-
EP1517287
European procedure
- EP About this file
- EP Legal status
- EP Federated register
- EP Event history
- EP Citations
- EP Patent family
- EP All documents
Extract from the Register of European Patents
EP About this file: EP1517287
| EP1517287 - Inspection method and inspection device for display device and active matrix substrate used for display device [Right-click to bookmark this link] | Status | The application has been withdrawn Status updated on 10.08.2012 Database last updated on 02.11.2024 | Most recent event Tooltip | 10.08.2012 | Withdrawal of application | published on 12.09.2012 [2012/37] | Applicant(s) | For all designated states Wintest Corporation 19-1, Akebono-cho 2-chome, Naka-ku Yokohama-shi Kanagawa-ken, 231-0057 / JP | [N/P] |
| Former [2005/12] | For all designated states Wintest Corporation 19-1, Akebono-cho 2-chome, Naka-ku Yokohama-shi, Kanagawa-ken, 231-0057 / JP | Inventor(s) | 01 /
Nara, Shoji Wintest Corp. 19-1 Akebono-cho 2-chome Naka-ku Yokohama-shi Kanagawa-ken / JP | 02 /
Itoh, Masatoshi Wintest Corp. 19-1 Akebono-cho 2-chome Naka-ku Yokohama-shi Kanagawa-ken / JP | 03 /
Ookuma, Makoto Wintest Corp. 19-1 Akebono-cho 2-chome Naka-ku Yokohama-shi Kanagawa-ken / JP | 04 /
Yamamoto, Wataru Wintest Corp. 19-1 Akebono-cho 2-chome Naka-ku Yokohama-shi Kanagawa-ken / JP | [2005/12] | Representative(s) | Kramer Barske Schmidtchen Patentanwälte PartG mbB European Patent Attorneys Landsberger Strasse 300 80687 München / DE | [N/P] |
| Former [2008/39] | Kramer - Barske - Schmidtchen European Patent Attorneys Landsberger Strasse 300 80687 München / DE | ||
| Former [2005/12] | Kramer Barske Schmidtchen Radeckestrasse 43 81245 München / DE | Application number, filing date | 04022210.1 | 17.09.2004 | [2005/12] | Priority number, date | JP20030328231 | 19.09.2003 Original published format: JP 2003328231 | JP20040220201 | 28.07.2004 Original published format: JP 2004220201 | [2005/12] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP1517287 | Date: | 23.03.2005 | Language: | EN | [2005/12] | Type: | A3 Search report | No.: | EP1517287 | Date: | 26.12.2007 | [2007/52] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 27.11.2007 | Classification | IPC: | G09G3/00 | [2005/12] | CPC: |
G09G3/006 (EP,US);
H05B33/10 (KR);
G09G3/3216 (EP,US);
G09G3/3225 (EP,US);
G09G2300/0842 (EP,US);
G09G2310/0245 (EP,US);
| Designated contracting states | DE, FR, GB, NL [2008/36] |
| Former [2005/12] | AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IT, LI, LU, MC, NL, PL, PT, RO, SE, SI, SK, TR | Title | German: | Verfahren und Gerät zur Inspektion eines Anzeigegeräts und Substrat mit aktiver Matrix für ein Anzeigegerät | [2005/12] | English: | Inspection method and inspection device for display device and active matrix substrate used for display device | [2005/12] | French: | Méthode et circuit d'inspection pour un dispositif d'affichage et substrat à matrice active pour un dispositf d'affichage | [2005/12] | Examination procedure | 06.02.2008 | Examination requested [2008/12] | 27.06.2008 | Loss of particular rights, legal effect: designated state(s) | 04.08.2008 | Despatch of communication of loss of particular rights: designated state(s) AT, BE, BG, CH, CY, CZ, DK, EE, ES, FI, GR, HU, IE, IT, LU, MC, PL, PT, RO, SE, SI, SK, TR | 02.08.2012 | Application withdrawn by applicant [2012/37] | Fees paid | Renewal fee | 28.09.2006 | Renewal fee patent year 03 | 28.09.2007 | Renewal fee patent year 04 | 26.09.2008 | Renewal fee patent year 05 | 25.09.2009 | Renewal fee patent year 06 | 28.09.2010 | Renewal fee patent year 07 | 28.09.2011 | Renewal fee patent year 08 |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US5377030 (SUZUKI YOSHIO [JP], et al) [A] 1-20 * column 2, paragraph 48 - column 3, paragraph 18 *; | [DA]US2002014851 (TAI YA-HSIANG [TW], et al) [DA] 1-20 * page 2, paragraph 13 - paragraph 14 *; | [PA]EP1365632 (WINTEST CORP [JP]) [PA] 1-20 * page 2, paragraph 8 - page 3, paragraph 10 *; | [PA]EP1447673 (WINTEST CORP [JP]) [PA] 1-20 * abstract ** page 2, paragraph 6 - paragraph 8 * |