05.07.2006
CY05.07.2006
FI05.07.2006
LI05.07.2006
TR05.07.2006
DK05.10.2006
SE05.10.2006
GR06.10.2006
ES16.10.2006
PT05.12.2006
IE08.02.2007
LU08.02.2007
MC28.02.2007
[2009/44]
Former [2009/40]AT05.07.2006
BE05.07.2006
CH05.07.2006
CY05.07.2006
FI05.07.2006
LI05.07.2006
DK05.10.2006
SE05.10.2006
GR06.10.2006
ES16.10.2006
PT05.12.2006
IE08.02.2007
LU08.02.2007
MC28.02.2007
Former [2008/21]AT05.07.2006
BE05.07.2006
CH05.07.2006
FI05.07.2006
LI05.07.2006
DK05.10.2006
SE05.10.2006
GR06.10.2006
ES16.10.2006
PT05.12.2006
IE08.02.2007
MC28.02.2007
Former [2008/11]AT05.07.2006
BE05.07.2006
CH05.07.2006
FI05.07.2006
LI05.07.2006
DK05.10.2006
SE05.10.2006
ES16.10.2006
PT05.12.2006
IE08.02.2007
MC28.02.2007
Former [2008/04]AT05.07.2006
BE05.07.2006
CH05.07.2006
FI05.07.2006
LI05.07.2006
DK05.10.2006
SE05.10.2006
ES16.10.2006
PT05.12.2006
MC28.02.2007
Former [2007/49]AT05.07.2006
BE05.07.2006
CH05.07.2006
FI05.07.2006
IT05.07.2006
LI05.07.2006
DK05.10.2006
SE05.10.2006
ES16.10.2006
PT05.12.2006
MC28.02.2007
Former [2007/42]AT05.07.2006
BE05.07.2006
CH05.07.2006
FI05.07.2006
IT05.07.2006
LI05.07.2006
DK05.10.2006
SE05.10.2006
ES16.10.2006
PT05.12.2006
Former [2007/29]AT05.07.2006
BE05.07.2006
CH05.07.2006
FI05.07.2006
LI05.07.2006
DK05.10.2006
SE05.10.2006
ES16.10.2006
PT05.12.2006
Former [2007/23]AT05.07.2006
CH05.07.2006
FI05.07.2006
LI05.07.2006
DK05.10.2006
SE05.10.2006
ES16.10.2006
PT05.12.2006
Former [2007/22]CH05.07.2006
FI05.07.2006
LI05.07.2006
DK05.10.2006
SE05.10.2006
ES16.10.2006
PT05.12.2006
Former [2007/15]CH05.07.2006
FI05.07.2006
LI05.07.2006
SE05.10.2006
ES16.10.2006
PT05.12.2006
Documents cited:Search[PA]WO0133613  (SUPERCRITICAL SYSTEMS INC [US]) [PA] 1,2,5-7,10,11,13-16 * claims 1-35 *;
 [PA]US6242165  (VAARTSTRA BRIAN A [US]) [PA] 1-16 * column 6, line 11 - line 22; claims 1-30 *;
 [PA]US6306564  (MULLEE WILLIAM H [US]) [PA] 1-16 * claims 1-57 *;
 [T]WO0215251  (TOKYO ELECTRON LTD [JP]) [T] 1-16 * claims 1-43 *;
 [T]EP1365441  (KOBE STEEL LTD [JP]) [T] 1-16* claims 17-23 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.