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Extract from the Register of European Patents

EP About this file: EP1605602

EP1605602 - Interference reduction apparatus and method [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  06.01.2012
Database last updated on 07.10.2024
Most recent event   Tooltip06.01.2012No opposition filed within time limitpublished on 08.02.2012  [2012/06]
Applicant(s)For all designated states
FUJITSU LIMITED
1-1, Kamikodanaka 4-chome, Nakahara-ku Kawasaki-shi
Kanagawa 211-8588 / JP
[2011/09]
Former [2005/50]For all designated states
FUJITSU LIMITED
1-1, Kamikodanaka 4-chome, Nakahara-ku Kawasaki-shi
Kanagawa 211-8588 / JP
Inventor(s)01 / Shimizu, Masahiko, c/o Fujitsu Limited
1-1, Kamikodanaka 4-chome Nakahara-ku
Kawasaki-shi Kanagawa 211-8588 / JP
02 / Hasegawa, Tsuyoshi, c/o Fujitsu Limited
1-1, Kamikodanaka 4-chome Nakahara-ku
Kawasaki-shi Kanagawa 211-8588 / JP
 [2005/50]
Representative(s)Hitching, Peter Matthew, et al
Haseltine Lake LLP Lincoln House, 5th Floor 300 High Holborn London
WC1V 7JH / GB
[N/P]
Former [2005/50]Hitching, Peter Matthew, et al
Haseltine Lake & Co., Imperial House, 15-19 Kingsway
London WC2B 6UD / GB
Application number, filing date04257311.325.11.2004
[2005/50]
Priority number, dateJP2004017379311.06.2004         Original published format: JP 2004173793
[2005/50]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP1605602
Date:14.12.2005
Language:EN
[2005/50]
Type: B1 Patent specification 
No.:EP1605602
Date:02.03.2011
Language:EN
[2011/09]
Search report(s)(Supplementary) European search report - dispatched on:EP27.09.2005
ClassificationIPC:H04B1/707
[2005/50]
CPC:
H04B1/7113 (EP,US); H04B1/7115 (EP,US); H04B1/7107 (EP,US);
H04B1/712 (EP,US); H04B2201/70702 (EP,US)
Designated contracting statesDE,   FR,   GB [2006/34]
Former [2005/50]AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HU,  IE,  IS,  IT,  LI,  LU,  MC,  NL,  PL,  PT,  RO,  SE,  SI,  SK,  TR 
TitleGerman:Interferenzverminderung-Vorrichtung und -Verfahren[2005/50]
English:Interference reduction apparatus and method[2005/50]
French:Appareil de réduction des interférences et méthode[2005/50]
Examination procedure13.02.2006Examination requested  [2006/15]
17.03.2006Despatch of a communication from the examining division (Time limit: M06)
27.09.2006Reply to a communication from the examining division
02.07.2007Despatch of a communication from the examining division (Time limit: M06)
14.01.2008Reply to a communication from the examining division
28.04.2008Despatch of a communication from the examining division (Time limit: M04)
21.07.2008Reply to a communication from the examining division
14.09.2010Communication of intention to grant the patent
12.01.2011Fee for grant paid
12.01.2011Fee for publishing/printing paid
Divisional application(s)EP08100721.3  / EP1926219
Opposition(s)05.12.2011No opposition filed within time limit [2012/06]
Fees paidRenewal fee
29.11.2006Renewal fee patent year 03
28.11.2007Renewal fee patent year 04
17.03.2008Renewal fee patent year 05
27.11.2009Renewal fee patent year 06
30.11.2010Renewal fee patent year 07
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Documents cited:Search[A]EP0876002  (LUCENT TECHNOLOGIES INC [US]) [A] 1-20 * the whole document *;
 [A]US6175587  (MADHOW UPAMANYU [US], et al) [A] 1-20 * the whole document *;
 [A]US2002131479  (BUTLER BRIAN K [US], et al) [A] 1-20 * the whole document *;
 [Y]EP1304815  (UNIV SINGAPORE [SG]) [Y] 1-20 * abstract * * paragraph [0077] - paragraph [0079] * * paragraph [0065] - paragraph [0067] * * paragraph [0053] - paragraph [0059] *;
 [Y]US2003086482  (SHIMIZU MASAHIKO [JP], et al) [Y] 1-20 * the whole document *;
 [Y]WO2004025860  (FUJITSU LTD [JP], et al) [Y] 1-20* the whole document *;
 [E]EP1548953  (FUJITSU LTD [JP]) [E] 1-20 * the whole document *;
 [Y]  - HASEGAWA T ET AL, "MULTIPATH INTERFERENCE REDUCTION METHOD USING MULTIPATH INTERFERENCE CORRELATIVE TIMING FOR DS-CDMA SYSTEMS", VTC SPRING 2002. IEEE 55TH. VEHICULAR TECHNOLOGY CONFERENCE. PROCEEDINGS. BIRMINGHAM, AL, MAY 6 - 9, 2002, IEEE VEHICULAR TECHNOLGY CONFERENCE, NEW YORK, NY : IEEE, US, (20020506), VOL. 3 OF 4. CONF. 55, ISBN 0-7803-7484-3, pages 1205 - 1209, XP001214486 [Y] 1-20 * the whole document *

DOI:   http://dx.doi.org/10.1109/VTC.2002.1002805
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