Extract from the Register of European Patents

EP About this file: EP1491957

EP1491957 - Immersion photolithography apparatus with projection system positioned below the substrate [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  20.08.2010
Database last updated on 26.03.2026
Most recent event   Tooltip20.08.2010Application deemed to be withdrawnpublished on 22.09.2010  [2010/38]
Applicant(s)For all designated states
ASML Holding N.V.
De Run 6501
5504 DR Veldhoven / NL
[N/P]
Former [2005/01]For all designated states
ASML Holding N.V.
De Run 6501
5504 DR Veldhoven / NL
Inventor(s)01 / Sewell, Harry
138 Haviland Road
Ridgefield, Connecticut 06877 / US
 [2005/01]
Representative(s)Corcoran, Gregory Martin Mason, et al
ASML Netherlands B.V.
Corporate Intellectual Property
De Run 6501
P.O. Box 324
5500 AH Veldhoven / NL
[N/P]
Former [2009/23]Corcoran, Gregory Martin Mason, et al
ASML Netherlands B.V. Corporate Intellectual Property P.O. Box 324
5500 AH Veldhoven / NL
Former [2009/08]Van den Hooven, Jan, et al
ASML Netherlands B.V. Corporate Intellectual Property P.O. Box 324
5500 AH Veldhoven / NL
Former [2005/01]Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
Maximilianstrasse 58
80538 München / DE
Application number, filing date04014393.518.06.2004
[2005/01]
Priority number, dateUS2003060717027.06.2003         Original published format: US 607170
[2005/01]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1491957
Date:29.12.2004
Language:EN
[2004/53]
Type: A3 Search report 
No.:EP1491957
Date:21.06.2006
[2006/25]
Search report(s)(Supplementary) European search report - dispatched on:EP24.05.2006
ClassificationIPC:G03F7/20
[2005/01]
CPC:
G03F7/70341 (EP,KR,US); B82Y10/00 (KR); B82Y40/00 (KR);
G03F7/70233 (EP,KR,US)
Designated contracting statesDE,   FR,   GB,   IT,   NL [2007/09]
Former [2005/01]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IT,  LI,  LU,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Gerät für die Immersionsphotolithographie mit einem unter dem Substrat angeordneten Projektionssystem[2005/01]
English:Immersion photolithography apparatus with projection system positioned below the substrate[2005/01]
French:Dispositif de lithographie à immersion avec un système de projection disposé sous la plaquette semi-conductrice[2005/01]
Examination procedure27.07.2006Examination requested  [2006/36]
05.09.2006Despatch of a communication from the examining division (Time limit: M04)
15.01.2007Reply to a communication from the examining division
09.06.2008Despatch of a communication from the examining division (Time limit: M06)
12.12.2008Reply to a communication from the examining division
19.10.2009Cancellation of oral proceeding that was planned for 22.10.2009
22.10.2009Date of oral proceedings
22.10.2009Date of oral proceedings (cancelled)
19.11.2009Communication of intention to grant the patent
30.03.2010Application deemed to be withdrawn, date of legal effect  [2010/38]
07.05.2010Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time  [2010/38]
Fees paidRenewal fee
12.06.2006Renewal fee patent year 03
14.06.2007Renewal fee patent year 04
28.03.2008Renewal fee patent year 05
16.06.2009Renewal fee patent year 06
Penalty fee
Additional fee for renewal fee
30.06.201007   M06   Not yet paid
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Documents cited:Search[E] EP1612850  (NIKON CORP et al.) [E] 1,2,4,10,11,15-17,19,25,26,30-34,39,40 * abstract * * figure 5 * * paragraph [0002] * * paragraph [0009] * * paragraph [0017] * * paragraph [0044] - paragraph [0051] *
 [A] JP2000012453  
 [A]   PATENT ABSTRACTS OF JAPAN vol. 2000, no. 04 31 August 2000 (2000-08-31) [A] 1,16,31,32,38,39 * abstract * * figure 1 * * paragraph [0001] * * paragraph [0014] *
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